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arXiv:1503.02646 · Physical Review B

Low-temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits

Alexander L. Burin, Shlomi Matityahu, Moshe Schechter

Published Nov 16, 2015• 30 citations
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Abstract

The analytical solution for the low-temperature $1/f$ noise in the microwave dielectric constant of amorphous films at frequency ${\ensuremath{\nu}}_{0}\ensuremath{\sim}5\phantom{\rule{0.28em}{0ex}}\mathrm{GHz}$ due to tunneling two-level systems (TLSs) is derived within the standard tunneling model including the weak dipolar or elastic TLS-TLS interactions. The $1/f$ frequency dependence is caused by TLS spectral diffusion characterized by the width growing logarithmically with time. Temperature and field dependencies are predicted for the noise spectral density in typical glasses with universal TLSs. The satisfactory interpretation of the recent experiment by J. Burnett et al. [Nat. Commun. 5, 4119 (2014)] in Pt-capped Nb superconducting resonators is attained by assuming a smaller density of TLSs compared to ordinary glasses, which is consistent with the very high internal quality factor in those samples.

DOI
10.1103/physrevb.92.174201

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The analytical solution for the low-temperature 1/f1/f1/f noise in the microwave dielectric constant of amorphous films at frequency \ensuremathν0\ensuremath∼5GHz{\ensuremath{\nu}}_{0}\ensuremath{\sim}5\phantom{\rule{0.28em}{0ex}}\mathrm{GHz}\ensuremathν0​\ensuremath∼5GHz due to tunneling two-level systems (TLSs) is derived within the standard tunneling model including the weak dipolar or elastic TLS-TLS interactions. The 1/f1/f1/f frequency dependence is caused by TLS spectral diffusion characterized by the width growing logarithmically with time. Temperature and field dependencies are predicted for the noise spectral density in typical glasses with universal TLSs. The satisfactory interpretation of the recent experiment by J. Burnett et al. [Nat. Commun. 5, 4119 (2014)] in Pt-capped Nb superconducting resonators is attained by assuming a smaller density of TLSs compared to ordinary glasses, which is consistent with the very high internal quality factor in those samples.
We use a tunneling model for two-level systems in insulators that takes into account the interaction between them and a slow power-law dependence of their density of states. We show that the predictions of this model are in a perfect agreement with the recent studies of the noise in high quality superconducting resonators. The predictions also agree with the temperature dependence of the TLS dephasing rates observed in phase qubits. Both observations are impossible to explain in the framework of the standard tunneling model of TLS. We discuss the origin of the universal dimensionless parameter that controls the interaction between TLS in glasses and show that it is consistent with the assumptions of the model.
1/f noise caused by microscopic two-level systems (TLS) is known to be very detrimental to the performance of superconducting quantum devices but the nature of these TLS is still poorly understood. Recent experiments with superconducting resonators indicates that interaction between TLS in the oxide at the film-substrate interface is not negligible. Here we present data on the loss and 1/f frequency noise from two different Nb resonators with and without Pt capping and discuss what conclusions can be drawn regarding the properties of TLS in amorphous oxides. We also estimate the concentration and dipole moment of the TLS.
noise caused by microscopic two-level systems (TLS) is known to be very detrimental to the performance of superconducting quantum devices but the nature of these TLS is still poorly understood. Recent experiments with superconducting resonators indicates that interaction between TLS in the oxide at the film-substrate interface is not negligible. Here we present data on the loss and frequency noise from two different Nb resonators with and without Pt capping and discuss what conclusions can be drawn regarding the properties of TLS in amorphous oxides. We also estimate the concentration and dipole moment of the TLS.
Superconducting circuits are a leading platform for quantum computing. However, their coherence times are still limited and exhibit temporal fluctuations. Those phenomena are often attributed to the coupling between qubits and material defects that can be well described as an ensemble of two-level systems (TLSs). Among them, charge fluctuators inside amorphous oxide layers contribute to both low-frequency 1/f1/f1/f charge noise and high-frequency dielectric loss, causing fast qubit dephasing and relaxation. Moreover, spectral diffusion from mutual TLS interactions varies the noise amplitude over time, fluctuating the qubit lifetime. Here, we propose to mitigate those harmful effects by engineering the relevant TLS noise spectral densities. Specifically, our protocols smooth the high-frequency noise spectrum and suppress the low-frequency noise amplitude via depolarizing and dephasing the TLSs, respectively. As a result, we predict a drastic stabilization in qubit lifetime and an increase in qubit pure dephasing time. Our detailed analysis of feasible experimental implementations shows that the improvement is not compromised by spurious coupling from the applied noise to the qubit.
Quantum two-level systems (TLSs) commonly found at low temperature in amorphous and disordered materials are responsible for decoherence in superconducting Josephson junction qubits particularly because they absorb energy of coherent qubit oscillations in the microwave frequency range. In planar Josephson resonators with oxide interfaces this absorption is characterized by an anomalously weak loss tangent dependence on the field in the non-linear regime that conflicts with the theoretical expectations and the observations in amorphous dielectrics. It was recently suggested that this anomalous absorption is due to TLS dynamic interactions. Here we show that such interactions cannot lead to the observed loss-tangent field dependence and suggest the alternative explanation assuming that TLS dipole moments ppp are distributed according to the specific power law P(p)∝1/p3−ηP(p) \propto 1/p^{3-η}P(p)∝1/p3−η (0≤η<10\leq η<10≤η<1). This assumption, indeed, results in the observed loss tangent behavior. The hypothesis of a power law distribution is supported both by the recent measurements of individual TLS dipole moments and the theoretical model of TLS formation due to the long-range dipole-dipole interaction, thus connecting the anomalous absorption with the possible solution of the long-standing problem of the nature of TLSs.
At sub-Kelvin temperatures, two-level systems (TLSs) present in amorphous dielectrics source a permittivity noise, degrading the performance of a wide range of devices using superconductive resonators such as qubits or kinetic inductance detectors. We report here on measurements of TLS noise in hydrogenated amorphous silicon (a-Si:H) films deposited by plasma-enhanced chemical vapor deposition in superconductive lumped element resonators using parallel-plate capacitors. The TLS noise results presented in this article for two recipes of a-Si:H improve on the best results achieved in the literature by a factor >5 for a-Si:H and other amorphous dielectrics and are comparable to those observed for resonators deposited on crystalline dielectrics.