Measurements that occur within the internal layers of a quantum circuit -- mid-circuit measurements -- are an important quantum computing primitive, most notably for quantum error correction. Mid-circuit measurements have both classical and quantum outputs, so they can be subject to error modes that do not exist for measurements that terminate quantum circuits. Here we show how to characterize mid-circuit measurements, modelled by quantum instruments, using a technique that we call quantum instrument linear gate set tomography (QILGST). We then apply this technique to characterize a dispersive measurement on a superconducting transmon qubit within a multiqubit system. By varying the delay time between the measurement pulse and subsequent gates, we explore the impact of residual cavity photon population on measurement error. QILGST can resolve different error modes and quantify the total error from a measurement; in our experiment, for delay times above 1000 ns we measured a total error rate (i.e., half diamond distance) of $ε_{\diamond} = 8.1 \pm 1.4 \%$, a readout fidelity of $97.0 \pm 0.3\%$, and output quantum state fidelities of $96.7 \pm 0.6\%$ and $93.7 \pm 0.7\%$ when measuring $0$ and $1$, respectively.
Measurements that occur within the internal layers of a quantum circuit -- mid-circuit measurements -- are an important quantum computing primitive, most notably for quantum error correction. Mid-circuit measurements have both classical and quantum outputs, so they can be subject to error modes that do not exist for measurements that terminate quantum circuits. Here we show how to characterize mid-circuit measurements, modelled by quantum instruments, using a technique that we call quantum instrument linear gate set tomography (QILGST). We then apply this technique to characterize a dispersive measurement on a superconducting transmon qubit within a multiqubit system. By varying the delay time between the measurement pulse and subsequent gates, we explore the impact of residual cavity photon population on measurement error. QILGST can resolve different error modes and quantify the total error from a measurement; in our experiment, for delay times above 1000 ns we measured a total error rate (i.e., half diamond distance) of ε⋄=8.1±1.4%, a readout fidelity of 97.0±0.3%, and output quantum state fidelities of 96.7±0.6% and 93.7±0.7% when measuring 0 and 1, respectively.
Mid-circuit measurements (MCMs) are critical components of the quantum error correction protocols expected to enable utility-scale quantum computing. MCMs can be modeled by quantum instruments (a type of quantum operation or process), which can be characterized self-consistently using gate set tomography. However, experimentally estimated quantum instruments are often hard to interpret or relate to device physics. We address this challenge by adapting the error generator formalism -- previously used to interpret noisy quantum gates by decomposing their error processes into physically meaningful sums of "elementary errors" -- to MCMs. We deploy our new analysis on a transmon qubit device to tease out and quantify error mechanisms including amplitude damping, readout error, and imperfect collapse. We examine in detail how the magnitudes of these errors vary with the readout pulse amplitude, recover the key features of dispersive readout predicted by theory, and show that these features can be modeled parsimoniously using a reduced model with just a few parameters.
Key applications of quantum computing, including error correction, rely critically on the capability to measure (read out) the state of selected quantum bits, without disturbing other qubits or terminating the computation. Such $m\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}d\phantom{\rule{0}{0ex}}c\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}r\phantom{\rule{0}{0ex}}c\phantom{\rule{0}{0ex}}u\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}t$ $m\phantom{\rule{0}{0ex}}e\phantom{\rule{0}{0ex}}a\phantom{\rule{0}{0ex}}s\phantom{\rule{0}{0ex}}u\phantom{\rule{0}{0ex}}r\phantom{\rule{0}{0ex}}e\phantom{\rule{0}{0ex}}m\phantom{\rule{0}{0ex}}e\phantom{\rule{0}{0ex}}n\phantom{\rule{0}{0ex}}t\phantom{\rule{0}{0ex}}s$ are now being implemented in a few cutting-edge platforms, but their development is hindered by lack of a means to measure their performance and characterize the errors that they produce. The authors show how to extend a popular tomography method for precise characterization of midcircuit measurements, and using their QILGST protocol discover a pernicious kind of non-Markovian error, which once identified can be handled.
Qubit measurements are central to quantum information processing.In the field of superconducting qubits, standard readout techniques are limited not only by the signal-to-noise ratio, but also by state relaxation during the measurement.In this work, we demonstrate that the limitation due to relaxation can be suppressed by using the many-level Hilbert space of superconducting circuits: In a multilevel encoding, the measurement is corrupted only when multiple errors occur.Employing this technique, we show that we can directly resolve transmon gate errors at the level of one part in 10 3 .Extending this idea, we apply the same principles to the measurement of a logical qubit encoded in a bosonic mode and detected with a transmon ancilla, implementing a proposal by Hann et al. [Phys. Rev. A 98, 022305 (2018)].Qubit state assignments are made based on a sequence of repeated readouts, further reducing the overall infidelity.This approach is quite general, and several encodings are studied; the codewords are more distinguishable when the distance between them is increased with respect to photon loss.The trade-off between multiple readouts and state relaxation is explored and shown to be consistent with the photon-loss model.We report a logical assignment infidelity of 5.8 × 10 -5 for a Fock-based encoding and 4.2 × 10 -3 for a quantum error correction code (the S ¼ 2, N ¼ 1 binomial code).Our results not only improve the fidelity of quantum information applications, but also enable more precise characterization of process or gate errors.
Abstract Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are of great interest. Beyond the measured qubit, it is also relevant to determine what, if any, impact mid-circuit measurement has on adjacent, unmeasured, spectator qubits. Here, we present a mid-circuit measurement benchmarking suite developed from the ubiquitous paradigm of randomized benchmarking. We show how our benchmarking suite can be used to both detect as well as quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. We demonstrate the scalability of our suite by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and support our experimental results with numerical simulations. Further, using a mid-circuit measurement tomography protocol we establish the nature of the errors identified by our benchmarking suite.
Fast, accurate, and low-leakage qubit measurement is a key requirement for quantum error correction. Here, we demonstrate measurement of a superconducting transmon qubit with a total duration of 97(1) ns, defined as the time from the start of the measurement pulse until the measurement-induced error on a subsequent π-pulse operation falls below 10−4. By combining a large state-averaged resonator decay rate of κeff/2π = 30.8 MHz with a dispersive shift close to the optimal SNR-per-photon condition, we achieve an assignment error of 0.17(1)% using a 58-ns measurement pulse, with residual readout photons depleting passively in tens of nanoseconds without an active depletion pulse. Using a repeated-measurement sequence together with a leakage-sensitive measurement, we benchmark the measurement-induced state transitions, finding a per-measurement leakage rate of 2.7(2)×10−5, only twice the background rate and two orders of magnitude below the measurement-induced relaxation rate, which dominates the assignment error. Floquet simulations indicate that the multiphoton resonances present at the operating point are weakly coupled and traversed diabatically, without causing leakage. These results demonstrate that a large resonator decay rate, combined with a dispersive shift close to the optimal SNR-per-photon condition, can enable fast, high-fidelity, low-leakage dispersive readout at small qubit-resonator detuning.
High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits, and other paths to solving classically intractable problems. But there are few methods to assess their performance comprehensively. In this work, we address this gap by introducing the first randomized benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. Using this protocol, we detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same protocol to measure the rate of measurement-induced crosstalk error on a 27-qubit IBM Q processor, and quantify how much of that error is eliminated by dynamical decoupling. Characterisation of quantum operations is fundamental in quantum technologies - quantum computing in particular - but there’s currently no reliably efficient method to assess mid-circuit measurements, which are a key component for subfields like quantum error correction. Here, the authors fill this gap, integrating MCMs into the framework of randomized benchmarking.