Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Journal of Applied Physics

Kinetics and quenching mechanisms of photoluminescence in Yb-doped InP

H. J. Łożykowski, A. K. Alshawa, Ian G. Brown

Published Oct 15, 1994• 20 citations
Publisher

Abstract

The photoluminescence spectra of Yb-implanted InP samples were studied under pulsed and cw excitations using an Ar+-ion laser (above band-gap excitation) at different temperatures and excitation intensities. The photoluminescence spectrum of the 4f transitions 2F5/2–2F7/2 consists of a sharp peak at 1001 nm and broader peaks in the spectral range between 1002.5 and 1010 nm. Time-resolved spectra were recorded at different temperatures. Using a tunable Ti:sapphire laser (above and below band-gap excitation) the photoluminescence excitation spectra were investigated for different emission lines. Study of the rise and decay time under intrinsic excitation (band to band) show that the rise time is a function of excitation intensity, which reflects an indirect excitation process for Yb3+. The experimental data are explained using a kinetics model of energy transfer from the host lattice to the localized core excited states of rare-earth isoelectronic structured traps. The numerically simulated luminescence rise and decay times show a good general quantitative agreement with experimental data, over a wide range of generation rates. The photoluminescence spectra and decay time were also studied as a function of temperature. A quenching mechanism of ytterbium luminescence involving Yb and Fe ions is proposed. Finally, the electric-field quenching of InP:Yb photoluminescence is investigated.

DOI
10.1063/1.357257

Related papers

Kinetics of luminescence of isoelectronic rare-earth ions in III-V semiconductors

H. J. Łożykowski

In this work we have developed a kinetics model of energy transfer from the host lattice to the localized core excited states of rare-earth isoelectronic structured traps (REI traps). The presence of low-lying empty core orbitals in rare-earth impurities introduces new excitation and recombination phenomena. To adequately describe the energy transfer to a REI trap, the buildup and decay kinetics of rare-earth luminescence, we consider six separate states of the REI impurity (unoccupied, electron occupied, electron occupied excited, exciton occupied, excited electron occupied, and excited exciton occupied). The energy-transfer processes occur through an Auger mechanism where the recombination energy of the bound electron with a free hole is transferred nonradiatively to the core states, or energy can be transferred from the bound exciton on a REI trap to the core states. If the initial and final states are not resonant (in both mechanisms), the energy mismatch must be accommodated by emission or absorption of phonons. Furthermore we discuss details of several quenching processes, which are incorporated into the kinetics equations. We derive two sets of differential equations for semi-insulating and n-type semiconductors governing the kinetics of rare-earth luminescence. Equations have been solved by a numerical method to derive the time dependence of the rise and decay kinetics as a function of excitation intensity. The numerically simulated luminescence rise and decay times show a good overall quantitative agreement with experimental data obtained for InP:Yb, over a wide range of generation rates.

Physical review. B, Condensed matter•Dec 15, 1993•105 citations

Characteristics of the electroluminescence and photoluminescence emission of erbium ions doped in InP and the energy transfer mechanism

Hideo Isshiki, Riichiro Saito, Tadamasa Kimura +1 more

The characteristics of impact excitation of the 1.54-μm emission due to intrashell transitions of 4f electrons of erbium atoms (4I13/2 →4 I15/2) doped into InP were investigated in comparison with the photoluminescence (PL) emission of the same peak from the same sample. The thermal quenching of this Er-related electroluminescence (EL) emission was found to be very small in contrast to the large thermal quenching of the PL emission. The EL emission intensity at room temperature was half that at 77 K, and the temperature dependence of the emission energy and the spectral width was very small. Due to almost temperature-independent nature of the impact excitation process, the quenching of the EL emission intensity reflected directly that of the fluorescence efficiency of this intrashell transitions of Er 4f electrons. Using this result, the temperature dependence of the PL energy transfer efficiency was also obtained. It was also found that the fine structure of the 1.54-μm emission was different between EL and PL. It was speculated that Er atoms on different lattice sites, which were in different crystal fields, were excited depending on excitation processes.

Journal of Applied Physics•Dec 1, 1991•15 citations

Role of Shallow Bound States in Emission Processes of Rare-Earth Doped Semiconductors

T. Gregorkiewicz, Du Thi Xuan Thao, Jerzy M. Langer

Participation of shallow states in the energy transfer processes between the rare-earth ions and a host semiconductor matrix is discussed. It is argued that shallow levels link the atomic-like states of the inner core of the rare-earth ion with the band structure of the host crystal. For the two most investigated systems InP:Yb and Si:Er the important role of these states at various stages of excitation and de-excitation mechanisms is shown. Models of the energy transfer process with a formation of a shallow intermediate state are discussed. It is shown that the formation of such a state is essential for the RE ion core activation. Experimental results supporting the involvement of shallow states are reviewed. Temperature dependencies of the photoluminescence activation and decay time constants are presented; these show an important role of shallow doping in the activation of Auger processes relevant to the mechanism of rare-earth ion photoluminescence. For the Si:Er system direct evidence for the two-stage excitation mechanism is discussed.

physica status solidi (b)•Dec 1, 1998•10 citations

Optical manipulation of excitation paths in RE-doped semiconductors

M.A.J. Klik, T. Gregorkiewicz

We report on experimental verification of the proposed energy transfer mechanism responsible for photoluminescence of rare earth ions in semiconductors. Using two-color optical spectroscopy in the visible and the mid-infrared region, we demonstrate reversal of the most important step in the excitation process. This “back-transfer ” effect was supported experimentally only in an indirect manner by measurements on thermal quenching of PL intensity and lifetime. In the current study on InP:Yb, formation of the intermediate state bridging atomic states of the RE ion and extended orbitals of a semiconducting host is explicitly confirmed and its characteristic energy spectroscopically determined. This finding will allow optimization of the efficiency of semiconductor:RE systems for applications.

•Jan 1, 2002•0 citations

Photoluminescence excitation spectroscopy on InP: Yb

J. Wagner, J. C. Windscheif, Helmut Ennen

Photoluminescence excitation measurements were performed on InP: Yb, using a tunable LiF: ${\mathrm{F}}_{2}^{+}$ colorcenter laser. The excitation spectra show that only one dominant ${\mathrm{Yb}}^{3+}$ ($4{f}^{13}$) center is responsible for the complex set of emission lines observed in the 1.0-\ensuremath{\mu}m spectral range. With the combination of the present results with data obtained by photoluminescence experiments the observed emission lines can be ordered into a level scheme with a twofold-split initial ($^{2}F_{\frac{5}{2}}$) and a threefold-split ($^{2}F_{\frac{7}{2}}$) ground state.

Physical review. B, Condensed matter•Nov 15, 1984•26 citations

Photoluminescence excitation measurements on erbium implanted GaN

John T. Torvik, Robert J. Feuerstein, C. H. Qiu +2 more

The temperature dependence of the optical excitation cross section of Er implanted n-type GaN was studied using photoluminescence excitation spectroscopy. Due to the large 3.4 eV band gap of GaN, it was possible to probe two Er absorption lines using a tunable Ti:sapphire laser in the 770–1010 nm range. Photoluminescence excitation spectra exhibiting several Stark splittings revealed a complex dependence upon temperature. The largest excitation cross section in the third excited state was 1.65×10−20 cm2 at an excitation wavelength of 809.4 nm when measured at 77 K. This value is roughly three times larger than the cross section in the second excited state at 4.8×10−21 cm2 when pumping at 983.0 nm. The Er-related photoluminescence was reduced between 1.5 and 4.8 times when going from 77 K to room temperature, except when pumping around 998 nm. At this excitation wavelength the room temperature photoluminescence was stronger by a factor of 1.26 compared to that at 77 K.

Journal of Applied Physics•Aug 15, 1997•16 citations
The photoluminescence spectra of Yb-implanted InP samples were studied under pulsed and cw excitations using an Ar+-ion laser (above band-gap excitation) at different temperatures and excitation intensities. The photoluminescence spectrum of the 4f transitions 2F5/2–2F7/2 consists of a sharp peak at 1001 nm and broader peaks in the spectral range between 1002.5 and 1010 nm. Time-resolved spectra were recorded at different temperatures. Using a tunable Ti:sapphire laser (above and below band-gap excitation) the photoluminescence excitation spectra were investigated for different emission lines. Study of the rise and decay time under intrinsic excitation (band to band) show that the rise time is a function of excitation intensity, which reflects an indirect excitation process for Yb3+. The experimental data are explained using a kinetics model of energy transfer from the host lattice to the localized core excited states of rare-earth isoelectronic structured traps. The numerically simulated luminescence rise and decay times show a good general quantitative agreement with experimental data, over a wide range of generation rates. The photoluminescence spectra and decay time were also studied as a function of temperature. A quenching mechanism of ytterbium luminescence involving Yb and Fe ions is proposed. Finally, the electric-field quenching of InP:Yb photoluminescence is investigated.
In this work we have developed a kinetics model of energy transfer from the host lattice to the localized core excited states of rare-earth isoelectronic structured traps (REI traps). The presence of low-lying empty core orbitals in rare-earth impurities introduces new excitation and recombination phenomena. To adequately describe the energy transfer to a REI trap, the buildup and decay kinetics of rare-earth luminescence, we consider six separate states of the REI impurity (unoccupied, electron occupied, electron occupied excited, exciton occupied, excited electron occupied, and excited exciton occupied). The energy-transfer processes occur through an Auger mechanism where the recombination energy of the bound electron with a free hole is transferred nonradiatively to the core states, or energy can be transferred from the bound exciton on a REI trap to the core states. If the initial and final states are not resonant (in both mechanisms), the energy mismatch must be accommodated by emission or absorption of phonons. Furthermore we discuss details of several quenching processes, which are incorporated into the kinetics equations. We derive two sets of differential equations for semi-insulating and n-type semiconductors governing the kinetics of rare-earth luminescence. Equations have been solved by a numerical method to derive the time dependence of the rise and decay kinetics as a function of excitation intensity. The numerically simulated luminescence rise and decay times show a good overall quantitative agreement with experimental data obtained for InP:Yb, over a wide range of generation rates.
The characteristics of impact excitation of the 1.54-μm emission due to intrashell transitions of 4f electrons of erbium atoms (4I13/2 →4 I15/2) doped into InP were investigated in comparison with the photoluminescence (PL) emission of the same peak from the same sample. The thermal quenching of this Er-related electroluminescence (EL) emission was found to be very small in contrast to the large thermal quenching of the PL emission. The EL emission intensity at room temperature was half that at 77 K, and the temperature dependence of the emission energy and the spectral width was very small. Due to almost temperature-independent nature of the impact excitation process, the quenching of the EL emission intensity reflected directly that of the fluorescence efficiency of this intrashell transitions of Er 4f electrons. Using this result, the temperature dependence of the PL energy transfer efficiency was also obtained. It was also found that the fine structure of the 1.54-μm emission was different between EL and PL. It was speculated that Er atoms on different lattice sites, which were in different crystal fields, were excited depending on excitation processes.
Participation of shallow states in the energy transfer processes between the rare-earth ions and a host semiconductor matrix is discussed. It is argued that shallow levels link the atomic-like states of the inner core of the rare-earth ion with the band structure of the host crystal. For the two most investigated systems InP:Yb and Si:Er the important role of these states at various stages of excitation and de-excitation mechanisms is shown. Models of the energy transfer process with a formation of a shallow intermediate state are discussed. It is shown that the formation of such a state is essential for the RE ion core activation. Experimental results supporting the involvement of shallow states are reviewed. Temperature dependencies of the photoluminescence activation and decay time constants are presented; these show an important role of shallow doping in the activation of Auger processes relevant to the mechanism of rare-earth ion photoluminescence. For the Si:Er system direct evidence for the two-stage excitation mechanism is discussed.
We report on experimental verification of the proposed energy transfer mechanism responsible for photoluminescence of rare earth ions in semiconductors. Using two-color optical spectroscopy in the visible and the mid-infrared region, we demonstrate reversal of the most important step in the excitation process. This “back-transfer ” effect was supported experimentally only in an indirect manner by measurements on thermal quenching of PL intensity and lifetime. In the current study on InP:Yb, formation of the intermediate state bridging atomic states of the RE ion and extended orbitals of a semiconducting host is explicitly confirmed and its characteristic energy spectroscopically determined. This finding will allow optimization of the efficiency of semiconductor:RE systems for applications.
Photoluminescence excitation measurements were performed on InP: Yb, using a tunable LiF: F2+{\mathrm{F}}_{2}^{+}F2+​ colorcenter laser. The excitation spectra show that only one dominant Yb3+{\mathrm{Yb}}^{3+}Yb3+ (4f134{f}^{13}4f13) center is responsible for the complex set of emission lines observed in the 1.0-\ensuremath{\mu}m spectral range. With the combination of the present results with data obtained by photoluminescence experiments the observed emission lines can be ordered into a level scheme with a twofold-split initial (2F52^{2}F_{\frac{5}{2}}2F25​​) and a threefold-split (2F72^{2}F_{\frac{7}{2}}2F27​​) ground state.
The temperature dependence of the optical excitation cross section of Er implanted n-type GaN was studied using photoluminescence excitation spectroscopy. Due to the large 3.4 eV band gap of GaN, it was possible to probe two Er absorption lines using a tunable Ti:sapphire laser in the 770–1010 nm range. Photoluminescence excitation spectra exhibiting several Stark splittings revealed a complex dependence upon temperature. The largest excitation cross section in the third excited state was 1.65×10−20 cm2 at an excitation wavelength of 809.4 nm when measured at 77 K. This value is roughly three times larger than the cross section in the second excited state at 4.8×10−21 cm2 when pumping at 983.0 nm. The Er-related photoluminescence was reduced between 1.5 and 4.8 times when going from 77 K to room temperature, except when pumping around 998 nm. At this excitation wavelength the room temperature photoluminescence was stronger by a factor of 1.26 compared to that at 77 K.