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arXiv:2203.17244

Strategies for reducing frequency scatter in large arrays of superconducting resonators

J. Li, Peter S. Barry, Zhaodi Pan, Chris Albert, T. Cecil, C. L. Chang, K. R. Dibert, M. Lisovenko, Volodymyr G. Yefremenko

Published Mar 22, 2022• 0 citations
arXivHTMLPDF

Abstract

Superconducting resonators are now found in a broad range of applications that require high-fidelity measurement of low-energy signals. A common feature across almost all of these applications is the need for increased numbers of resonators to further improve sensitivity, and the ability to read out large numbers of resonators without the need for additional cryogenic complexity is a primary motivation. One of the major limitations of current resonator arrays is the observed scatter in the resonator frequencies when compared to the initial design. Here we present recent progress toward identifying one of the dominant underlying causes of resonator scatter, inductor line width fluctuation. We designed and fabricated an array of lumped-element resonators with inductor line width changing from 1.8um to 2.2um in step of 0.1um defined with electron-beam lithography to probe and quantify the systematic variation of resonance frequency across a 6-inch wafer. The resonators showed a linear frequency shift of 20MHz (140FWHM) and 30MHz (214FWHM), respectively, as they are connected to two different capacitors. This linear relationship matches our theoretical prediction. The widely used MLA photon lithography facility for MKID fabrication has a resolution on the order of 600nm, which could cause frequency fluctuation on the order of 100MHz or 710FWHM.

DOI
10.48550/arxiv.2203.17244

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Superconducting resonators are now found in a broad range of applications that require high-fidelity measurement of low-energy signals. A common feature across almost all of these applications is the need for increased numbers of resonators to further improve sensitivity, and the ability to read out large numbers of resonators without the need for additional cryogenic complexity is a primary motivation. One of the major limitations of current resonator arrays is the observed scatter in the resonator frequencies when compared to the initial design. Here we present recent progress toward identifying one of the dominant underlying causes of resonator scatter, inductor line width fluctuation. We designed and fabricated an array of lumped-element resonators with inductor line width changing from 1.8um to 2.2um in step of 0.1um defined with electron-beam lithography to probe and quantify the systematic variation of resonance frequency across a 6-inch wafer. The resonators showed a linear frequency shift of 20MHz (140FWHM) and 30MHz (214FWHM), respectively, as they are connected to two different capacitors. This linear relationship matches our theoretical prediction. The widely used MLA photon lithography facility for MKID fabrication has a resolution on the order of 600nm, which could cause frequency fluctuation on the order of 100MHz or 710FWHM.
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We present an interdigitated capacitor trimming technique for fine-tuning the resonance frequency of superconducting microresonators and increasing the multiplexing factor. We first measure the optical response of the array with a beam mapping system to link all resonances to their physical resonators. Then, a new set of resonance frequencies with uniform spacing and higher multiplexing factor is designed. We use simulations to deduce the lengths that we should trim from the capacitor fingers in order to shift the resonances to the desired frequencies. The sample is then modified using contact lithography and re-measured using the same setup. We demonstrate this technique on a 112-pixel aluminum lumped-element kinetic-inductance detector array. Before trimming, the resonance frequency deviation of this array is investigated. The variation of the inductor width plays the main role for the deviation. After trimming, the mean fractional frequency error for identified resonators is −6.4 × 10−4, with a standard deviation of 1.8 × 10−4. The final optical yield is increased from 70.5% to 96.7% with no observable crosstalk beyond −15 dB during mapping. This technique could be applied to other photon-sensitive superconducting microresonator arrays for increasing the yield and multiplexing factor.
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