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arXiv:2602.03938

Detailed, interpretable characterization of mid-circuit measurement on a transmon qubit

Piper C. Wysocki, Luke D. Burkhart, Madeline H. Morocco, Corey I. Ostrove, Riley J. Murray, Tristan Brown, Jeffrey M. Gertler, David K. Kim, Nathan E. Miller, Bethany M. Niedzielski, Katrina M. Sliwa, Robin Blume-Kohout, Gabriel O. Samach, Mollie E. Schwartz, Kenneth M. Rudinger

quant-phSubmitted Feb 3, 2026• Announced Feb 5, 2026• 0 citations• Revised Aug 6, 2026 (v3)
v1 · Feb 3, 2026v2 · Feb 18, 2026v3 · Aug 6, 2026
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Abstract

Mid-circuit measurements (MCMs) are critical components of the quantum error correction protocols expected to enable utility-scale quantum computing. MCMs can be modeled by quantum instruments (a type of quantum operation or process), which can be characterized self-consistently using gate set tomography. However, experimentally estimated quantum instruments are often hard to interpret or relate to device physics. We address this challenge by adapting the error generator formalism -- previously used to interpret noisy quantum gates by decomposing their error processes into physically meaningful sums of "elementary errors" -- to MCMs. We deploy our new analysis on a transmon qubit device to tease out and quantify error mechanisms including amplitude damping, readout error, and imperfect collapse. We examine in detail how the magnitudes of these errors vary with the readout pulse amplitude, recover the key features of dispersive readout predicted by theory, and show that these features can be modeled parsimoniously using a reduced model with just a few parameters.

Comments
Correction to Figure 12 in the appendix (labeling issue)

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Mid-circuit measurements (MCMs) are critical components of the quantum error correction protocols expected to enable utility-scale quantum computing. MCMs can be modeled by quantum instruments (a type of quantum operation or process), which can be characterized self-consistently using gate set tomography. However, experimentally estimated quantum instruments are often hard to interpret or relate to device physics. We address this challenge by adapting the error generator formalism -- previously used to interpret noisy quantum gates by decomposing their error processes into physically meaningful sums of "elementary errors" -- to MCMs. We deploy our new analysis on a transmon qubit device to tease out and quantify error mechanisms including amplitude damping, readout error, and imperfect collapse. We examine in detail how the magnitudes of these errors vary with the readout pulse amplitude, recover the key features of dispersive readout predicted by theory, and show that these features can be modeled parsimoniously using a reduced model with just a few parameters.
Measurements that occur within the internal layers of a quantum circuit -- mid-circuit measurements -- are an important quantum computing primitive, most notably for quantum error correction. Mid-circuit measurements have both classical and quantum outputs, so they can be subject to error modes that do not exist for measurements that terminate quantum circuits. Here we show how to characterize mid-circuit measurements, modelled by quantum instruments, using a technique that we call quantum instrument linear gate set tomography (QILGST). We then apply this technique to characterize a dispersive measurement on a superconducting transmon qubit within a multiqubit system. By varying the delay time between the measurement pulse and subsequent gates, we explore the impact of residual cavity photon population on measurement error. QILGST can resolve different error modes and quantify the total error from a measurement; in our experiment, for delay times above 1000 ns we measured a total error rate (i.e., half diamond distance) of ε⋄=8.1±1.4%ε_{\diamond} = 8.1 \pm 1.4 \%ε⋄​=8.1±1.4%, a readout fidelity of 97.0±0.3%97.0 \pm 0.3\%97.0±0.3%, and output quantum state fidelities of 96.7±0.6%96.7 \pm 0.6\%96.7±0.6% and 93.7±0.7%93.7 \pm 0.7\%93.7±0.7% when measuring 000 and 111, respectively.
The quantum instrument (QI) formalism is required to model mid-circuit measurements (MCMs) and the dependence of the post-measurement state on the measurement outcome. Correctly modeling QIs is essential for applications using MCMs, such as adaptive circuits and quantum error correction. Although QIs yield a joint quantum-classical state after measurement, errors in QIs can still be represented by a d2×d2d^2 \times d^2d2×d2 superoperator (e.g., process or transfer matrix) for each outcome, just as superoperators describe Markovian errors on unitary gates. However, because the joint quantum-classical system has a distinct error model for each outcome, this complicates the usual interpretation of process- or transfer-matrix error models. This Note offers practical guidance on understanding and interpreting QI error models.
High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits, and other paths to solving classically intractable problems. But there are few methods to assess their performance comprehensively. In this work, we address this gap by introducing the first randomized benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. Using this protocol, we detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same protocol to measure the rate of measurement-induced crosstalk error on a 27-qubit IBM Q processor, and quantify how much of that error is eliminated by dynamical decoupling. Characterisation of quantum operations is fundamental in quantum technologies - quantum computing in particular - but there’s currently no reliably efficient method to assess mid-circuit measurements, which are a key component for subfields like quantum error correction. Here, the authors fill this gap, integrating MCMs into the framework of randomized benchmarking.
Accurate modeling of midcircuit measurements (MCMs) is essential for dynamic-circuit operations such as syndrome extraction, measurement-based reset, and the separation of state-preparation and measurement error. Unlike terminal measurement, a noisy MCM both produces a classical outcome and alters the incoming quantum state, thereby influencing subsequent circuit operations. This makes conventional confusion-matrix or fidelity-level characterization insufficient. Here, we introduce an efficient, self-consistent protocol for learning a single-qubit Z-twirled MCM instrument, retaining the readout-backaction correlations and excitation-decay asymmetry that are erased in Pauli-error descriptions. Remarkably, readout bit strings from only three repeated MCMs on a maximally mixed input determine all learnable parameters of the reduced instrument, up to a single unidentifiable gauge degree of freedom. Physicality constraints convert this nonidentifiability into narrow, gauge-aware error intervals. Implemented on IBM superconducting processors, the learned instrument improves Pauli-observable prediction by ∼100×\sim 100\times∼100× over a conventional confusion-matrix model and reveals a T1T_1T1​-decay dominated backaction. Our protocol provides a compact characterization layer for state-preparation and measurement error separation, reset optimization, and noise-aware quantum error correction.
Abstract Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are of great interest. Beyond the measured qubit, it is also relevant to determine what, if any, impact mid-circuit measurement has on adjacent, unmeasured, spectator qubits. Here, we present a mid-circuit measurement benchmarking suite developed from the ubiquitous paradigm of randomized benchmarking. We show how our benchmarking suite can be used to both detect as well as quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. We demonstrate the scalability of our suite by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and support our experimental results with numerical simulations. Further, using a mid-circuit measurement tomography protocol we establish the nature of the errors identified by our benchmarking suite.
Distributed Quantum Computing (DQC) and Quantum Error Correction (QEC) rely on dynamic circuits that include Mid-Circuit Measurements (MCMs) and classical feedback. These operations present a major bottleneck: MCMs suffer from high error rates that lead to real-time branching errors, while MCM and classical feedback latencies amplify decoherence errors. Current hardware controllers, qubit-state discriminators, and software error mitigation techniques fail to address these challenges holistically. We propose MCMit, a hardware-software co-design to mitigate branching and latency-induced errors. MCMit introduces a scalable, constant-latency multi-control branch instruction for faster classical feedback and two qubit-state discriminators, a transformer, and a CNN, with high accuracy even under short measurement durations. On the software side, static MCM elimination and stochastic branching complement the hardware by mitigating residual branching errors that persist despite hardware improvements. We implement MCMit on Qubic and evaluate it using experimentally extracted QPU readout traces. Our branch instruction reduces feedback latency by up to 70\%, improving circuit depths by up to 7×7\times7× over Qubic. Our CNN discriminator achieves up to 62\% higher accuracy for short measurement durations than the baselines, driving 1.2−9.4×1.2-9.4\times1.2−9.4× lower logical error rates in QEC. Last, our software mitigation improves fidelity by 18--30\% over baseline methods in DQC workloads.