arXiv:1203.4431 · Applied Physics Letters
A Josephson junction defect spectrometer for measuring two-level systems
M. J. A. Stoutimore, M. S. Khalil, Christopher J. Lobb, Kevin D. Osborn
Abstract
We have fabricated and measured Josephson junction (JJ) defect spectrometers, which are frequency-tunable, nearly harmonic oscillators that probe strongly coupled two-level systems (TLSs) in the barrier of a JJ. The JJDSs accommodate a wide range of junction inductances, LJ, while maintaining a resonance frequency, fres, in the range of 4–8 GHz. By applying a magnetic flux bias to tune fres, we detect strongly coupled TLSs in the junction barrier as splittings in the device spectrum. JJDSs fabricated with a via-style Al/thermal AlOx/Al junction and measured between 30–45 mK with single-photon excitation levels show a density of TLSs in the range σTLSh≈0.4-0.5/GHzμm2, and a junction loss tangent of tanδJ≈2.9×10−3.