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Technical digest - International Electron Devices Meeting/Technical digest

Integration of superconducting technology for a 50 GHz sampling oscilloscope chip

Stephen R. Whiteley, Eric Hanson, G.B.G. Hohenwater, F. Kuo, S. M. Faris

Published Jan 1, 1987• 6 citations
Publisher

Abstract

HYPRES, Inc. has introduced a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology to the commercial marketplace. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., risetimes on the order of 8 ps. The Josephson circuitry is contained on a single 1.1 × 1.6 fused silica substrate and housed in an interchangeable measurement module. Only the portion of the chip which contains the superconducting circuitry is cooled with a coplanar transmission line providing the wide bandwidth interface between the room temperature and cryogenic environments less than 1cm apart.

DOI
10.1109/iedm.1987.191437

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HYPRES, Inc. has introduced a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology to the commercial marketplace. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., risetimes on the order of 8 ps. The Josephson circuitry is contained on a single 1.1 × 1.6 fused silica substrate and housed in an interchangeable measurement module. Only the portion of the chip which contains the superconducting circuitry is cooled with a coplanar transmission line providing the wide bandwidth interface between the room temperature and cryogenic environments less than 1cm apart.
HYPRES, Inc. has introduced to the commercial marketplace a Sampling Oscilloscope/Time Domain Reflectometer (TDR) based on Josephson junction technology. The unit offers measurement performance commensurate with the inherent high speed of the Josephson elements, e.g., bandwidths in excess of 70 GHz and rise times on the order of 5 ps. A Josephson {rigger recognizer and delay circuit allows triggering of the sampling oscilloscope from the signal itself, with full view of the trigger point. Input modules offering different sensitivities or TDR capability are quickly interchangeable, and operating temperature is achieved in less than one minute. The technical details of the cooling technique and the chip circuitry will be described in this paper .
The promises of the ultrahigh-performance properties of superconductivity and Josephson junction technologies have been known for quite some time. This presentation describes the first superconducting electronics and measurement system and its important role as a major tool to advance microwave and millimeter wave technologies. This breakthrough tool is a sampling oscilloscope with 5-ps rise time, 50-μV sensitivity, and a time domain reflectometer with 8-ps rise time. In order to achieve these performance goals, several technological hurdles had to be overcome including perfecting a manufacturing process for building Josephson junction IC chips, developing an innovative cooling technique, developing interfaces and interconnections with bandwidths in excess of 70 GHz, and developing the room-temperature hardware and software necessary to make the instruments convenient, easy to use, easy to learn, in addition to making available functions and features users have come to expect from sophisticated digital test instrumentation. These technological developments are stepping stones leading to the realization of more sophisticated and complex electronic systems satisfying the needs of scientists, technologists, and engineers. The unprecedented speed and sensitivity make it possible to attack new frontiers.
A superconducting sampling measurement system is a highly useful tool for analyzing ultrahigh speed electrical signals in cryogenic environments, due to a time resolution at ps levels with low current levels of /spl mu/A. The digitizing sampling system is composed of a Josephson sampling circuit, digital delay line, feedback signal detection circuit and a computer. The Josephson sampling circuit is designed for ETL's Nb-AlO/sub x/-Nb junction technology. A TDR measurement method using a CPW flip-chip bonding technique is proposed. The theoretical spatial resolution is estimated to reach around a hundred /spl mu/m.