arXiv:1607.07382 · Physical review. B./Physical review. B
Resistivity of the insulating phase approaching the two-dimensional metal-insulator transition: The effect of spin polarization
Shiqi Li, Myriam P. Sarachik
Abstract
The resistivities of the dilute, strongly interacting two-dimensional electron systems in the insulating phase of a silicon MOSFET are the same for unpolarized electrons in the absence of magnetic field and for electrons that are fully spin polarized by the presence of an in-plane magnetic field. In both cases the resistivity obeys Efros-Shklovskii variable range hopping $\ensuremath{\rho}(T)={\ensuremath{\rho}}_{0}\text{exp}[{({T}_{ES}/T)}^{1/2}]$, with ${T}_{ES}$ and $1/{\ensuremath{\rho}}_{0}$ mapping onto each other if one applies a shift of the critical density ${n}_{\text{c}}$ reported earlier. With and without magnetic field, the parameters ${T}_{ES}$ and $1/{\ensuremath{\rho}}_{0}={\ensuremath{\sigma}}_{0}$ exhibit scaling consistent with critical behavior approaching a metal-insulator transition.