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arXiv:1805.09491 · Journal of Applied Physics

Method for determination of technical noise contributions to ion motional heating

Jonathon A. Sedlacek, Jules Stuart, William Loh, Robert McConnell, Colin Bruzewicz, Jeremy Sage, John Chiaverini

Published Dec 6, 2018• 18 citations
arXivHTMLPDF

Abstract

Microfabricated Paul ion traps show tremendous promise for large-scale quantum information processing. However, motional heating of ions can have a detrimental effect on the fidelity of quantum logic operations in miniaturized, scalable designs. In many experiments, motional heating rates are ascribed solely to anomalous heating, which arises at least in part from electric field noise from the trap surface not attributable to any known mechanisms. Contributions to measured ion heating rates due to technical voltage noise present on the static (DC) and radio frequency (RF) electrodes—i.e., due to voltage sources, amplifiers, and other electrical components—can often be overlooked. We present a reliable method for determining the extent to which motional heating is dominated by technical voltage noise on the DC or RF electrodes. Also, we demonstrate that stray DC electric fields can shift the ion position such that technical noise on the RF electrode can significantly contribute to the motional heating rate. After minimizing the pseudopotential gradient experienced by the ion induced by stray DC electric fields, the motional heating due to RF technical noise can be significantly reduced.

DOI
10.1063/1.5045326

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Microfabricated Paul ion traps show tremendous promise for large-scale quantum information processing. However, motional heating of ions can have a detrimental effect on the fidelity of quantum logic operations in miniaturized, scalable designs. In many experiments, motional heating rates are ascribed solely to anomalous heating, which arises at least in part from electric field noise from the trap surface not attributable to any known mechanisms. Contributions to measured ion heating rates due to technical voltage noise present on the static (DC) and radio frequency (RF) electrodes—i.e., due to voltage sources, amplifiers, and other electrical components—can often be overlooked. We present a reliable method for determining the extent to which motional heating is dominated by technical voltage noise on the DC or RF electrodes. Also, we demonstrate that stray DC electric fields can shift the ion position such that technical noise on the RF electrode can significantly contribute to the motional heating rate. After minimizing the pseudopotential gradient experienced by the ion induced by stray DC electric fields, the motional heating due to RF technical noise can be significantly reduced.
Large surface-electrode ion traps with multiple trapping regions and junctions are a natural approach to scaling trapped ion quantum computers, supporting the connectivity and ion counts necessary for complex quantum algorithms. However, a major hurdle in this scaling is on-chip power dissipation from the applied RF voltage, which increases at a rate between linear and cubic relative to trap size, depending on whether the losses are dielectric or Ohmic. Here, we present two versions of a trap with features designed to reduce both types of RF power dissipation. The first variant contains a raised RF electrode that increases the electrode–ground distance to reduce capacitance. Different DC voltage sources are demonstrated on this trap to show that technical noise before the filter remains the dominant source of voltage noise and therefore motional heating. The second variant additionally includes a method for removing dielectric from beneath the RF electrode to further reduce dielectric losses. These traps were demonstrated at room temperature with 40Ca+ ions. The similar heating rates and heating rate axial frequency dependencies between 2.4 and 3.0 MHz illustrate that this dielectric modification is not detrimental to trap performance.
Abstract In order to realize the full potential of ion trap quantum computers, an improved understanding is required of the motional heating that trapped ions experience. Experimental studies of the temperature-, frequency-, and ion–electrode distance-dependence of the electric field noise responsible for motional heating, as well as the noise before and after ion bombardment cleaning of trap electrodes, suggest that fluctuations of adsorbate dipoles are a likely source of so-called ‘anomalous heating,’ or motional heating of the trapped ions at a rate much higher than the Johnson noise limit. Previous computational studies have investigated how the fluctuation of model adsorbate dipoles affects anomalous heating. However, the way in which specific adsorbates affect the electric field noise has not yet been examined, and an electric dipole model employed in previous studies is only accurate for a small subset of possible adsorbates. Here, we analyze the behavior of both in-plane and out-of-plane vibrational modes of twenty-one adsorbate–electrode combinations within the independent fluctuating dipole model, utilizing accurate first principles computational methods to determine the surface-induced dipole moments. We find the chemical specificity of the adsorbate can change the electric field noise by seven orders of magnitude and specifically that soft in-plane modes of weakly-adsorbed hydrocarbons produce the greatest noise and ion heating. We discuss the dynamics captured by the fluctuating dipole model, namely the adsorbate-dependent turn-on temperature and electric field noise magnitude, and also discuss the model’s failure to reproduce the measured 1/ω noise frequency scaling with a single adsorbate species. We suggest future research directions for improved, quantitatively predictive models based on extensions of the present framework to multiple interacting adsorbates.
We have investigated motional heating of laser-cooled 9Be+{}^{9}{\mathrm{Be}}^{+}9Be+ ions held in radio-frequency (Paul) traps. We have measured heating rates in a variety of traps with different geometries, electrode materials, and characteristic sizes. The results show that heating is due to electric-field noise from the trap electrodes that exerts a stochastic fluctuating force on the ion. The scaling of the heating rate with trap size is much stronger than that expected from a spatially uniform noise source on the electrodes (such as Johnson noise from external circuits), indicating that a microscopic uncorrelated noise source on the electrodes (such as fluctuating patch-potential fields) is a more likely candidate for the source of heating.
In this work, we present a novel method to couple any two vibrational modes of a single trapped ion, allowing energy to be swapped between the two modes. We use the scheme to perform ground state cooling and heating rate measurements of vibrational modes without direct optical access. This lessens experimental design constraints in trapped ion experi- ments, particularly in surface trap apparatus where optical access can be difficult.We use a single ion as an electric-field noise sensor to study noise processes originating on the metallic surfaces of microfabricated ion traps. We show that realistic models of surface noise predict a specific polarization of the electric-field fluctuations relative to the trap geometry. In contrast, technical noise sources predict a different polarization direction and magnitude which can be inferred by electrostatic simulation of the trapping electrodes. We show that, by comparing heating rates of the two radial modes of a single trapped ion, one can determine whether technical noise sources are a significant contribution to heating. This is an important test for experiments aimed at studying surface noise effects. We also study dephasing due to surface noise, in which the electric potential curvature due to surface noise sources disturbs the phase of the ion motion. We measure the dephasing time for trapped ion motion. Using a noise model featuring dipolar noise sources, we probe the power spectrum of surface noise effects. These measurements, especially if repeated in a trap with smaller ion-electrode distances, may yield new insights as to the physical origin of surface noise effects.We demonstrate a two-ion quantum simulation of vibrationally-assisted energy transfer, an important phenomenon in biochemical energy transfer. We show that the quantum simulator performs well when benchmarked against exact numerical simulation. We believe that our approach can be scaled to more complicated systems beyond the reach of classical simulation, and discuss several methods for extending the simulation.
Motional heating of ions in microfabricated traps is one of the open challenges hindering experimental realizations of large-scale quantum processing devices. Recently, a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise remains incomplete. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first-principles calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency, and temperature dependence of the resulting electric field fluctuation spectrum. Our theory reproduces correctly the ${d}^{\ensuremath{-}4}$ dependence with distance of the ion from the electrode surface and calculates the noise spectrum beyond the standard scenario of two-level fluctuators by incorporating all the relevant vibrational states. Our model predicts a regime of 1/f1/f1/f noise which commences at roughly the frequency of the fundamental phonon transition rate and a thermally activated noise spectrum which for higher temperatures exhibits a crossover as a function of frequency.
Laser cleaning of the electrodes in a planar micro-fabricated ion trap has been attempted using ns pulses from a tripled Nd:YAG laser at 355 nm.The effect of the laser pulses at several energy density levels has been tested by measuring the heating rate of a single 40 Ca + trapped ion as a function of its secular frequency ω z .A reduction of the electric-field noise spectral density by ∼50% has been observed and a change in the frequency dependence also noticed.This is the first reported experiment where the 'anomalous heating' phenomenon has been reduced by removing the source as opposed to reducing its thermal driving by cryogenic cooling.This technique may open up the way to better control of the electrode surface quality in ion microtraps.The recent success of quantum information experiments based on trapped ions [1] triggered research on micro-fabricated radio-frequency (Paul) traps, which are in principle able to fulfill the scalability requirement of a quantum computer [2,3].In such traps, a set of micro-fabricated conducting electrodes generates oscillating and static electric fields that trap laser-cooled ions in a harmonic potential well at a sub-millimeter distance d from the substrate [4,5].However, the presence of uncontrolled fluctuating electric fields affects the ions' external motion and induces an 'anomalous heating' that limits the achievable fidelity of multi-ion quantum gates that rely on the coherent control of this motion [6].Experimental observations concerning this phenomenon 4