Cross-entropy benchmarking is a central technique adopted to certify a quantum chip in recent investigations. To better understand its mathematical foundation and develop new benchmarking schemes, the concept of ergodicity was introduced to random circuit sampling and it was found that the Haar random quantum circuit could satisfy an ergodicity condition—the average of certain types of postprocessing function over the output bit strings is close to the average over the unitary ensemble. For noiseless random circuits, it was proven that the ergodicity holds for polynomials of degree t with positive coefficients when the random circuits form a unitary 2 t -design. For strong enough noise, the ergodicity condition is violated, which suggests that ergodicity is a property that can be exploited to certify a quantum chip. The deviation of ergodicity was formulated as a measure for quantum chip benchmarking, and it was demonstrated that it can be used to estimate the circuit fidelity for global depolarizing noise and weakly correlated noise. For a quadratic postprocessing function, our framework recovered Google's result on estimating the circuit fidelity via linear cross-entropy benchmarking (XEB), and we gave a sufficient condition on the noise model characterizing when such estimation is valid. The results establish an interesting connection between ergodicity and noise in random circuits and provide new insights into designing quantum benchmarking schemes.
Cross-entropy benchmarking is a central technique adopted to certify a quantum chip in recent investigations. To better understand its mathematical foundation and develop new benchmarking schemes, the concept of ergodicity was introduced to random circuit sampling and it was found that the Haar random quantum circuit could satisfy an ergodicity condition—the average of certain types of postprocessing function over the output bit strings is close to the average over the unitary ensemble. For noiseless random circuits, it was proven that the ergodicity holds for polynomials of degree t with positive coefficients when the random circuits form a unitary 2 t -design. For strong enough noise, the ergodicity condition is violated, which suggests that ergodicity is a property that can be exploited to certify a quantum chip. The deviation of ergodicity was formulated as a measure for quantum chip benchmarking, and it was demonstrated that it can be used to estimate the circuit fidelity for global depolarizing noise and weakly correlated noise. For a quadratic postprocessing function, our framework recovered Google's result on estimating the circuit fidelity via linear cross-entropy benchmarking (XEB), and we gave a sufficient condition on the noise model characterizing when such estimation is valid. The results establish an interesting connection between ergodicity and noise in random circuits and provide new insights into designing quantum benchmarking schemes.
Random circuit sampling (RCS) remains one of the most competitive frameworks for demonstrating quantum advantage in near-term noisy intermediate-scale quantum (NISQ) hardware. Unfortunately, absent error-correction, existing benchmarks to characterize these experiments, like linear cross-entropy, have been classically spoofed due to noise. Because of this, there are interesting regimes, like shallow-depth random quantum circuits, where sampling is plausibly classically intractable, but no existing benchmark can distinguish between a noisy quantum computer and an adversarial classical spoofer. In this paper, we demonstrate that the nonlinear cross-entropy provides a sample-efficient benchmark for shallow-depth all-to-all random quantum circuits whose score cleanly separates noisy quantum computers from state-of-the-art classical spoofers, even in the presence of depolarizing noise. Further, we develop a binary classifier based on the notion of heavy output generation that features logarithmic sample complexity at short depth. Our evidence comes from exact analytic expressions for all-to-all Brownian circuit ensembles derived using replica tricks, and numerical simulations that corroborate these results for discrete Haar-random unitary circuits.
Demonstrations of quantum computational advantage and benchmarks of quantum processors via quantum random circuit sampling are based on evaluating the linear cross-entropy benchmark (XEB). A key question in the theory of XEB is whether it approximates the fidelity of the quantum state preparation. Previous works have shown that the XEB generically approximates the fidelity in a regime where the noise rate per qudit ε satisfies εN≪1 for a system of N qudits and that this approximation breaks down at large noise rates. Here, we show that the breakdown of XEB as a fidelity proxy occurs as a sharp phase transition at a critical value of εN that depends on the circuit architecture and properties of the two-qubit gates, including in particular their entangling power. We study the phase transition using a mapping of average two-copy quantities to statistical mechanics models in random quantum circuit architectures with full or one-dimensional connectivity. We explain the phase transition behavior in terms of spectral properties of the transfer matrix of the statistical mechanics model and identify two-qubit gate sets that exhibit the largest noise robustness.
Demonstrating quantum advantage requires experimental implementation of a computational task that is hard to achieve using state-of-the-art classical systems. One approach is to perform sampling from a probability distribution associated with a certain class of highly entangled many-body wave functions. It has been suggested that such a quantum advantage can be certified with the (XEB). We critically examine this notion. First, we consider a “benign” setting, where an honest implementation of a noisy quantum circuit is assumed, and characterize the conditions under which the XEB approximates the of quantum dynamics. Second, we assume an “adversarial” setting, where all possible classical algorithms are considered for comparisons, and show that achieving relatively high XEB values does not imply faithful simulation of quantum dynamics. Specifically, we present an efficient classical algorithm that achieves high XEB values, namely 5–12% of those obtained in the state-of-the-art experiments, within just a few seconds using a single GPU machine. This is made possible by identifying and exploiting several vulnerabilities of the XEB, which allows us to achieve high XEB values without simulating a full quantum circuit. Remarkably, our algorithm features with the system size than a noisy quantum device for commonly studied random circuit ensembles in various architecture. We quantitatively explain the success of our algorithm and the limitations of the XEB by using a theoretical framework, in which the dynamics of the average XEB and fidelity are mapped to classical statistical mechanics models. Using this framework, we illustrate the relation between the XEB and the fidelity for quantum circuits in various architectures, with different choices of gate sets, and in the presence of noise. Taken together, our results demonstrate that XEB’s utility as a proxy for fidelity hinges on several conditions, which should be independently checked in the benign setting, but cannot be assumed in the general adversarial setting. Therefore, the XEB on its own has a limited utility as a benchmark for quantum advantage. We briefly discuss potential ways to overcome these limitations. Published by the American Physical Society 2024
The linear cross-entropy benchmark (Linear XEB) has been used as a test for procedures simulating quantum circuits. Given a quantum circuit C with n inputs and outputs and purported simulator whose output is distributed according to a distribution p over {0,1}ⁿ, the linear XEB fidelity of the simulator is ℱ_C(p) = 2ⁿ 𝔼_{x ∼ p} q_C(x) -1, where q_C(x) is the probability that x is output from the distribution C |0ⁿ⟩. A trivial simulator (e.g., the uniform distribution) satisfies ℱ_C(p) = 0, while Google’s noisy quantum simulation of a 53-qubit circuit C achieved a fidelity value of (2.24 ±0.21)×10^{-3} (Arute et. al., Nature'19). In this work we give a classical randomized algorithm that for a given circuit C of depth d with Haar random 2-qubit gates achieves in expectation a fidelity value of Ω(n/L⋅15^{-d}) in running time poly(n,2^L). Here L is the size of the light cone of C: the maximum number of input bits that each output bit depends on. In particular, we obtain a polynomial-time algorithm that achieves large fidelity of ω(1) for depth O(√{log n}) two-dimensional circuits. This is the first such result for two dimensional circuits of super-constant depth. Our results can be considered as an evidence that fooling the linear XEB test might be easier than achieving a full simulation of the quantum circuit.
With the advent of quantum processors exceeding 100 qubits and the high engineering complexities involved, there is a need for holistically benchmarking the processor to have quality assurance. Linear cross-entropy benchmarking (XEB) has been used extensively for systems with 50 or more qubits but is fundamentally limited in scale due to the exponentially large computational resources required for classical simulation. In this work we propose conducting linear XEB with random Clifford circuits of constant to logarithmic depth, a scheme we call Clifford XEB. Since Clifford circuits can be simulated in polynomial time, Clifford XEB can be scaled to much larger systems. To validate this claim, we run numerical simulations for the classes of Clifford circuits we propose with noise and observe exponential decays. When noise levels are low, the decay rates are well correlated with the noise of each cycle assuming a multiplicative error accumulation, i.e., where the fidelities of individual gates multiply. We perform simulations of systems up to 1225 qubits, where the classical processing task can be easily dealt with by a workstation. Furthermore, using the theoretical guarantees in Chen et al. [PRX Quantum 3, 030320 (2022)], we prove that Clifford XEB with our proposed Clifford circuits must yield exponential decays under a general error model for sufficiently low errors. Our theoretical results explain some of the phenomena observed in the simulations and shed light on the behavior of general linear XEB experiments.
Cross-entropy benchmarking (XEB) with single-qubit reference sequences is widely used to characterize multi-qubit gates in large-scale quantum processors, despite the lack of a rigorous theoretical justification. Here we show that the commonly employed additive single-qubit errors approximation underlying this approach breaks down and leads to a systematic overestimation of gate fidelities. We derive an analytical expression for the joint decay of simultaneous single-qubit reference sequences, identify when interleaved circuits generate sufficient randomization for the standard depolarizing approximation, and obtain a refined expression for the interleaved gate fidelity estimation. Experiments on a superconducting quantum processor validate the theory and demonstrate that fidelities obtained using XEB with single-qubit references agree with those extracted from standard interleaved randomized benchmarking (IRB), while achieving higher precision due to reduced reference-sequence errors. Our results establish theoretical foundation for interleaved benchmarking protocols employing single-qubit reference sequences and show that, with appropriate post-processing, they provide a simple and accurate alternative to multi-qubit Clifford reference circuits.