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Applied Physics Letters

Flicker (1∕f) noise in the critical current of Josephson junctions at 0.09–4.2K

F. C. Wellstood, C. Urbina, John L. Clarke

Published Nov 29, 2004• 63 citations
Publisher

Abstract

We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2∕Af, where A is the area of both junctions, and C≈(3.9±0.4)×10−23m2∕K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l∕f noise should scale as 1∕T for temperatures down to at least 0.09K.

DOI
10.1063/1.1826236

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We have measured the low-frequency noise in the critical current Ic of six dc superconducting quantum interference devices (SQUIDs) with resistively shunted Nb–NbOx–PbIn Josephson junctions in the temperature range T=0.09–4.2K. Each device is voltage biased, the applied flux is an integer number of flux quanta, and the current fluctuations are measured with a second dc SQUID. At low frequencies f, there is a component of the power spectrum of the critical current fluctuations given approximately by SIc(f)=CIc2T2∕Af, where A is the area of both junctions, and C≈(3.9±0.4)×10−23m2∕K2. For quantum bits based on Josephson junctions, the scaling of SIc(f) with T2 implies that the dephasing time limited by critical current l∕f noise should scale as 1∕T for temperatures down to at least 0.09K.
We measured the low frequency critical current noise in Nb/AlOx/Nb Josephson junctions. Unshunted junctions biased above the gap voltage and resistively shunted junctions biased near the critical current Ic have been measured. For both, the spectral density of δIc/Ic, Sic(f), is proportional to 1/f, scales inversely as the area A and is independent of Jc≡Ic/A over a factor of nearly 20 in Jc. For all devices measured at 4.2 K, Sic(1 Hz)=2.0±0.4×10−12/Hz when scaled to A=1 μm2. We find that, from 4.2 to 0.46 K, Sic(f) decreases linearly with temperature.
We have studied low frequency (1/f) noise of YBa2Cu3O7−δ dc superconducting quantum interference devices (SQUIDs) on SrTiO3 bicrystal substrates. 1/f flux noise, either measured at different temperatures for optimized bias current or measured at 77 K for different bias currents, is almost constant. These facts imply that 1/f noise mainly comes from fluctuations of the critical current of the Josephson junction that form the SQUID. Also, we explain the critical current fluctuations in the junction by an equilibrium temperature fluctuation model.
We have fabricated Y1Ba2Cu3O7−x step-edge junction dc superconducting quantum interference devices (SQUIDs) and characterized their noise performance. The current-voltage characteristics of our SQUIDs are of resistively shunted junction type with critical current densities jc of about 104 A/cm2 and maximum flux to voltage transfer functions δV/δΦ of 20 μV/Φ0 at 77 K. We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the frequency dependent noise in our devices results from critical current fluctuations of the Josephson junctions. A bias current reversing technique is effective in suppressing this noise contribution. A flux noise Φn of 80 μΦ0/Hz1/2 at 1 Hz and 77 K was measured on a dc SQUID with an inductance Ls of 60 pH.
Abstract Noise in superconducting quantum interference devices (dc SQUIDs) with different design, based on Nb/AlO x /Nb technology, has been systematically measured at temperature T = 4.2 K. We demonstrate that for all our devices the power spectral density of the white noise (above a frequency of about 1 kHz) is determined by the shunt resistors, reaching about 5 times Planck’s constant. The low-frequency noise level was measured for washer- and multi-loop-type SQUIDs with systematically varied effective area, SQUID loop perimeter, and inductance. We show that at 1 Hz the noise spectral density is approximately 40 times higher than the white noise level and its scaling with washer width and effective area is negligible. These results are incompatible with several models of the flicker noise source. Possible origins of this noise are discussed.
Critical current fluctuations with a 1∕f spectral density (f is frequency) are potentially a limiting source of intrinsic decoherence in superconducting quantum bits (qubits) based on Josephson tunnel junctions. Prior measurements of this noise were made at nonzero voltages whereas qubits are operated in the zero voltage state. We report measurements of 1∕f noise in a dc superconducting quantum interference device first, coupled to a resonant tank circuit and operated in a dispersive mode at zero voltage, and, second, operated conventionally with a current bias in the voltage regime. Both measurements yield essentially the same magnitude of critical current 1∕f noise.
Wehavefabricated dc superconductingquantuminterferencedevices (SQUIDs) incorpo-rating 45 ± bi-epitaxial grain boundary junction, i.e. YBCO/YSZ and YBCO/YBCO/YSZ, in washer geometry. The1=f noise power of single junction comes fromresistance fluctuation for high current bias andcritical current fluctuation for low current bias. Thenoisespectrum of thedcSQUIDswasmeasuredwithdcandacbiasschemesandshowedvalueof » 1 £ 10 ¡ 5 © 0/Hz1=2 at 100 Hz. The possible noise sources, critical current fluctuations, flux motion noise and resistance fluctuation, are investigated. The results are compared with previous published data. PACS. 85.25.Cp – Josephson devices. PACS. 85.25.Dq – Superconducting quantuminterferencedevices (SQUIDs).