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arXiv:2504.04397 · Physical Review Applied

Ultrasensitive transverse deflection measurement with two-photon interference

Chaojie Wang, Yuning Zhang, Yuanyuan Chen, Lixiang Chen

Published Dec 9, 2025• 0 citations
arXivHTMLPDF

Abstract

Hong-Ou-Mandel (HOM) interference is an intrinsic quantum phenomena that goes beyond the possibilities of classical physics, and enables various applications in quantum metrology. While the timing resolution of HOM-based sensor is generally investigated, the ultimate quantum sensitivity in the estimation of transverse deflection or displacement between paired photons interfering at a balanced beam splitter has been explored relatively little. Here, we present an experimental demonstration of a spatial HOM interferometry for measuring the transverse deflection of an optical beam by using transverse momentum sampling measurements. This feasible scheme suffices to achieve great precision with comparatively little technological effort, which circumvents the stringent requirement in direct imaging resolution at the diffraction limit. We can adaptively determine optimum working points using a Fisher information analysis, and demonstrate an optimized spatial HOM interferometry according to practical applications. These results may significantly facilitate the use of quantum interference for high precision spatial sensing, and pave the way to more complex quantum imaging techniques like nanoscopic microscopy.

DOI
10.1103/s7yr-2fk3

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Hong-Ou-Mandel (HOM) interference is an intrinsic quantum phenomena that goes beyond the possibilities of classical physics, and enables various applications in quantum metrology. While the timing resolution of HOM-based sensor is generally investigated, the ultimate quantum sensitivity in the estimation of transverse deflection or displacement between paired photons interfering at a balanced beam splitter has been explored relatively little. Here, we present an experimental demonstration of a spatial HOM interferometry for measuring the transverse deflection of an optical beam by using transverse momentum sampling measurements. This feasible scheme suffices to achieve great precision with comparatively little technological effort, which circumvents the stringent requirement in direct imaging resolution at the diffraction limit. We can adaptively determine optimum working points using a Fisher information analysis, and demonstrate an optimized spatial HOM interferometry according to practical applications. These results may significantly facilitate the use of quantum interference for high precision spatial sensing, and pave the way to more complex quantum imaging techniques like nanoscopic microscopy.
We present a quantum sensing scheme achieving the ultimate quantum sensitivity in the estimation of the transverse displacement between two photons interfering at a balanced beam splitter, based on transverse-momentum sampling measurements at the output. This scheme can possibly lead to enhanced high-precision nanoscopic techniques, such as superresolved single-molecule localization microscopy with quantum dots, by circumventing the requirements in standard direct imaging of camera resolution at the diffraction limit, and of highly magnifying objectives. Interestingly, we show that our interferometric technique achieves the ultimate spatial precision in nature irrespectively of the overlap of the two displaced photonic wave packets, while its precision is only reduced of a constant factor for photons differing in any nonspatial degrees of freedom. This opens a new research paradigm based on the interface between spatially resolved quantum interference and quantum-enhanced spatial sensitivity.
Abstract We demonstrate an experimental scheme for high-precision position measurements based on transverse-momentum-resolved two-photon interferometry with independent photons and single photon avalanche diode (SPAD) arrays. Our scheme extends the operative range of Hong–Ou–Mandel interferometry beyond its intrinsic constraints due to photons indistinguishability, paving the way to applications in high-resolution imaging. We assess the experimental results against the ultimate precision bounds as determined by quantum estimation theory. Our experiment ultimately proves that transverse-momentum resolved measurements of fourth-order correlations in the fields can be employed to overcome spatial distinguishability between independent photons. The relevance of our results extends beyond sensing and imaging towards quantum information processing, as we show that partial photon distinguishability and entanglement impurity are not necessarily a nuisance in a technique that relies on two-photon interference.
Two-photon interference in a Hong-Ou-Mandel (HOM) interferometer can be used as a quantum sensing mechanism due to the sensitivity of the interference dip to perturbations of the photon indistinguishability. In particular, recent works have generalized this concept to microscopy setups, but the sensitivity to optical path differences constrains its application to samples with thickness variation typically below a few micrometers if tracking changes in the coincidences at a fixed delay. Extending the concept to polarization microscopy and circumventing this limitation, this manuscript explores the use of a narrowband photon pair source with coherence length >1 mm to broaden the HOM dip. Thus, realistic sample-thickness variations introduce negligible temporal distinguishability, and changes in coincidence rate at the dip centre are then dominated by sample-induced polarization effects. To compute the polarization rotation, we develop a statistical model for the interferometer, derive the Fisher information, and establish a maximum-likelihood estimator for the local fast-axis angle. Recording dip and baseline frames at each sample position via raster scanning, the experimental results validate the framework, agreeing with classical polarized-intensity images while demonstrating operation at a maximum-precision regime and insensitiveness to layer thickness. Overall, the approach enclosed provides a quantum-based quantitative imaging of birefringent structures, which can motivate further advantageous applications, including enhanced signal-to-noise ratio and lower damage imaging of photosensitive samples.
Quantum interference forces two indistinguishable input photons to depart a beamsplitter in the same (of two possible) spatial output modes; this is known as the Hong-Ou-Mandel (HOM) effect. It provides a quantitative way of measuring the distinguishability between two photons and also has been utilised to determine their relative temporal delays [1, 2]. HOM interferometry offers numerous advantages over its classical counterpart, most importantly it lacks any dependence on the phase of the photons and therefore can potentially provide reliable measurements in environments where the phase is unstable. To date there have been very few investigations on the precision that is achievable with HOM interferometry. Experiments with collinear geometries have yielded sensitivities as low as 0.1fs however these approaches are limited to measurements of birefringence and other polarisation dependent effects [3, 4], as the precision derives from the inherently stable shared path of the photon pairs. Typical non-shared path HOM interferometers exhibit resolution of roughly 1–3 fs (0.3–1 μm).
Quantum technologies have been widely recognized as unprecedented opportunities for ultra-high precision metrology. As a celebrated example in modern quantum optics, the Hong-Ou-Mandel (HOM) interferometer is well-known for enabling temporal resolutions on the attosecond scale. However, the relatively low Fisher information per trial in ordinary HOM measurements typically necessitates tens of thousands of repetitions to achieve such precision. Here, we propose and demonstrate a sample-half-inserted HOM (SHOM) interferometer, which enhances the Fisher information by five orders of magnitude in a single interference event. By introducing an asymmetric photon-sample interaction, the SHOM configuration produces a distinctive dip-bump-dip interference structure, converting what was previously viewed as an artifact into a helpful metrological resource. Experimentally, we measured the optical path difference with an average precision of 4.09 nm (13.63 as) and an average accuracy of 1.22 nm (4.07 as) using O(107)O(10^7)O(107) photons. Our results establish SHOM interferometry as an efficient phase-insensitive approach, not only paving the way toward practical quantum-enhanced thickness measurement for transparent materials, but also serving as an elegant strategy to improve the performance of various quantum devices.
We demonstrate real-time displacement measurement using spectrally resolved Hong–Ou–Mandel (HOM) interference that saturates the quantum Cram´er-Rao bound. Unlike conventional HOM-based methods, our approach does not require the displacement to be confined within the HOM dip width, typically a few tens of microns. By analyzing the periodicity of spectral interference fringes, we can maintain sensitivity at the quantum limit over displacement ranges extending to hundreds of microns. In principle, the measurable range can be extended up to the coherence length of the pump laser, limited only by the spectral resolution of the detector. We further demonstrate that real-time displacement tracking is feasible with current technology, establishing this technique as a practical and powerful tool for quantum-enhanced sensing and metrology.