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arXiv:1511.04819 · Physical Review A

Implications of surface noise for the motional coherence of trapped ions

Ishan Talukdar, Dylan J Gorman, Nikos Daniilidis, Philipp Schindler, Sepehr Ebadi, Henning Kaufmann, T. Zhang, Hartmut Häffner

Published Apr 20, 2016• 28 citations
arXivHTMLPDF

Abstract

Electric noise from metallic surfaces is a major obstacle towards quantum applications with trapped ions due to motional heating of the ions. Here, we discuss how the same noise source can also lead to pure dephasing of motional quantum states. The mechanism is particularly relevant at small ion-surface distances, thus imposing a constraint on trap miniaturization. By means of a free induction decay experiment, we measure the dephasing time of the motion of a single ion trapped 50 $\ensuremath{\mu}\mathrm{m}$ above a Cu-Al surface. From the dephasing times we extract the integrated noise below the secular frequency of the ion. We find that none of the most commonly discussed surface noise models for ion traps describes both the observed heating as well as the measured dephasing satisfactorily. Thus, our measurements provide a benchmark for future models for the electric noise emitted by metallic surfaces.

DOI
10.1103/physreva.93.043415

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Electric noise from metallic surfaces is a major obstacle towards quantum applications with trapped ions due to motional heating of the ions. Here, we discuss how the same noise source can also lead to pure dephasing of motional quantum states. The mechanism is particularly relevant at small ion-surface distances, thus imposing a constraint on trap miniaturization. By means of a free induction decay experiment, we measure the dephasing time of the motion of a single ion trapped 50 \ensuremathμm\ensuremath{\mu}\mathrm{m}\ensuremathμm above a Cu-Al surface. From the dephasing times we extract the integrated noise below the secular frequency of the ion. We find that none of the most commonly discussed surface noise models for ion traps describes both the observed heating as well as the measured dephasing satisfactorily. Thus, our measurements provide a benchmark for future models for the electric noise emitted by metallic surfaces.
In this work, we present a novel method to couple any two vibrational modes of a single trapped ion, allowing energy to be swapped between the two modes. We use the scheme to perform ground state cooling and heating rate measurements of vibrational modes without direct optical access. This lessens experimental design constraints in trapped ion experi- ments, particularly in surface trap apparatus where optical access can be difficult.We use a single ion as an electric-field noise sensor to study noise processes originating on the metallic surfaces of microfabricated ion traps. We show that realistic models of surface noise predict a specific polarization of the electric-field fluctuations relative to the trap geometry. In contrast, technical noise sources predict a different polarization direction and magnitude which can be inferred by electrostatic simulation of the trapping electrodes. We show that, by comparing heating rates of the two radial modes of a single trapped ion, one can determine whether technical noise sources are a significant contribution to heating. This is an important test for experiments aimed at studying surface noise effects. We also study dephasing due to surface noise, in which the electric potential curvature due to surface noise sources disturbs the phase of the ion motion. We measure the dephasing time for trapped ion motion. Using a noise model featuring dipolar noise sources, we probe the power spectrum of surface noise effects. These measurements, especially if repeated in a trap with smaller ion-electrode distances, may yield new insights as to the physical origin of surface noise effects.We demonstrate a two-ion quantum simulation of vibrationally-assisted energy transfer, an important phenomenon in biochemical energy transfer. We show that the quantum simulator performs well when benchmarked against exact numerical simulation. We believe that our approach can be scaled to more complicated systems beyond the reach of classical simulation, and discuss several methods for extending the simulation.
We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a $1/{f}^{\ensuremath{\alpha}\ensuremath{\approx}1}$ dependence and a small decrease in $\ensuremath{\alpha}$ between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. The study of these processes may aid in identification of the origin of excess electric-field noise in ion traps---a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.
Electric-field noise is a major limiting factor in the performance of ion traps and other quantum devices. Despite intensive research over the past decade, the nature and cause of electric field noise near surfaces is not well understood. This dissertation reports the high- temperature dependence of electric-field noise above an Al-Cu surface using a trapped 40Ca+ ion as a probe.We employ a novel setup with a surface ion trap mounted on a heater for studies of the temperature dependence of electric-field noise. To characterize the Al-Cu material, we explore the effects of heat treatment through ex situ annealing followed by inspection in a scanning electron microscope. To calibrate the temperature of the trap, we demonstrate the use of thermal imaging for monitoring the temperature of an ion trap in vacuum.The temperature and frequency dependence of electric-field noise above the surface is measured using the heating rate of a single ion in a surface-electrode Paul trap. We find that the heating rate saturates at temperatures greater than 450 K. We find that the frequency dependence shows a 1/f behavior, and has a lower frequency scaling exponent at high temperatures than at room temperature. We show that these results are a reflection of the surface-related noise by eliminating other possible sources of noise.Building on historical data for resistance fluctuations in thin films, we develop the thermally-activated fluctuator model to describe the results. We find that a broad distribution of fluctuators with energy barriers peaked around 0.5 eV accurately models both the temperature and frequency dependence of the electric-field noise measured. We present the interpretation of this model as a way to infer that the cause of electric-field noise in the trap is likely defect motion in the metal surface, connecting the problems faced in ion trapping to a large body of work in solid state physics.
Electric field noise originating from metal surfaces is a hindrance for a variety of microengineered systems, including for ions in microtraps, but is not well understood at the microscopic level. For trapped ions, it is manifested as motional-state decoherence inexplicable by thermal noise of electrodes alone, but likely surface-dependent. Here, we investigate the role of surface properties in motional heating by creating an ion trap with a unique exterior. Using single trapped-ion probes, we characterize copper electrodes covered in monolayer graphene, a material free of surface charge and dangling bonds. Surprisingly, we measure an average heating rate of 1020 ± 30 quanta/s, which is ∼100 times higher than typical for an uncoated trap operated under similar conditions. This may be related to hydrocarbon deposits on the surface, which could be monitored on graphene to potentially elucidate the mechanisms of motional heating on the atomic scale.
Motional heating of ions in microfabricated traps is one of the open challenges hindering experimental realizations of large-scale quantum processing devices. Recently, a series of measurements of the heating rates in surface-electrode ion traps characterized their frequency, distance, and temperature dependencies, but our understanding of the microscopic origin of this noise remains incomplete. In this work we develop a theoretical model for the electric field noise which is associated with a random distribution of adsorbed atoms on the trap electrode surface. By using first-principles calculations of the fluctuating dipole moments of the adsorbed atoms we evaluate the distance, frequency, and temperature dependence of the resulting electric field fluctuation spectrum. Our theory reproduces correctly the ${d}^{\ensuremath{-}4}$ dependence with distance of the ion from the electrode surface and calculates the noise spectrum beyond the standard scenario of two-level fluctuators by incorporating all the relevant vibrational states. Our model predicts a regime of 1/f1/f1/f noise which commences at roughly the frequency of the fundamental phonon transition rate and a thermally activated noise spectrum which for higher temperatures exhibits a crossover as a function of frequency.
Ion traps are promising architectures for implementing quantum computers, but they suffer from excessive ``anomalous'' ion motional heating that limit their overall coherence and practicality for scalable quantum computing. The exact microscopic origins of anomalous heating remain an open question, but experiments point to adsorbates on trap electrodes as one likely source. Many different models of anomalous heating have been proposed, but these models have yet to pinpoint the atomistic origin of the experimentally observed $1/\ensuremath{\omega}$ electric-field noise scaling seen in ion traps at frequencies between 0.1--10 MHz. In this work, we show that a model based on previously proposed surface-induced dipole fluctuations on adsorbates, but which also incorporates interparticle interaction dynamics through molecular dynamics simulations of up to multiple monolayers of adsorbates, gives rise to $1/\ensuremath{\omega}$ frequency scaling at the MHz frequencies typically employed in ion traps. These results demonstrate that moderate-to-high densities of adsorbates can give rise to a set of activated motions that produce the $1/\ensuremath{\omega}$ noise observed in ion traps and that collective adsorbate motions produce the observed noise spectra that a noninteracting model does not capture.