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arXiv:0909.0547 · Applied Physics Letters

Improving the coherence time of superconducting coplanar resonators

H. Wang, M. Hofheinz, J. Wenner, M. Ansmann, R. C. Bialczak, M. Lenander, Erik Lucero, M. Neeley, A. D. O’Connell, D. Sank, Martin P. Weides, A. N. Cleland, John M. Martinis

Published Dec 7, 2009• 183 citations
arXivHTMLPDF

Abstract

The quality factor and energy decay time of superconducting resonators have been measured as a function of material, geometry, and magnetic field. Once the dissipation of trapped magnetic vortices is minimized, we identify a power-dependent decay mechanism that is consistent with the surface two-level state model. A wide gap between the center conductor and the ground plane, as well as use of the superconductor Re instead of Al, are shown to decrease loss. We also demonstrate that classical measurements of resonator quality factor at low excitation power are consistent with single-photon decay time measured using qubit-resonator swap experiments.

DOI
10.1063/1.3273372

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The quality factor and energy decay time of superconducting resonators have been measured as a function of material, geometry, and magnetic field. Once the dissipation of trapped magnetic vortices is minimized, we identify a power-dependent decay mechanism that is consistent with the surface two-level state model. A wide gap between the center conductor and the ground plane, as well as use of the superconductor Re instead of Al, are shown to decrease loss. We also demonstrate that classical measurements of resonator quality factor at low excitation power are consistent with single-photon decay time measured using qubit-resonator swap experiments.
The loss in superconducting microwave resonators at low-photon numbers and low temperatures is not well understood but has implications for achievable coherence times in superconducting qubits. We have fabricated single-layer resonators with a high quality factor by patterning a superconducting aluminum film on a sapphire substrate. Four resonator geometries were studied with resonant frequencies ranging from 5 to 7 GHz: a quasi-lumped element resonator, a coplanar strip waveguide resonator, and two hybrid designs that contain both a coplanar strip and a quasi-lumped element. Transmitted power measurements were taken at 30 mK as a function of frequency and probe power. We find that the resonator loss, expressed as the inverse of the internal quality factor, decreases slowly over four decades of photon number in a manner not merely explained by loss from a conventional uniform spatial distribution of two-level systems in an oxide layer on the superconducting surfaces of the resonator.
Superconducting coplanar waveguide (SCPW) resonators have a wide range of applications due to the combination of their planar geometry and high quality factors relative to normal metals. However, their performance is sensitive to both the details of their geometry and the materials and processes that are used in their fabrication. In this paper, we study the dependence of SCPW resonator performance on materials and geometry as a function of temperature and excitation power. We measure quality factors greater than 2 × 106 at high excitation power and 6 × 105 at a power comparable to that generated by a single microwave photon circulating in the resonator. We examine the limits to the high excitation power performance of the resonators and find it to be consistent with a model of radiation loss. We further observe that while in all cases the quality factors are degraded as the temperature and power are reduced due to dielectric loss, the size of this effect is dependent on resonator materials and geometry. Finally, we demonstrate that the dielectric loss can be controlled in principle using a separate excitation near the resonance frequencies of the resonator.
Superconducting quantum computing systems, including coplanar waveguide (CPW) resonators and qubits, are highly susceptible to energy dissipation from two-level systems (TLS) within bulk and interfacial dielectrics. CPW resonators serve as an ideal platform for characterizing these material losses at the single-photon excitation level. Building on recent experimental evidence that interface engineering can mitigate TLS losses, this study employs simulations to evaluate resonator quality factors across various interface modifications. Our results demonstrate that reducing losses at the substrate–air (SA) interface can increase the internal quality factor Qi by up to three orders of magnitude. While etching the SA interface also enhances Qi, material loss remains the dominant dissipation mechanism. Furthermore, we find that other lossy interfaces have a significantly smaller impact on the quality factor compared to the SA interface. These simulation results align with established experimental findings, providing a robust framework for refining resonator design. This work offers precise guidelines for TLS mitigation, essential for enhancing coherence times and developing more reliable superconducting quantum processors.
We performed transmission spectroscopy experiments on coplanar half-wavelength niobium resonators at temperature T=4.2T=4.2\phantom{\rule{0.16em}{0ex}}T=4.2K. We observe not only a strong dependence of the quality factor QQQ and the resonance frequency fres{f}_{\mathrm{res}}fres​ on an externally applied magnetic field but also on the magnetic history of our resonators, i.e., on the spatial distribution of trapped Abrikosov vortices in the device. This is valid for a broad range of frequencies and angles between the resonator plane and the magnetic field direction and holds for resonators with and without antidots near the edges of the center conductor and the ground planes. In a detailed analysis, we show that characteristic features of the experimental data can only be reproduced by calculations if we assume a highly inhomogeneous rf current density and a flux density gradient with maxima at the edges of the superconductor. We furthermore demonstrate that the hysteretic behavior of the resonator properties can be used to considerably reduce the vortex-induced losses and to fine-tune the resonance frequency by the proper way of cycling to a desired magnetic field value.
Superconducting resonators are widely used in many applications such as qubit readout for quantum computing applications, and kinetic inductance detectors. These resonators are susceptible to numerous loss and noise mechanisms under microwave excitation, especially the dissipation due to non-equilibrium quasi-particles and two-level systems (TLS), which can result in a decrease of the superconducting intrinsic quality factor (QiQ_iQi​) in high quality superconducting resonators. Particularly in the few-photon and low temperature (T) regime, TLS losses can become a dominant loss mechanism. In this study, novel aluminum half-wavelength resonators are investigated, focusing on the loss properties at extra-low power and low temperature. An unusual increase of Qi(T)Q_i(T)Qi​(T) with deceasing temperature is observed. This behavior is attributed to the increase of TLS coherence time (T2T_2T2​) at ultra-low temperatures and powers. This T2T_2T2​ increase is consistent with other work on resonant frequency noise in resonators and measurements of individual TLS, and likely arises from interacting TLS in the aluminum half-wavelength resonators.
Dielectric loss from two-level systems (TLSs) formed by local defects have shown a significant impact on the qubit coherence time. These defects can originate in the insulation material for superconducting wires isolation or in the Josephson junction tunnel barrier material. Due to the complexity of the qubit circuit fabrication process, identifying the contribution from each decoherence source is challenging. In an effort to address this issue, we have developed superconducting qubit that consists of full epitaxially-grown NbN/AlN/NbN Josephson junctions in NbN coplanar waveguide (CPW) resonator circuit. The dielectric loss introduced from TLFs in tunnel junction barrier has been largely reduced due to the unique epitaxial feature of the tunnel junction. The quality factor Qi of the CPW resonator was measured and the dielectric loss tanδ is 3×10−4. The relaxation time inferred from the measured resonator quality factor was comparable to the qubit relaxation time.