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Journal of Applied Physics

Low-frequency noise of planar dc SQUIDs made of various Josephson junctions

M. Matsuda, Atsushi Matachi, Shinya Kuriki, Hiroshi Hasegawa

Published Jan 15, 1989• 5 citations
Publisher

Abstract

The noise characteristics at low frequencies are studied for various planar dc SQUIDs made of junctions with different barrier materials of a-Si, aluminum oxide, and niobium oxide. It is found that fluctuations of the parameters of individual junctions contribute to the flux noise of the SQUIDs in a magnitude of the same order with the apparent flux noise. The magnitude of the flux noise due to the parameter fluctuations depends on the barrier material and on the inductance parameter βL . We have observed a telegraph noise in the voltage time trace and a Lorentzian in the voltage power spectrum for a current-biased SQUID. As a source of the parameter fluctuations, capture and emission of electrons at the trapping sites in the barrier are indicated.

DOI
10.1063/1.343106

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The noise characteristics at low frequencies are studied for various planar dc SQUIDs made of junctions with different barrier materials of a-Si, aluminum oxide, and niobium oxide. It is found that fluctuations of the parameters of individual junctions contribute to the flux noise of the SQUIDs in a magnitude of the same order with the apparent flux noise. The magnitude of the flux noise due to the parameter fluctuations depends on the barrier material and on the inductance parameter βL . We have observed a telegraph noise in the voltage time trace and a Lorentzian in the voltage power spectrum for a current-biased SQUID. As a source of the parameter fluctuations, capture and emission of electrons at the trapping sites in the barrier are indicated.
Abstract We have fabricated Nb-based dc-SQUIDs with sub-micrometer planar Nb/HfTi/Nb junctions in order to investigate their noise performance. The SQUIDs are of simple coplanar design, their nominal inductance is ca. 15 pH. Electron beam lithography and chemical-mechanical polishing have been used to realize junctions with cross sections areas as low as about 100 × 100 nm 2 . The SQUIDs exhibit pronounced excess noise increasing towards lower frequencies. This apparent flux noise arises from fluctuations of the junction critical currents or resistances. The Nb/HfTi/Nb junction critical currents are found to be strongly temperature dependent. Upon cooling below ca. 4 K the SQUIDs start to show current–voltage characteristics with negative differential resistances, and their flux noise increases significantly. Estimation of the HfTi barrier electron temperature indicates that the degradation of the SQUID properties towards lower temperature is caused by self-heating effects.
We have fabricated RF and DC SQUIDS with step-edge Josephson junctions (SEJ) and YBa 2 Cu 3 O 7 thin films. The low-frequency noise of these SQUIDS has been investigated as a function of temperature, bias current and magnetic field. Typically, the energy resolution in the white noise region of the DC SQUIDS with an inductance of 45 pH was 3*10 -30 J Hz -1 at 77.5 K. Depending on the bias current, the low-frequency spectrum could be of either 1/f type or Lorentzian type. The Lorentzian spectrum was generated by random telegraph signals (RTSS). An Arrhenius plot was obtained from the temperature dependence of the switching time of these RTSS. We have determined two barrier lengths of 0.23 eV and 1 eV of the two-level fluctuator (TLF) generating this RTS noise. From the magnetic-field dependence of the low-frequency noise we have found that the noise is periodic with the flux corresponding to the area of the SEJ. The results were discussed in terms of a model treating the SEJ as a multi-junction interferometer which forms a two-level fluctuator when the junction is placed inside a SQUID loop. The noise is generated by thermally activated switching of the SQUID between the two different states of the SQUID.
We have fabricated Y1Ba2Cu3O7−x step-edge junction dc superconducting quantum interference devices (SQUIDs) and characterized their noise performance. The current-voltage characteristics of our SQUIDs are of resistively shunted junction type with critical current densities jc of about 104 A/cm2 and maximum flux to voltage transfer functions δV/δΦ of 20 μV/Φ0 at 77 K. We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the frequency dependent noise in our devices results from critical current fluctuations of the Josephson junctions. A bias current reversing technique is effective in suppressing this noise contribution. A flux noise Φn of 80 μΦ0/Hz1/2 at 1 Hz and 77 K was measured on a dc SQUID with an inductance Ls of 60 pH.
Electron-beam lithography has been used to produce ultra low noise Nb dc SQUIDs (Superconducting QUantum Interference Devices) with Josephson elements consisting of either small area tunnel junctions or very narrow variable thickness bridges (nanobridges). Detailed voltage noise and transfer function measurements have been made as a function of temperature and flux and current bias. These measurements allow a computation of the intrinsic energy resolution ε vs bias parameters as well as comparison with models of intrinsic SQUID noise. The best ε obtained was of order Planck's constant h. Moreover, the detailed characteristics of the SQUID voltage noise are in agreement with a small signal analysis that depends only on the current noise in each of the Josephson elements and measurable parameters.
Noise measurements on multiloop dc SQUIDs, fabricated with Nb-NbOx-PbAuIn and Pb-alloy Josephson tunnel junctions and well coupled with the external world by an input coil, we performed in flux locked loop mode. To achieve this task, we built a reliable low-cost control electronics to detect the voltage output of the SQUID. The results show that for multiloop dc SQUIDs with single-junction critical currents larger than 20 μA and an inductive parameter βL less than 4.5, an intrinsic white-energy spectral density of about 100h can be obtained independently of the technology used to fabricate the junctions. Furthermore, the Nb-NbOx-PbAuIn dc SQUIDs have a lower 1/f noise than the Pb-alloy ones.