arXiv:quant-ph/0501108

Fast Testing Quantum Circuits

Jacob Biamonte, Marek A. Perkowski, Jae‐Seung Lee

Published Jan 20, 2005• 0 citations

Abstract

This paper introduces the problem of test generation and test minimization for quantum circuits using a discrete fault model. QuFault, our software package generates test sequences for arbitrary quantum circuits using the very efficient simulator QuIDDPro [1]. The quantum fault table and the test set minimization algorithm is presented, along with some tricks to make quantum testing as deterministic as possible. As our fault model we use the single qubit rotation operators about the x, y and z axis. The angle of the rotation is based on the expected accuracy of the mechanism performing the unitary operations, or the largest impact of expected noise from the environment. We consider superposition inputs as well as interference in order to detect phase faults, such as possible errors traveling backwards through controlled gates.

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