ions in a surface electrode ion trap by using single pulses from a Q-switched Nd:YAG laser to ablate neutral atoms, combined with a two-photon photo-ionization process. The method is three orders of magnitude faster to load a single ion as compared to traditional resistively heated sources and can load large collections of ions in seconds. The negligible thermal load of this method enables the use of this ablation-based loading scheme in ion traps operating under cryogenic conditions.

Optics ExpressNov 5, 201924 citations

Bulletin of the American Physical Society

surface-electrode ion trap loaded by laser ablation

Paul Antohi, Waseem Bakr, Isaac L. Chuang, Jaroslaw Labaziewicz, Kenneth R. Brown

Published Mar 6, 2007• 0 citations

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We demonstrate loading of

^{88}\mathrm{Sr}^{+}

ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of

1--10\phantom{\rule{0.3em}{0ex}}\mathrm{mJ}

and durations of

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. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth

(40\phantom{\rule{0.3em}{0ex}}\mathrm{meV})

below where electron impact ionization loading is typically successful $(\ensuremath{\gtrsim}500\phantom{\rule{0.3em}{0ex}}\mathrm{meV})$.