Material research is a key frontier in advancing superconducting qubit and circuit performance. In this work, we develop a simple and broadly applicable framework for accurately characterizing two-level system (TLS) loss using internal quality factor measurements of superconducting transmission line resonators over a range of temperatures and readout powers. We applied this method to a series of $α$-Ta resonators that span a wide frequency range, thus providing a methodology for probing the loss mechanisms in the fabrication process of this emerging material for superconducting quantum circuits. We introduce an analytical model that captures the loss behavior without relying on numerical simulations, enabling straightforward interpretation and calibration. Additionally, our measurements reveal empirical frequency-dependent trends in key parameters of the model, suggesting contributions from mechanisms beyond the standard tunneling model of TLSs.
Material research is a key frontier in advancing superconducting qubit and circuit performance. In this work, we develop a simple and broadly applicable framework for accurately characterizing two-level system (TLS) loss using internal quality factor measurements of superconducting transmission line resonators over a range of temperatures and readout powers. We applied this method to a series of α-Ta resonators that span a wide frequency range, thus providing a methodology for probing the loss mechanisms in the fabrication process of this emerging material for superconducting quantum circuits. We introduce an analytical model that captures the loss behavior without relying on numerical simulations, enabling straightforward interpretation and calibration. Additionally, our measurements reveal empirical frequency-dependent trends in key parameters of the model, suggesting contributions from mechanisms beyond the standard tunneling model of TLSs.
Superconducting qubits are a leading system for realizing large-scale quantum processors, but overall gate fidelities suffer from coherence times limited by microwave dielectric loss.Recently discovered tantalum-based qubits exhibit record lifetimes exceeding 0.3 ms.Here, we perform systematic, detailed measurements of superconducting tantalum resonators in order to disentangle sources of loss that limit state-of-the-art tantalum devices.By studying the dependence of loss on temperature, microwave photon number, and device geometry, we quantify materials-related losses and observe that the losses are dominated by several types of saturable two-level systems (TLSs), with evidence that both surface and bulk related TLSs contribute to loss.Moreover, we show that surface TLSs can be altered with chemical processing.With four different surface conditions, we quantitatively extract the linear absorption associated with different surface TLS sources.Finally, we quantify the impact of the chemical processing at singlephoton powers, the relevant conditions for qubit device performance.In this regime, we measure resonators with internal quality factors ranging from 5 to 15 × 10 6 , comparable to the best qubits reported.In these devices, the surface and bulk TLS contributions to loss are comparable, showing that systematic improvements in materials on both fronts are necessary to improve qubit coherence further.
Two-level systems (TLSs) are known to be a dominant source of dissipation and decoherence in superconducting qubits. Superconducting resonators provide a convenient way to study TLS-induced loss due to easier design and fabrication in comparison with devices that include nonlinear elements such as Josephson junctions. However, precisely measuring TLS-induced loss in a resonator in the quantum regime is challenging due to low signal-to-noise ratio (SNR) and the temporal fluctuations of the TLS, leading to uncertainties of 20% or more in the loss measurement. To address these limitations, we develop a multiwavelength resonator device that extends the resonator length from a standard quarter wavelength λ / 4 to N λ / 4 , where N = 37 , at 6 GHz. This design provides two key advantages: the TLS-induced fluctuations are reduced by a factor of N due to spatial averaging over an increased number of independent TLSs, and the measurement SNR for a given intraresonator energy density increases by a factor of N . The multiwavelength resonator also has fundamental and harmonic resonances spanning a wide frequency range, allowing one to study the frequency dependence of TLS-induced loss. In this work we fabricate both multiwavelength and quarter-wave coplanar waveguide resonators formed from thin-film aluminum on a silicon substrate, and characterize their TLS properties at 10 and 200 mK. Our results show that the power-dependent TLS-induced loss measured from the N λ / 4 resonator agrees well with that measured from the λ / 4 resonator, while achieving a fivefold reduction in measurement uncertainty due to TLS fluctuations, down to 5 % . The N λ / 4 resonator also provides a measure of the fully unsaturated TLS-induced loss due to the increased measurement SNR at low intraresonator energy densities. Finally, measurements across seven harmonic resonances of the N λ / 4 resonator between 4 and 6.5 GHz reveal no frequency dependence in the TLS-induced loss over this range. These results highlight the benefits of the multiwavelength resonator approach for material development in superconducting quantum circuits.
Utilizing tantalum (Ta) in superconducting circuits has led to significant improvements, such as high qubit lifetimes and quality factors in both qubits and resonators, underscoring the importance of material optimization in quantum device performance. In this work, we explore superconducting gap engineering in Ta-based devices as a strategy to expand the range of viable host materials. By alloying 20 atomic percent hafnium (Hf) into Ta thin films, we achieve a superconducting transition temperature (Tc) of 6.09~K, as measured by DC transport, reflecting an increased superconducting gap. We systematically vary deposition conditions to control film orientation and transport properties of the Ta-Hf alloy films. The enhancement in Tc is further confirmed by microwave measurements at millikelvin temperatures. Despite the 40\% increase in Tc relative to pure Ta, the loss contributions from two-level systems (TLS) and quasiparticles (QPs) remain unchanged in the low-temperature regime. These findings highlight the potential of material engineering to improve superconducting circuit performance and motivate further exploration of engineered alloys for quantum technologies.
Superconducting coplanar waveguide resonators are essential components in quantum processors, where their internal quality factor (Qi) constrains qubit coherence and readout fidelity. In niobium devices, microwave losses at millikelvin temperatures are strongly influenced by two-level systems (TLS) associated with the complex NbOx surface oxide. To mitigate these losses, we investigate a surface-engineering approach in which Nb films are capped in situ with a thin tantalum layer to suppress Nb2O5 formation and replace the native NbOx interface with a Ta-based oxide.
We fabricate Nb/Ta bilayer and reference Nb resonators on high-resistivity silicon using identical DC sputtering and wet etching conditions, and characterize their performance at millikelvin temperatures. Fresh Ta-encapsulated devices exhibit internal quality factors up to 2.4 x 10^6 in the near-single-photon regime, with power dependence consistent with reduced TLS-related loss at the metal-air interface. A control Nb device fabricated under the same process shows comparatively lower Q_TLS, consistent with the beneficial effect of the Ta capping layer. Furthermore, ageing tests performed on Nb/Ta resonators after six months reveal a moderate reduction in Q_TLS relative to their initial values, yet the performance remains superior to newly fabricated Nb-only devices. These results suggest that thin Ta encapsulation enhances interface quality and contributes to improved temporal stability while remaining compatible with Nb-based fabrication workflows.
Superconducting microwave resonators are critical to quantum computing and sensing technologies. Additionally, they are common proxies for superconducting qubits when determining the effects of performance-limiting loss mechanisms such as from two-level systems (TLSs). The extraction of these loss mechanisms is often performed by measuring the internal quality factor Qi as a function of power or temperature. In this work, we investigate large temporal fluctuations of Qi at low powers over periods of 12–16 h (relative standard deviation σQi/Qi=13%). These fluctuations are ubiquitous across multiple resonators, chips, and cooldowns. We are able to attribute these fluctuations to variations in the TLS loss tangent due to two main indicators. First, measured fluctuations decrease as power and temperature increase. Second, for interleaved measurements, we observe correlations between low- and medium-power Qi fluctuations and an absence of correlations with high-power fluctuations. Agreement with the TLS loss tangent mean is obtained by performing measurements over a time span of a few hours. We hypothesize that, in addition to decoherence, due to coupling to individual near-resonant TLS, superconducting qubits are affected by these observed TLS loss tangent fluctuations.
Measuring the internal quality factor of coplanar waveguide superconducting resonators is an established method of determining small losses in superconducting devices. Often, resonator losses are attributed to two-level system (TLS) defects using a power dependent model for the quality factor. However, excess non-equilibrium quasiparticles can also limit the quality factor of superconducting resonators. Here, a two-temperature, power and temperature dependent model is used to evaluate resonator losses for titanium nitride and aluminum coplanar waveguide resonators with loss tangents of 10−5–10−6. This model enables a set of parameters to describe both the internal quality factor and fractional frequency shift of the resonator across a broad range of average cavity photon numbers, from 1 to 106, and temperatures between those limited by the experimental apparatus near 50 mK and thermal quasiparticle dominated. The presented model also offers potential insight into observing the temperature and power dependence of TLS–TLS interactions in these resonators.