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Optics Express

Femtowatt-light-level phase measurement of slow light pulses via beat-note interferometer

Hsiang-Yu Lo, Po-Ching Su, Yu‐Wei Cheng, Pin-I Wu, Yong‐Fan Chen

Published Aug 13, 2010• 12 citations
Publisher

Abstract

We report on an experimental demonstration of applying the beat-note interferometer to simultaneously measure the phase and amplitude variations of light pulses after propagating through an electromagnetically induced transparency medium at femtowatt-light levels. Furthermore, we observe that the measured phase noise approaches the shot-noise level arising from the fluctuations of detected photons.

DOI
10.1364/oe.18.018498

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We report on an experimental demonstration of applying the beat-note interferometer to simultaneously measure the phase and amplitude variations of light pulses after propagating through an electromagnetically induced transparency medium at femtowatt-light levels. Furthermore, we observe that the measured phase noise approaches the shot-noise level arising from the fluctuations of detected photons.
We describe a simple method of the beat-note interferometer that directly and dynamically measures the phase shift of light pulses induced by highly dispersive samples. Using the method, we show intuitively that the storage and retrieval of light pulses in a medium due to the effect of electromagnetically induced transparency is a coherent process and, quantitatively, that there is no observable phase shift caused by the process. This method is sensitive enough that it can be used to measure the phase of a light pulse with energy on the order of a dozen photons.
An improvement in precision beyond the limit set by the vacuum-state or zero-point fluctuations of the electromagnetic field is reported for the measurement of phase modulation in an optical interferometer. The experiment makes use of squeezed light to reduce the level of fluctuations below the shot-noise limit. An increase in the signal-to-noise ratio of 3.0 dB relative to the shot-noise limit is demonstrated, with the improvement currently limited by losses in propagation and detection and not by the degree of available squeezing.
Quantum noise limited interferometry for subhertz phase measurement is of essence in precision metrology applications, such as gravitational wave detection. However, suppression of subhertz classical noises below the shot-noise level is very challenging in practice. Two-frequency interferometry has been previously proposed to avoid low-frequency noises and may be useful for squeezing-enhanced high-precision phase measurement. Here we experimentally demonstrate a subhertz interferometer at the standard quantum noise (shot-noise) limit, by use of dual-frequency coherent probe light at the input and phase-sensitive heterodyne detection to measure the output interfered light. When the interferometer is locked at a dark fringe, the noise floor of the phase variance in the interferometer reaches the shot-noise level down to Fourier frequencies below 1 Hz. This work should pave a way for a realization of subhertz interferometry beyond the shot-noise limit.
We report on the direct measurement of low-light-level cross-phase modulation (XPM) based on electromagnetically induced transparency (EIT) in the pulsed regime. A phase shift of 0.02 rad of a probe pulse modulated by a signal pulse with a peak intensity of 3 $\mathrm{\ensuremath{\mu}}\mathrm{W}/{\mathrm{cm}}^{2}$ was observed, which is the lowest intensity ever achieved for the N-type EIT-based XPM system. The experimental data make a quantitative prediction of the single-photon-level XPM phase shift arising from two interacting pulses with unequal group velocities that is consistent with the theoretical predictions proposed by Harris and Hau [Phys. Rev. Lett. 82, 4611 (1999)]. Furthermore, a proof-of-principle experiment demonstrating an enhancement of the nonlinear optical Kerr effect by shining the signal pulse twice is presented.