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Czechoslovak Journal of Physics

Intrinsic emission and mixing processes in high-T c Josephson junctions

L. É. Amatuni, V. N. Glyantsev, Klaus Dieter Herrmann, Alexander M. Klushin, Oliver Harnack, Stephan Beuven, Marian Darula

Published Mar 1, 1996• 2 citations
Publisher
DOI
10.1007/bf02562757

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In this paper, we report on the recent progress in fabrication and high-frequency experiments of Bi 2 Sr 2 CaCu 2 O 8+ x (BSCCO) intrinsic Josephson junctions (IJJs). Using a newly developed double-sided fabrication process, we single out a well-defined number of IJJs in a well-defined geometry from inside a slice of a BSCCO single crystal. We discuss in detail the observations of both Shapiro steps and harmonic mixings in the terahertz region, and we indicate the possible applications in spectroscopy.
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The fabrication of ultrasmall high-quality intrinsic Josephson junctions (IJJs) using a cuprate superconductor is critical for the realization of a qubit. We investigated the mechanism of damage induced by a Ga + beam in a Bi 2 Sr 2 CaCu 2 O 8+δ IJJ during focused ion beam (FIB) processing. On the basis of the results, we developed a process that allowed the successful fabrication of an ultrasmall and high-quality IJJ. The damage induced by the FIB is reduced by restricting the direction of the Ga + beam so that the junction area is not directly irradiated by the ion beam. The fabricated ultrasmall IJJ device has a junction area of 0.3 µm 2 and shows excellent current–voltage characteristics.