arXiv:1811.04002 · Physical Review X
Benchmarking Gate Fidelities in a Si / SiGe Two-Qubit Device
Xiao Xue, Thomas F. Watson, Jonas Helsen, Daniel R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith, M. A. Eriksson, Stephanie Wehner, Lieven M. K. Vandersypen