Applied Optics
Analysis of a spectrum of two Lorentzian or Gaussian lines by measuring n^(2)(T)
Felipe González, M. Á. Rebolledo, Manuel P. Cagigal
Abstract
In this paper we study the possibility of analyzing a low intensity light beam whose spectrum has two lines with Lorentzian or Gaussian profiles by measuring n(2)(T) (the normalized second-order factorial moment). To do this the spectrum is scanned periodically by a spectrometer, and the normalized second-order factorial moment of the beam intensity at the exit aperture of the spectrometer is measured. The errors involved in the determination of the width, relative height, and separation between the two lines are calculated and discussed.