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arXiv:2202.13644

Ten more times precision improved method for surface roughness estimation with weak measurement

Hui-Chao Qu, Xiao Ya, Zhao-Qi-Zhi Han, Shanchuan Dong, Yongjian Gu

Published Feb 28, 2022• 0 citations
arXivHTMLPDF

Abstract

High-precision surface roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and only can achieve the precision of 0.1 nm with white light interferometer. Here, we propose two weak measurement schemes to estimate surface roughness through spectrum analysis and intensity analysis. The estimating precision with spectrum analysis is about $10 ^{-5}$ nm by using a currently available spectrometer with the resolution of $Δλ= 0.04$ pm and the corresponding sensitivity is better than 0.1 THz/nm. And the precision and sensitivity of the light intensity analysis scheme achieve as high as 0.07 nm and 1/nm, respectively. By introducing a modulated phase, we show that the sensitivity and precision achieved in our schemes can be effectively retained in a wider dynamic range. We further provide the experimental design of the surface profiler based on our schemes. It simultaneously meets the requirements of high precision, high sensitivity, and wide measurement range, making it to be a promising practical tool.

DOI
10.48550/arxiv.2202.13644

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High-precision surface roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and only can achieve the precision of 0.1 nm with white light interferometer. Here, we propose two weak measurement schemes to estimate surface roughness through spectrum analysis and intensity analysis. The estimating precision with spectrum analysis is about 10−510 ^{-5}10−5 nm by using a currently available spectrometer with the resolution of Δλ=0.04Δλ= 0.04Δλ=0.04 pm and the corresponding sensitivity is better than 0.1 THz/nm. And the precision and sensitivity of the light intensity analysis scheme achieve as high as 0.07 nm and 1/nm, respectively. By introducing a modulated phase, we show that the sensitivity and precision achieved in our schemes can be effectively retained in a wider dynamic range. We further provide the experimental design of the surface profiler based on our schemes. It simultaneously meets the requirements of high precision, high sensitivity, and wide measurement range, making it to be a promising practical tool.
High-precision surface-roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and can only achieve a precision of 0.1 nm with a white-light interferometer. Here, we propose two weak-measurement schemes to estimate surface roughness through a spectrum analysis and intensity analysis. The estimating precision with the spectrum analysis is about ${10}^{\ensuremath{-}5}$ nm by using a currently available spectrometer with a resolution of $\mathrm{\ensuremath{\Delta}}\ensuremath{\lambda}=0.04$ pm and the corresponding sensitivity is better than 0.1 THz/nm. The precision and sensitivity of the light intensity analysis scheme achieved is as high as 0.07 nm and 1/nm, respectively. By introducing a modulated phase, we show that the sensitivity and precision achieved in our schemes can be effectively retained in a wider dynamic range. We further provide the experimental design of a surface profiler based on our schemes. It simultaneously meets the requirements of high precision, high sensitivity, and a wide measurement range, making it a promising practical tool.
We propose a scheme called difference weak measurement, and we illustrate its advantages for measuring a small longitude phase shift in high precision. Compared to the standard interferometry and standard weak measurement schemes, the proposed scheme has a much higher resolution in the presence of various practical imperfections, such as alignment error and light intensity variation error. Moreover, we highlight the advantage of utilizing a complex weak value, where its imaginary part can reduce the harmful effect induced by channel decoherence. Finally, we propose a closed-loop scenario to solve the narrow dynamic range problem that exists in the current weak measurement schemes. The difference weak measurement scheme simultaneously fulfills the requirements of high precision, wide dynamic range, and strong robustness, which makes it a powerfully practical tool for phase-shift measurement and other metrological tasks.
Abstract High-precision temperature measurement with adjustable operating range is investigated and experimentally demonstrated based on weak measurement in the frequency domain. The operating range of measurement is precisely modulated by introducing a dynamic extra time delay to the post-selection pumped by a femtosecond laser. By choosing appropriate nonlinear materials and the attenuation, the resolution of the optimized extra time delay can be improved by two orders of magnitude over that of a traditional phase delay compensator. Considering the influence of noise in the experiment, the highest precision of 8.03 × 10 −7 °C can be achieved by using a currently available spectrometer. Moreover, the average sensitivity can reach to 38 nm/°C. Taking advantage of the high precision and adjustable operating range, the proposed method has great potential applications in high-precision temperature measurements.
Weak measurement enables the amplification of weak physical effects via post-selection and has become an important tool in precision optical metrology; however, conventional schemes based on mean-pointer shifts suffer from response saturation, limited linear range, and stringent stability requirements. Here, we propose and experimentally demonstrate a weak-measurement scheme based on spectral-interference trough shifts, where the zero-intensity points of the post-selected spectrum act as the measurement pointer, establishing an analytical mapping between the trough displacement and the target phase or time delay. Theoretical analysis shows that, under detector resolution limits, the measurement resolution depends solely on the frequency of extinction point and is independent of weak-value singular amplification or bias-phase modulation, thereby maintaining high sensitivity while avoiding pointer saturation. Experiments demonstrate that the trough-shift scheme achieves significantly better agreement between measured and theoretical sensitivities than biased weak measurement and provides a stable linear response without additional bias-compensation structures, reaching a minimum resolvable phase variation at the 10−7 level. Moreover, the approach intrinsically supports multi-period traceable measurements and exhibits strong robustness against intensity fluctuations and spectral distortions, offering a promising route toward high-sensitivity, large-dynamic-range, and stable weak measurement-based optical sensing.
We theoretically propose and experimentally demonstrate a modulated weak measurement scheme that permits a precise estimation of the extended phase shift. By choosing the frequency and the total post-selected light intensity as the input and output meter variables, respectively, a linear weak measurement model is established that is especially applicable to precise phase estimation. By performing a time-delay-dependent modulation strategy based on the feedback modulation of the experimental outcome, both the high phase-sensitivity and measurement precision can be retained. We have achieved a precision at the order of ∼10−5 rad that can be effectively retained with an increase in the measured phase.
Spectral analysis technology in optical signal detection can obtain the spectral characteristics of matter according to the wavelength or frequency information of the optical signal. Commonly used spectral analysis techniques include grating spectrometer, Fourier transform infrared spectrometer (FTIR), Raman spectrometer, etc. In order to improve the measurement of optical signal, due to the limitation of detector detection bandwidth and system noise and external interference, this paper proposes an optical signal estimation scheme based on weak measurement method. Moreover, compared with the original weak measurement scheme, the detection time of the new scheme proposed in this paper breaks through the limitation of Nyquist sampling theorem, has the performance advantage of resisting aliasing interference, and can effectively improve the signal-to-noise ratio of the system by extending the detection time. This paper presents a new weak measurement theory scheme for optical signals. Theoretical research studies show that the scheme can estimate the amplitude and phase of the optical signal and recover the time domain by setting the dynamic phase factor with time for the previous or post-selection process. Because the detection time of the scheme is not limited by the Nyquist sampling theorem, the new scheme has the performance advantage of anti-aliasing interference, which effectively solves the limitation of the detector detection bandwidth in the original scheme.