Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Physical Review Letters

Observation of Zero-Point Fluctuations in a Resistively Shunted Josephson Tunnel Junction

R. H. Koch, Dale J. Van Harlingen, John L. Clarke

Published Oct 26, 1981• 79 citations
Publisher

Abstract

The spectral density of the voltage noise has been measured in current-biased resistively shunted Josephson junctions in which quantum corrections to the noise are expected to be important. The experimental data are in excellent agreement with theoretical pretions, demonstrating clearly the contribution of zero-point fluctuations that are generated in the shunt at frequencies near the Josephson frequency and mixed down to the measurement frequency.

DOI
10.1103/physrevlett.47.1216

Related papers

Measurements of quantum noise in resistively shunted Josephson junctions

R. H. Koch, Dale J. Van Harlingen, John L. Clarke

Measurements have been made of the low-frequency spectral density of the voltage noise in current-biased resistively shunted Josephson tunnel junctions under conditions in which the noise mixed-down from frequencies near the Josephson frequency (${\ensuremath{\nu}}_{J}$) to the measurement frequency ($\ensuremath{\ll}{\ensuremath{\nu}}_{J}$) is in the regime $h{\ensuremath{\nu}}_{J}>{k}_{B}T$. In this limit, quantum corrections to the mixed-down noise are important. The spectral densities measured on junctions with current-voltage characteristics close to the Stewart-McCumber model were in excellent agreement with the predicted values, with no fitted parameters. The mixed-down noise for a wide range of bias voltages was used to infer the spectral density of the current noise in the shunt resistor at frequency $\ensuremath{\nu}$. With no fitted parameters, this spectral density at frequencies up to 500 GHz was in excellent agreement with the prediction $(\frac{2h\ensuremath{\nu}}{R})coth(\frac{h\ensuremath{\nu}}{2{k}_{B}T})$. The presence of the zero-point term, $\frac{2h\ensuremath{\nu}}{R}$, at frequencies $h\ensuremath{\nu}>{k}_{B}T$ was clearly demonstrated. The current-voltage characteristics of a junction with ${\ensuremath{\beta}}_{L}\ensuremath{\equiv}\frac{2\ensuremath{\pi}{L}_{s}{I}_{0}}{{\ensuremath{\Phi}}_{0}}\ensuremath{\sim}1$ and ${\ensuremath{\beta}}_{C}\ensuremath{\equiv}\frac{2\ensuremath{\pi}{I}_{0}{R}^{2}C}{{\ensuremath{\Phi}}_{0}}\ensuremath{\ll}1$, where ${I}_{0}$ is the critical current, $C$ is the junction capacitance, and ${L}_{s}$ is the shunt inductance, showed structure at voltages where the Josephson frequency was near a subharmonic of the ${L}_{s}C$ resonant frequency. The additional nonlinearity of the $I\ensuremath{-}V$ characteristic caused mixing down of noise near higher harmonics of the Josephson frequency, thereby greatly enhancing the voltage noise. The measured noise was in good agreement with that predicted by computer simulations.

Physical review. B, Condensed matter•Jul 1, 1982•117 citations

Relaxation Oscillations in Inductively Shunted Josephson Tunnel Junctions

Nils P. Calander, T. Claeson, S. Rudner

Relaxation oscillations at subharmonics of the Josephson frequency may occur in a resistively shunted superconducting tunnel junction, where the shunt loop has a large inductance. We have studied the variation in the relaxation period with the shunt inductance and resistance, the Josephson critical current, and the bias current. Steps in the current-voltage curve were noted at bias points where the subharmonic number changed. Radiation powers of the order of a nW were coupled out of small, single, tunnel junctions at 10 GHz. Linewidths scaled with the frequency square as compared with those of the Josephson mode oscillations. Wide signals centered around harmonics of the relaxation frequency were due to amplified noise. Injection locking to a fraction of the frequency of a relatively strong signal occurred, while weaker signals were amplified. Gains up to 15 dB were achieved within a fairly large bandwidth, but the noise temperature was high. The importance of parametrically up-converted noise from low idler frequencies is emphasized.

Physica Scripta•Jun 1, 1982•11 citations

Temperature dependence of critical current fluctuations in Nb/AlOx/Nb Josephson junctions

Shawn Pottorf, Vijay Patel, James E. Lukens

We measured the low frequency critical current noise in Nb/AlOx/Nb Josephson junctions. Unshunted junctions biased above the gap voltage and resistively shunted junctions biased near the critical current Ic have been measured. For both, the spectral density of δIc/Ic, Sic(f), is proportional to 1/f, scales inversely as the area A and is independent of Jc≡Ic/A over a factor of nearly 20 in Jc. For all devices measured at 4.2 K, Sic(1 Hz)=2.0±0.4×10−12/Hz when scaled to A=1 μm2. We find that, from 4.2 to 0.46 K, Sic(f) decreases linearly with temperature.

arXiv:0809.3272•Applied Physics Letters•Jan 26, 2009•14 citations

Measurements of 1∕f noise in Josephson junctions at zero voltage: Implications for decoherence in superconducting quantum bits

Michael Mück, Matthias Korn, Chas Mugford +2 more

Critical current fluctuations with a 1∕f spectral density (f is frequency) are potentially a limiting source of intrinsic decoherence in superconducting quantum bits (qubits) based on Josephson tunnel junctions. Prior measurements of this noise were made at nonzero voltages whereas qubits are operated in the zero voltage state. We report measurements of 1∕f noise in a dc superconducting quantum interference device first, coupled to a resonant tank circuit and operated in a dispersive mode at zero voltage, and, second, operated conventionally with a current bias in the voltage regime. Both measurements yield essentially the same magnitude of critical current 1∕f noise.

arXiv:cond-mat/0501153•Applied Physics Letters•Dec 27, 2004•19 citations

Quantum noise in current-biased Josephson junction

Yehoshua B. Levinson

We consider quantum fluctuations in a current biased overdamped Josephson junction in the regime when the bias current is larger than the critical current. The fluctuations of the voltage and phase across the junction are assumed to be initiated by equilibrium current fluctuations in the shunting resistor. This corresponds to low enough temperatures, when fluctuations of the normal current in the junction itself can be neglected. Quantum effects are important when the resistor temperature is low compared to the Josephson frequency, even in the case when noise is measured at frequencies lower than the temperature. We used the quantum Langevin equation in terms of random variables related to the limit cycle of the nonlinear Josephson oscillator. This allows to go beyond the perturbation theory and calculate the widths of the Josephson radiation lines.

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE•May 9, 2003•3 citations

Flicker (1∕f) noise in the critical current of Josephson junctions at 0.09–4.2K

F. C. Wellstood, C. Urbina, John L. Clarke

We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2∕Af, where A is the area of both junctions, and C≈(3.9±0.4)×10−23m2∕K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l∕f noise should scale as 1∕T for temperatures down to at least 0.09K.

Applied Physics Letters•Nov 29, 2004•63 citations
The spectral density of the voltage noise has been measured in current-biased resistively shunted Josephson junctions in which quantum corrections to the noise are expected to be important. The experimental data are in excellent agreement with theoretical pretions, demonstrating clearly the contribution of zero-point fluctuations that are generated in the shunt at frequencies near the Josephson frequency and mixed down to the measurement frequency.
Measurements have been made of the low-frequency spectral density of the voltage noise in current-biased resistively shunted Josephson tunnel junctions under conditions in which the noise mixed-down from frequencies near the Josephson frequency (${\ensuremath{\nu}}_{J}$) to the measurement frequency ($\ensuremath{\ll}{\ensuremath{\nu}}_{J}$) is in the regime $h{\ensuremath{\nu}}_{J}>{k}_{B}T$. In this limit, quantum corrections to the mixed-down noise are important. The spectral densities measured on junctions with current-voltage characteristics close to the Stewart-McCumber model were in excellent agreement with the predicted values, with no fitted parameters. The mixed-down noise for a wide range of bias voltages was used to infer the spectral density of the current noise in the shunt resistor at frequency $\ensuremath{\nu}$. With no fitted parameters, this spectral density at frequencies up to 500 GHz was in excellent agreement with the prediction $(\frac{2h\ensuremath{\nu}}{R})coth(\frac{h\ensuremath{\nu}}{2{k}_{B}T})$. The presence of the zero-point term, $\frac{2h\ensuremath{\nu}}{R}$, at frequencies $h\ensuremath{\nu}>{k}_{B}T$ was clearly demonstrated. The current-voltage characteristics of a junction with ${\ensuremath{\beta}}_{L}\ensuremath{\equiv}\frac{2\ensuremath{\pi}{L}_{s}{I}_{0}}{{\ensuremath{\Phi}}_{0}}\ensuremath{\sim}1$ and ${\ensuremath{\beta}}_{C}\ensuremath{\equiv}\frac{2\ensuremath{\pi}{I}_{0}{R}^{2}C}{{\ensuremath{\Phi}}_{0}}\ensuremath{\ll}1$, where I0{I}_{0}I0​ is the critical current, CCC is the junction capacitance, and Ls{L}_{s}Ls​ is the shunt inductance, showed structure at voltages where the Josephson frequency was near a subharmonic of the LsC{L}_{s}CLs​C resonant frequency. The additional nonlinearity of the $I\ensuremath{-}V$ characteristic caused mixing down of noise near higher harmonics of the Josephson frequency, thereby greatly enhancing the voltage noise. The measured noise was in good agreement with that predicted by computer simulations.
Relaxation oscillations at subharmonics of the Josephson frequency may occur in a resistively shunted superconducting tunnel junction, where the shunt loop has a large inductance. We have studied the variation in the relaxation period with the shunt inductance and resistance, the Josephson critical current, and the bias current. Steps in the current-voltage curve were noted at bias points where the subharmonic number changed. Radiation powers of the order of a nW were coupled out of small, single, tunnel junctions at 10 GHz. Linewidths scaled with the frequency square as compared with those of the Josephson mode oscillations. Wide signals centered around harmonics of the relaxation frequency were due to amplified noise. Injection locking to a fraction of the frequency of a relatively strong signal occurred, while weaker signals were amplified. Gains up to 15 dB were achieved within a fairly large bandwidth, but the noise temperature was high. The importance of parametrically up-converted noise from low idler frequencies is emphasized.
We measured the low frequency critical current noise in Nb/AlOx/Nb Josephson junctions. Unshunted junctions biased above the gap voltage and resistively shunted junctions biased near the critical current Ic have been measured. For both, the spectral density of δIc/Ic, Sic(f), is proportional to 1/f, scales inversely as the area A and is independent of Jc≡Ic/A over a factor of nearly 20 in Jc. For all devices measured at 4.2 K, Sic(1 Hz)=2.0±0.4×10−12/Hz when scaled to A=1 μm2. We find that, from 4.2 to 0.46 K, Sic(f) decreases linearly with temperature.
Critical current fluctuations with a 1∕f spectral density (f is frequency) are potentially a limiting source of intrinsic decoherence in superconducting quantum bits (qubits) based on Josephson tunnel junctions. Prior measurements of this noise were made at nonzero voltages whereas qubits are operated in the zero voltage state. We report measurements of 1∕f noise in a dc superconducting quantum interference device first, coupled to a resonant tank circuit and operated in a dispersive mode at zero voltage, and, second, operated conventionally with a current bias in the voltage regime. Both measurements yield essentially the same magnitude of critical current 1∕f noise.
We consider quantum fluctuations in a current biased overdamped Josephson junction in the regime when the bias current is larger than the critical current. The fluctuations of the voltage and phase across the junction are assumed to be initiated by equilibrium current fluctuations in the shunting resistor. This corresponds to low enough temperatures, when fluctuations of the normal current in the junction itself can be neglected. Quantum effects are important when the resistor temperature is low compared to the Josephson frequency, even in the case when noise is measured at frequencies lower than the temperature. We used the quantum Langevin equation in terms of random variables related to the limit cycle of the nonlinear Josephson oscillator. This allows to go beyond the perturbation theory and calculate the widths of the Josephson radiation lines.
We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2∕Af, where A is the area of both junctions, and C≈(3.9±0.4)×10−23m2∕K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l∕f noise should scale as 1∕T for temperatures down to at least 0.09K.