Chinese Optics Letters

Measurement of the wavelength modulation indices with selective reflection spectroscopy

Liantuan Xiao, Jianming Zhao, Wangbao Yin, Yanting Zhao, Bernard A. Journet, Journet, 贾锁堂

Published Jan 1, 2003• 2 citations

Abstract

The wavelength modulation indices are measured based on harmonic amplitude ratio of 4f_(amp)/6f_(amp) (4f_(amp) and 6f_(amp) are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S_(1/2)(F = 4) ? 6P_(3/2)(F' = 5) transition of cesium D_(2) line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly.

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