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IEEE Transactions on Applied Superconductivity

Distinguishing Dielectric Loss From Superconductor Loss Using Flexible Thin-Film Superconducting Resonator Structures

Vaibhav Gupta, Bhargav Yelamanchili, Simin Zou, Tamara Isaacs‐Smith, John A. Sellers, David B. Tuckerman, Michael C. Hamilton

Published Mar 18, 2019• 5 citations
Publisher

Abstract

Flexible interconnects with superconducting (SC) traces and polyimide dielectric can provide low signal loss and low thermal conductivity at cryogenic temperatures, and are expected to find use in densely integrated cryogenic electronics systems. The ultra-low loss of SC interconnects at microwave frequencies can be accurately characterized through the use of weakly coupled SC resonators. The high-quality factor resonators provide sensitive measurements of the aggregate loss properties of the conductor and dielectric, as functions of frequency, temperature, and signal power. In this work, resonators with different linewidths were fabricated and tested to study how the linewidth impacts the overall internal resonator loss, in order to better characterize and separate the individual loss components (i.e., dielectric loss vs. conductor loss). The results of this work are important for understanding loss and transmission properties of similarly designed and fabricated transmission line interconnects.

DOI
10.1109/tasc.2019.2902756

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Flexible interconnects with superconducting (SC) traces and polyimide dielectric can provide low signal loss and low thermal conductivity at cryogenic temperatures, and are expected to find use in densely integrated cryogenic electronics systems. The ultra-low loss of SC interconnects at microwave frequencies can be accurately characterized through the use of weakly coupled SC resonators. The high-quality factor resonators provide sensitive measurements of the aggregate loss properties of the conductor and dielectric, as functions of frequency, temperature, and signal power. In this work, resonators with different linewidths were fabricated and tested to study how the linewidth impacts the overall internal resonator loss, in order to better characterize and separate the individual loss components (i.e., dielectric loss vs. conductor loss). The results of this work are important for understanding loss and transmission properties of similarly designed and fabricated transmission line interconnects.
In this work, we investigated how different under- and capping layers on patterned Nb films impacted the RF losses of flexible thin-film superconducting microstrip transmission line resonators measured in a frequency range from 2 to 20 GHz. We studied how different thicknesses of Ti(10 and 50 nm) under-layer, used for adhesion, impacts conductor losses. We also studied Cu(20, 50, 100, and 200 nm) capping layers and how they affect conductor loss. These studies were carried out on 20-μm-thick spin-on polyimide (PI-2611) thin films and characterized at various cryogenic temperatures between 1.2 and 4.2 K. The results indicate normal-superconductor (Ti/Nb) and superconductor-normal (Nb/Cu) bilayer structures have increased surface resistance, which leads to an increase in microwave loss when compared to Nb-only signal traces. We quantified this additional loss by extracting resonator quality factors for weakly coupled resonators with various conductor stack-ups. Our experimental results can help inform decisions regarding material stack-ups when designing multiconductor multilayer superconducting flexible cables intended for use with ultralow-temperature electronic systems.
We present the design, fabrication procedure, and measurement results of Nb superconducting microstrip transmission line resonators fabricated using thin-film polyimide HD-4110, including both nonembedded and embedded versions. These resonators were used to characterize the microwave dielectric loss tangent of 20 μm thick polyimide HD-4110 at deep cryogenic temperatures. We observed high-quality factors (Q) up to 21 040 at 1.2 K in the frequency range of 2-21 GHz for nonembedded resonators, indicating that the dielectric loss tangent can be less than 5×10-5. Embedded resonators with an additional 20 μm thick encapsulation layer also exhibited Q values as high as ~19 200. Dielectric and conductor (quasiparticle) loss have been compared between the two types of resonators. This study provides information applicable to the design of future high-density, flexible, multilayer superconducting cables, which are of great interest for potential applications in cryogenic electronics systems, including quantum computers.
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Superconducting microwave resonators are of interest for a wide range of applications, including for their use as microwave kinetic inductance detectors (MKIDs) for the detection of faint astrophysical signatures, as well as for quantum computing applications and materials characterization. In this paper, procedures are presented for the fabrication and characterization of thin-film superconducting microwave resonators. The fabrication methodology allows for the realization of superconducting transmission-line resonators with features on both sides of an atomically smooth single-crystal silicon dielectric. This work describes the procedure for the installation of resonator devices into a cryogenic microwave testbed and for cool-down below the superconducting transition temperature. The set-up of the cryogenic microwave testbed allows one to do careful measurements of the complex microwave transmission of these resonator devices, enabling the extraction of the properties of the superconducting lines and dielectric substrate (e.g., internal quality factors, loss and kinetic inductance fractions), which are important for device design and performance.
Abstract We describe a superconducting (SC) cable-to-cable connection method for thin-film flexible (Nb/polyimide) parallel transmission line cables that exhibits low loss from DC to microwave frequencies. Design, fabrication procedures, assembly methods and characterization results are reported. The connector assembly incorporates a monolithic array of short superconductive bridging traces that function as a ganged electrical splice between two ribbon cables. The assembly is micro-mechanically self-aligned and uses pressure to make simultaneous electrical contacts between multiple 50 μ m wide microstrip signal traces, as well as between ground planes. Each contacting surface comprises thin SC Nb overcoated with ultra-thin Au, providing nearly zero DC resistance and very good RF performance. A simulation model of the microwave performance of microstrip-to-microstrip interconnections at 4.2 K was successfully matched to measurement results. This new cable-to-cable connection approach exhibited an insertion loss <0.12 dB and a return loss >15 dB up to 14 GHz. The connections performed reproducibly throughout multiple thermal cycles and multiple disassembly/reassembly cycles.
Superconducting microwave resonators are of interest for a wide range of applications, including for their use as microwave kinetic inductance detectors (MKIDs) for the detection of faint astrophysical signatures, as well as for quantum computing applications and materials characterization. In this paper, procedures are presented for the fabrication and characterization of thin-film superconducting microwave resonators. The fabrication methodology allows for the realization of superconducting transmission-line resonators with features on both sides of an atomically smooth single-crystal silicon dielectric. This work describes the procedure for the installation of resonator devices into a cryogenic microwave testbed and for cool-down below the superconducting transition temperature. The set-up of the cryogenic microwave testbed allows one to do careful measurements of the complex microwave transmission of these resonator devices, enabling the extraction of the properties of the superconducting lines and dielectric substrate (e.g., internal quality factors, loss and kinetic inductance fractions), which are important for device design and performance.