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Physical review. B, Condensed matter

Macroscopic Coulomb-blockade effect in a constant-current-driven light-emitting diode

Jungsang Kim, Hirofumi Kan, Y. Yamamoto

Published Jul 15, 1995• 28 citations
Publisher

Abstract

The intensity squeezing bandwidth of a light-emitting diode was measured as functions of a driving current, junction capacitance, and operation temperature. It was found that the squeezing bandwidth was linearly proportional to the current and inversely proportional to the capacitance and the temperature in a low current regime. The experimental results provide evidence for a pump-noise-suppression mechanism in a constant-current-driven p-n junction due to a ``macroscopic Coulomb blockade effect'' [A. Imamog\ifmmode\bar\else\textasciimacron\fi{}lu and Y. Yamamoto, Phys. Rev. Lett. 70, 3327 (1993)].

DOI
10.1103/physrevb.52.2008

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The intensity squeezing bandwidth of a light-emitting diode was measured as functions of a driving current, junction capacitance, and operation temperature. It was found that the squeezing bandwidth was linearly proportional to the current and inversely proportional to the capacitance and the temperature in a low current regime. The experimental results provide evidence for a pump-noise-suppression mechanism in a constant-current-driven p-n junction due to a ``macroscopic Coulomb blockade effect'' [A. Imamog\ifmmode\bar\else\textasciimacron\fi{}lu and Y. Yamamoto, Phys. Rev. Lett. 70, 3327 (1993)].
Experimental results on squeezing of photon-number fluctuations of a p-n junction light-emitting diode (LED) driven by a constant-voltage source are demonstrated together with physical mechanisms responsible for the squeezing. The observed squeezing at room temperature is discovered to be explained not by the conventional collective Coulomb blockade model but by our new model which includes the effect of the microscopic nonlinear backward-pump process, which can work even in the constant-voltage operation.
We investigated extensively the sub-Poissonian-photon-state generation by the microscopic backward-pump (BP) process in a semiconductor heterojunction light-emitting diode (LED) under constant-voltage operation. In particular, the BP rate relative to the forward pump rate has been carefully evaluated from the dc characteristics of the LED and shown to depend strongly on the injection current and the device temperature. We then compare the experimental results of the photon-number squeezing performed at various temperatures in the constant-voltage-drive setup with the theoretical prediction estimated numerically using the parameter values determined from the dc measurements. As a consequence, it was proven that the observed squeezing at room temperature is successfully interpreted only in terms of the nonlinear BP model, while that at low temperature $(\ensuremath{\sim}100 \mathrm{K})$ is explained simply by the conventional model based on macroscopic Coulomb-blockade effect for the pump-noise suppression.
Physical mechanisms which limit the squeezing bandwidth in a heterojunction light-emitting diode (LED) have been extensively studied both theoretically and experimentally. It is proven that our experimental results of pump-current dependence of the squeezing bandwidth in the constant-current-driven heterojunction LED at room temperature cannot be explained by previous theoretical predictions. We present a theoretical framework, including the effects of a microscopic backward-pump (BP) process, generally applicable to a heterojunction LED. Parameters describing the relative significance of the BP process are determined by the measurements of current-versus-voltage characteristic and differential resistance of the LED, independent of the noise measurements. As a consequence, the experimental results can be explained by our model in a unified manner over a whole range of injection current, and it is clarified that the pump situation of the LED moves continuously from thermionic emission to diffusion limits with increasing pump current.