Microwave field distribution in superconducting thin film devices
D. Quenter, T. Doderer, Rudolf Peter Huebener
We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices.
Journal of Applied Physics•Sep 15, 1996•2 citations