Random circuit sampling (RCS) remains one of the most competitive frameworks for demonstrating quantum advantage in near-term noisy intermediate-scale quantum (NISQ) hardware. Unfortunately, absent error-correction, existing benchmarks to characterize these experiments, like linear cross-entropy, have been classically spoofed due to noise. Because of this, there are interesting regimes, like shallow-depth random quantum circuits, where sampling is plausibly classically intractable, but no existing benchmark can distinguish between a noisy quantum computer and an adversarial classical spoofer. In this paper, we demonstrate that the nonlinear cross-entropy provides a sample-efficient benchmark for shallow-depth all-to-all random quantum circuits whose score cleanly separates noisy quantum computers from state-of-the-art classical spoofers, even in the presence of depolarizing noise. Further, we develop a binary classifier based on the notion of heavy output generation that features logarithmic sample complexity at short depth. Our evidence comes from exact analytic expressions for all-to-all Brownian circuit ensembles derived using replica tricks, and numerical simulations that corroborate these results for discrete Haar-random unitary circuits.
Random circuit sampling (RCS) remains one of the most competitive frameworks for demonstrating quantum advantage in near-term noisy intermediate-scale quantum (NISQ) hardware. Unfortunately, absent error-correction, existing benchmarks to characterize these experiments, like linear cross-entropy, have been classically spoofed due to noise. Because of this, there are interesting regimes, like shallow-depth random quantum circuits, where sampling is plausibly classically intractable, but no existing benchmark can distinguish between a noisy quantum computer and an adversarial classical spoofer. In this paper, we demonstrate that the nonlinear cross-entropy provides a sample-efficient benchmark for shallow-depth all-to-all random quantum circuits whose score cleanly separates noisy quantum computers from state-of-the-art classical spoofers, even in the presence of depolarizing noise. Further, we develop a binary classifier based on the notion of heavy output generation that features logarithmic sample complexity at short depth. Our evidence comes from exact analytic expressions for all-to-all Brownian circuit ensembles derived using replica tricks, and numerical simulations that corroborate these results for discrete Haar-random unitary circuits.
While many statistical properties of deep random quantum circuits can be deduced, often rigorously and other times heuristically, by an approximation to global Haar-random unitaries, the statistics of constant-depth random quantum circuits are generally less well-understood due to a lack of amenable tools and techniques. We circumvent this barrier by considering a related constant-time Brownian circuit model which shares many similarities with constant-depth random quantum circuits but crucially allows for direct calculations of higher order moments of its output distribution. Using mean-field (large-n) techniques, we fully characterize the output distributions of Brownian circuits at shallow depths and show that they follow a Porter-Thomas distribution, just like in the case of deep circuits, but with a truncated Hilbert space. The access to higher order moments allows for studying the expected and typical Linear Cross-entropy (XEB) benchmark scores achieved by an ideal quantum computer versus the state-of-the-art classical spoofers for shallow Brownian circuits. We discover that for these circuits, while the quantum computer typically scores within a constant factor of the expected value, the classical spoofer suffers from an exponentially larger variance. Numerical evidence suggests that the same phenomenon also occurs in constant-depth discrete random quantum circuits, like those defined over the all-to-all architecture. We conjecture that the same phenomenon is also true for random brickwork circuits in high enough spatial dimension.
Cross-entropy (XE) measure is a widely used benchmark to demonstrate quantum computational advantage from sampling problems, such as random circuit sampling using superconducting qubits and boson sampling (BS). We present a heuristic classical algorithm that attains a better XE than the current BS experiments in a verifiable regime and is likely to attain a better XE score than the near-future BS experiments in a reasonable running time. The key idea behind the algorithm is that there exist distributions that correlate with the ideal BS probability distribution and that can be efficiently computed. The correlation and the computability of the distribution enable us to postselect heavy outcomes of the ideal probability distribution without computing the ideal probability, which essentially leads to a large XE. Our method scores a better XE than the recent Gaussian BS experiments when implemented at intermediate, verifiable system sizes. Much like current state-of-the-art experiments, we cannot verify that our spoofer works for quantum-advantage-size systems. However, we demonstrate that our approach works for much larger system sizes in fermion sampling, where we can efficiently compute output probabilities. Finally, we provide analytic evidence that the classical algorithm is likely to spoof noisy BS efficiently.
The linear cross-entropy benchmark (Linear XEB) has been used as a test for procedures simulating quantum circuits. Given a quantum circuit C with n inputs and outputs and purported simulator whose output is distributed according to a distribution p over {0,1}ⁿ, the linear XEB fidelity of the simulator is ℱ_C(p) = 2ⁿ 𝔼_{x ∼ p} q_C(x) -1, where q_C(x) is the probability that x is output from the distribution C |0ⁿ⟩. A trivial simulator (e.g., the uniform distribution) satisfies ℱ_C(p) = 0, while Google’s noisy quantum simulation of a 53-qubit circuit C achieved a fidelity value of (2.24 ±0.21)×10^{-3} (Arute et. al., Nature'19). In this work we give a classical randomized algorithm that for a given circuit C of depth d with Haar random 2-qubit gates achieves in expectation a fidelity value of Ω(n/L⋅15^{-d}) in running time poly(n,2^L). Here L is the size of the light cone of C: the maximum number of input bits that each output bit depends on. In particular, we obtain a polynomial-time algorithm that achieves large fidelity of ω(1) for depth O(√{log n}) two-dimensional circuits. This is the first such result for two dimensional circuits of super-constant depth. Our results can be considered as an evidence that fooling the linear XEB test might be easier than achieving a full simulation of the quantum circuit.
Cross-entropy benchmarking is a central technique adopted to certify a quantum chip in recent investigations. To better understand its mathematical foundation and develop new benchmarking schemes, the concept of ergodicity was introduced to random circuit sampling and it was found that the Haar random quantum circuit could satisfy an ergodicity condition—the average of certain types of postprocessing function over the output bit strings is close to the average over the unitary ensemble. For noiseless random circuits, it was proven that the ergodicity holds for polynomials of degree t with positive coefficients when the random circuits form a unitary 2 t -design. For strong enough noise, the ergodicity condition is violated, which suggests that ergodicity is a property that can be exploited to certify a quantum chip. The deviation of ergodicity was formulated as a measure for quantum chip benchmarking, and it was demonstrated that it can be used to estimate the circuit fidelity for global depolarizing noise and weakly correlated noise. For a quadratic postprocessing function, our framework recovered Google's result on estimating the circuit fidelity via linear cross-entropy benchmarking (XEB), and we gave a sufficient condition on the noise model characterizing when such estimation is valid. The results establish an interesting connection between ergodicity and noise in random circuits and provide new insights into designing quantum benchmarking schemes.
Random circuit sampling (RCS) is a leading candidate for demonstrating quantum advantage, supported by strong complexity-theoretic evidence of hardness in the ideal setting and by rapid experimental progress to date. In practice, however, noise is unavoidable, and a central problem is to identify the noise-strength boundary between classically simulable and classically hard regimes. In this work, we establish an architecture-general hardness bound for this boundary for the standard local depolarizing noise of strength γ. Assuming the standard average-case #P-hardness conjecture for ideal RCS, we show that, for any circuit architecture satisfying this conjecture, noisy RCS on the same architecture remains hard to simulate classically within any inverse-polynomial total variation distance whenever γ=O(logn/(nd)) for n-qubit circuits of depth d, unless the polynomial hierarchy collapses. Crucially, noisy-RCS hardness follows without any additional conjectural or architecture-specific assumption beyond those already entering the ideal-RCS hardness framework. Our proof combines a low-degree polynomial extrapolation with a monotonicity reduction showing that efficient classical simulation at one depolarizing noise strength implies efficient simulation at every larger strength. Together, these ingredients transfer the standard ideal-RCS hardness conjecture to sampling hardness at a prespecified noise strength. Finally, combining the convergence-to-uniformity result of Dalzell et al. [Commun. Math. Phys. 405, 78 (2024)] with our monotonicity reduction yields efficient classical simulation for γ=ω(logn/(nd)) on layered, regularly connected architectures. Thus, wherever the two architectural settings overlap, this identifies γ=Θ(logn/(nd)) as the asymptotic complexity-transition scale.
We consider quantum circuits consisting of d layers of nearest-neighbor two-qubit gates acting on n qubits arranged on a line, where every qubit is independently depolarized with a constant probability before each layer. We describe a randomized parallel algorithm which samples from the output distribution of any such circuit to within total variation error δ, with parallel runtime 2O(d)loglog(n/δ) and n2O(d) elementary real-arithmetic operations. Without noise, the same approach gives an exact sampler with parallel runtime O(logn). For constant depth, we further show that the input/output behavior of the noisy quantum circuit is reproduced up to a constant error by a randomized AC0-circuit, that is, a Boolean circuit of polynomial size and constant depth with unbounded fan-in AND and OR gates and NOT gates. Consequently, every relation problem solved by a noisy constant-depth quantum circuit in one dimension is also solved, with essentially the same success probability, by a randomized AC0-circuit. This rules out, for noisy circuits in one dimension, the unconditional quantum advantage established for noisy shallow circuits in two and three dimensions, where polynomial-size classical circuits over the same gate set require depth Ω(logn/loglogn). Our algorithm exploits the fact that depolarizing noise cuts a one-dimensional circuit into independent pieces of logarithmic width, each of which can be sampled exactly in parallel.