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arXiv:2607.00961

Bridging Quantum Computing Paradigms toward Semiconductor Yield: A Controlled CV-versus-DV Comparison on Wafer-Map Defect Classification

Yeonhong Kim, Jonghyeok Im, Monu Nath Baitha, Kyoungsik Kim

quant-phcs.LGSubmitted Jul 1, 2026• Announced Jul 2, 2026• 0 citations
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Abstract

Realizing quantum neural networks (QNNs) in industry requires knowing which quantum computing paradigm suits which task. Motivated by AI accelerators and high-bandwidth memory, where die stacking makes wafer-level defect screening central to yield, we study WM-811K wafer-map defect classification (eight classes), comparing the dominant paradigms, continuous-variable (CV) and discrete-variable (DV), under controlled conditions. To isolate the quantum circuit as the sole variable, a shared convolutional backbone (~4.3M parameters) feeds interchangeable heads (classical dense, CV-QNN, or DV-QNN) as the only structural difference; each quantum head is scaled over three sizes (3, 4, 8 qumodes/qubits). The CV head consistently outperforms the DV head: at four qumodes/qubits it reaches 79.7 +/- 1.8% accuracy versus 61.6 +/- 1.4%, a non-overlapping 18-point gap. The advantage is sharpest on the spatially localized Edge-Loc class, easily confused with Scratch, which CV recovers with recall 0.66 +/- 0.06 while DV fails at every size (<=0.05), showing the structured CV layer better captures fine spatial distinctions between defect types. Training curves show the DV limitation is a representational-capacity ceiling, not an optimization failure; at the Fock cutoff used here (d = 2) the CV advantage reflects two intrinsic properties, a structured, neural-network-analogue layer and continuous phase-space encoding, not Hilbert-space dimensionality. On IBM hardware, DV accuracy holds at shallow depth, degrading only at the deepest circuit. Both quantum heads remain below the classical baseline (85.0%), but the controlled setting isolates where a structured head already helps and, as noise and scale improve, which paradigm can deliver practical advantage.

Comments
15 pages, 5 figures, 5 tables

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Realizing quantum neural networks (QNNs) in industry requires knowing which quantum computing paradigm suits which task. Motivated by AI accelerators and high-bandwidth memory, where die stacking makes wafer-level defect screening central to yield, we study WM-811K wafer-map defect classification (eight classes), comparing the dominant paradigms, continuous-variable (CV) and discrete-variable (DV), under controlled conditions. To isolate the quantum circuit as the sole variable, a shared convolutional backbone (~4.3M parameters) feeds interchangeable heads (classical dense, CV-QNN, or DV-QNN) as the only structural difference; each quantum head is scaled over three sizes (3, 4, 8 qumodes/qubits). The CV head consistently outperforms the DV head: at four qumodes/qubits it reaches 79.7 +/- 1.8% accuracy versus 61.6 +/- 1.4%, a non-overlapping 18-point gap. The advantage is sharpest on the spatially localized Edge-Loc class, easily confused with Scratch, which CV recovers with recall 0.66 +/- 0.06 while DV fails at every size (<=0.05), showing the structured CV layer better captures fine spatial distinctions between defect types. Training curves show the DV limitation is a representational-capacity ceiling, not an optimization failure; at the Fock cutoff used here (d = 2) the CV advantage reflects two intrinsic properties, a structured, neural-network-analogue layer and continuous phase-space encoding, not Hilbert-space dimensionality. On IBM hardware, DV accuracy holds at shallow depth, degrading only at the deepest circuit. Both quantum heads remain below the classical baseline (85.0%), but the controlled setting isolates where a structured head already helps and, as noise and scale improve, which paradigm can deliver practical advantage.
This research work on the well-known WM811K wafer map dataset intends to integrate the insights provided by wafer manufacturing techniques and the computing power of quantum convolutional neural networks (QCNN) approach. The work begins with demonstrating high accuracy (𝑹 𝟐 =99.32%) of the classical convolutional neural network (CCNN) consisting of three consecutive convolution layers on the WM-811K dataset. In later part of the paper, optimized for multi-class classification, the applied QCNN model consisting of four qubits used for convolutional and pooling layers exhibit 99.38% accuracy. The QCNN model establishes supremacy over CCNN model by reducing time requirement to train the model for classifying defects on the wafer images.
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Early detection of oral cancer markedly improves clinical outcomes, yet specialized diagnostic tools remain scarce in low-resource settings. Smartphone-based screening is a scalable alternative but needs lightweight models that run within edge-hardware constraints. Hybrid classical-quantum architectures are emerging candidates for parameter-efficient learning, yet most rely on qubit hardware that needs cryogenic operation, unsuitable for edge deployment. Continuous-variable (CV) photonic quantum computing, which operates at room temperature, offers a complementary route. We investigate a hybrid classical-CV quantum classifier for oral cancer detection from smartphone images. The pipeline combines a MobileNetV1 feature extractor, principal component analysis to 16 dimensions, and a parameterized CV-QNN of displacement, interferometric, and Kerr gates on a photonic backend. We propose a simplified Φ∘D∘U1Φ\circ D \circ U_1Φ∘D∘U1​ CV-QNN architecture that cuts trainable parameters 40-45% relative to the standard CV-QNN layer of Killoran et al. (2019a), and identify dimensionality-reduction and encoding-restriction strategies that mitigate barren plateaus, raising loss-gradient variance by roughly 58 orders of magnitude. Whether the simplified layer beats the full layer is width-dependent: the full layer holds a small but significant edge at two qumodes, whereas the simplified layer is significantly better at four qumodes using 44% fewer parameters. The strongest model, a four-qumode simplified CV-QNN with only 18 parameters, attains the highest validation AUC of all models, exceeds a 55-parameter classical baseline using 67% fewer parameters, and reaches 100% calibrated test accuracy across all seeds. These results support CV photonic quantum machine learning for parameter-efficient, room-temperature medical image classification and motivate progress toward edge quantum AI.
Abstract Accurate classification of wafer map defects is crucial for enhancing semiconductor yield and diagnosing process irregularities. Convolutional neural networks (CNNs) have demonstrated impressive performance on the WM-811K wafer map dataset; nevertheless, as structures become more complex, their processing requirements increase. The possibility for more compact representations and effective training through quantum parallelism is shown by recent developments in quantum machine learning (QML), namely quantum neural networks and quantum convolutional models. Inspired by these advancements, this work proposes a hybrid framework for wafer defect classification that combines a Quantum Convolutional Neural Network (QCNN) with a classical CNN (CCNN). As far as we are aware, this is the first time a QCNN has been used for semiconductor wafer map analysis. Experimental results reveal that while the QCNN achieves accuracy ( R 2 = 99.38%) comparable to the CCNN ( R 2 = 99.32%), it greatly decreases training time due to the low-overhead Simultaneous Perturbation Stochastic Approximation (SPSA) optimizer and the compactness of quantum circuits. These results demonstrate the potential of quantum-enhanced architectures for semiconductor analytics in the future as quantum hardware develops.
Continuous-variable (CV) quantum computing offers a promising framework for scalable quantum machine learning, leveraging optical systems with infinite-dimensional Hilbert spaces. While discrete-variable (DV) quantum neural networks have shown remarkable progress in various computer vision tasks, CV quantum models remain comparatively underexplored. In this work, we present a feasibility study of continuous-variable quantum neural networks (CV-QCNNs) applied to biomedical image classification. Utilizing photonic circuit simulation frameworks, we construct CV quantum circuits composed of Gaussian gates, such as displacement, squeezing, rotation, and beamsplitters to emulate convolutional behavior. Our experiments are conducted on the MedMNIST dataset collection, a set of annotated medical image benchmarks for multiple diagnostic tasks. We evaluate CV-QCNN's performance in terms of classification accuracy, model expressiveness, and resilience to Gaussian noise, comparing against classical CNNs and equivalent DV quantum circuits. This study aims to identify trade-offs between DV and CV paradigms for quantum-enhanced medical imaging. Our results highlight the potential of continuous-variable models and their viability for future computer-aided diagnosis systems.
The quality of raw materials is fundamental to the reliability and overall performance of final products, serving as the cornerstone of modern manufacturing standards. While traditional inspection methods can be effective, they are frequently time-consuming, labor-intensive, and unsuitable for high-throughput production environments. Recent advances in quantum computing offer significant advantages for processing large-scale data and complex feature representations, with strong potential to address the limitations of traditional inspection techniques. This study introduces an automated approach for grading raw materials, such as steel and fabric, which are widely used in industries including automotive, textiles, and general manufacturing, by integrating deep learning with quantum machine learning. A Hybrid Quantum Classical Neural Network (HQCNN) is proposed to enhance defect detection. The HQCNN utilizes a fine-tuned ResNet-18 backbone for robust feature extraction. Extracted features are used by a trainable depth controller that determines the complexity of a six-qubit variational quantum circuit (VQC) with data-adaptive, dynamic depth. Each VQC layer consists of rotations around the Y -axis (RY) and Z -axis (RZ), combined with Controlled-NOT (CNOT) gates arranged in a ring topology, with the total number of layers determined on a per-sample basis. The model is trained using a resource-aware loss function that penalizes excessive circuit depth, and the resulting quantum features are fused with classical features for final classification. Comprehensive ablation studies comparing the HQCNN against parameter-matched classical multi-layer perceptrons (MLPs) and fixed-depth quantum circuits demonstrate the fundamental advantage of the proposed approach. The dynamic HQCNN achieves 88.1 ± 2.4% accuracy on the complex metal surface defect dataset and 93.0 ± 1.8% on the fabric defects dataset. More importantly, it yields a statistically significant improvement in the macro F1-score (from 0.79 in classical parameter-matched baselines to 0.87), proving its superior capability in recognizing complex, minority-class defects while utilizing a fraction of the trainable parameters in the classification head compared to traditional architectures.