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arXiv:1911.11456

Planar GHz Resonators on SrTiO3: Suppressed Losses at Temperatures below 1 K

Vincent T. Engl, Nikolaj G. Ebensperger, Wendel, Lars, Marc Scheffler

Published Nov 26, 2019• 1 citation
arXivHTMLPDF

Abstract

The complex dielectric constant $\hatε = ε_1 + i ε_2$ of SrTiO$_3$ reaches high values $ε_1 \approx 2*10^{4}$ at cryogenic temperatures, while the dielectric losses ($ε_2$) are much stronger than for other crystalline dielectrics. SrTiO$_3$ is a common substrate for oxide thin films, like the superconducting LaAlO$_3$/SrTiO$_3$ system, but the large $ε_1$ and $ε_2$ restrict high-frequency quantum devices on SrTiO$_3$. Here we present superconducting coplanar Nb resonators on SrTiO$_3$, which we successfully operate in a distant-flip-chip geometry at frequencies that exceed 1 GHz. We find a pronounced and unexpected increase in resonator quality factor $Q$ at temperatures below 1 K, reaching up to $Q \approx 800$. We attribute this to substantial changes of the dielectric losses in SrTiO$_3$ at mK temperatures, and we also detect non-monotonous changes in the temperature-dependent $ε_1$. These findings challenge our present understanding of the dielectric properties of SrTiO$_3$ and at the same time demonstrate that cryogenic high-frequency devices on SrTiO$_3$ are more feasible than previously assumed.

DOI
10.48550/arxiv.1911.11456

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The performance of superconducting microwave circuits is strongly influenced by the material properties of the superconducting film and substrate. While progress has been made in understanding the importance of surface preparation and the effect of surface oxides, the complex effect of superconductor film structure on microwave losses is not yet fully understood. In this study, we investigate the microwave properties of niobium resonators with different crystalline properties and related surface topographies. We analyze a series of magnetron sputtered films in which the Nb crystal orientation and surface topography are changed by varying the substrate temperatures between room temperature and 975K. The lowest-loss resonators that we measure have quality factors of over 106 at single-photon powers, among the best ever recorded using the Nb on sapphire platform. We observe the highest quality factors in films grown at an intermediate temperature regime of the growth series (550K) where the films display both preferential ordering of the crystal domains and low surface roughness. Furthermore, we analyze the temperature-dependent behavior of our resonators to learn about how the quasiparticle density in the Nb film is affected by the niobium crystal structure and the presence of grain boundaries. Our results stress the connection between the crystal structure of superconducting films and the loss mechanisms suffered by the resonators and indicate that even a moderate change in temperature during thin film deposition can significantly affect the resulting quality factors.
The loss in superconducting microwave resonators at low-photon numbers and low temperatures is not well understood but has implications for achievable coherence times in superconducting qubits. We have fabricated single-layer resonators with a high quality factor by patterning a superconducting aluminum film on a sapphire substrate. Four resonator geometries were studied with resonant frequencies ranging from 5 to 7 GHz: a quasi-lumped element resonator, a coplanar strip waveguide resonator, and two hybrid designs that contain both a coplanar strip and a quasi-lumped element. Transmitted power measurements were taken at 30 mK as a function of frequency and probe power. We find that the resonator loss, expressed as the inverse of the internal quality factor, decreases slowly over four decades of photon number in a manner not merely explained by loss from a conventional uniform spatial distribution of two-level systems in an oxide layer on the superconducting surfaces of the resonator.
Abstract The performance of superconducting microwave circuits is strongly influenced by the material properties of the superconducting film and substrate. While progress has been made in understanding the importance of surface preparation and the effect of surface oxides, the complex effect of superconductor film structure on microwave losses is not yet fully understood. In this study, we investigate the microwave properties of niobium resonators with different crystalline properties and related surface topographies. We analyze a series of magnetron sputtered films in which the Nb crystal orientation and surface topography are changed by varying the substrate temperatures between room temperature and 975 K. The lowest-loss resonators that we measure have quality factors of over 10 6 at single-photon powers, among the best ever recorded using the Nb on sapphire platform. We observe the highest quality factors in films grown at an intermediate temperature regime of the growth series (550 K) where the films display both preferential ordering of the crystal domains and low surface roughness. Furthermore, we analyze the temperature-dependent behavior of our resonators to learn about how the quasiparticle density in the Nb film is affected by the niobium crystal structure and the presence of grain boundaries. Our results stress the connection between the crystal structure of superconducting films and the loss mechanisms suffered by the resonators and indicate that even a moderate change in temperature during thin film deposition can significantly affect the resulting quality factors.
Flexible interconnects with superconducting (SC) traces and polyimide dielectric can provide low signal loss and low thermal conductivity at cryogenic temperatures, and are expected to find use in densely integrated cryogenic electronics systems. The ultra-low loss of SC interconnects at microwave frequencies can be accurately characterized through the use of weakly coupled SC resonators. The high-quality factor resonators provide sensitive measurements of the aggregate loss properties of the conductor and dielectric, as functions of frequency, temperature, and signal power. In this work, resonators with different linewidths were fabricated and tested to study how the linewidth impacts the overall internal resonator loss, in order to better characterize and separate the individual loss components (i.e., dielectric loss vs. conductor loss). The results of this work are important for understanding loss and transmission properties of similarly designed and fabricated transmission line interconnects.