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arXiv:cond-mat/0309208 · Journal of the Physical Society of Japan

Effect of Multiple Charge Traps on Dephasing Rates of a Josephson Charge Qubit System

Toshifumi Itakura, 康弘 都倉

Published Nov 15, 2003• 3 citations
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Abstract

We examine the dephasing rate of a Josephson charge qubit system due to background charge fluctuations. We consider single qubit and two-charge traps. The transition probability was controlled to a state where two traps were occupied. The transition probability was affected by the Coulomb blockade effect that occurs between two charge traps. To obtain the dephasing rate, we computed the spectra of random frequency modulation signals. Our results show that the interaction between charge traps suppresses dephasing.

DOI
10.1143/jpsj.72.2726

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We examine the dephasing rate of a Josephson charge qubit system due to background charge fluctuations. We consider single qubit and two-charge traps. The transition probability was controlled to a state where two traps were occupied. The transition probability was affected by the Coulomb blockade effect that occurs between two charge traps. To obtain the dephasing rate, we computed the spectra of random frequency modulation signals. Our results show that the interaction between charge traps suppresses dephasing.
In quantum computation, quantum coherence must be maintained during gate operation. However, in physical implementations, various couplings with the environment are unavoidable and can lead to a dephasing of a quantum bit (qubit). The background charge fluctuations are an important dephasing process, especially in a charge qubit system. We examined the dephasing rate of a qubit due to random telegraph noise. Solving stochastic differential equations, we obtained the dephasing rate of a qubit constructed of a coupled-dot system; we applied our results to the charge Josephson qubit system. We examined the dephasing rates due to two types of couplings between the coupled-dot system and the background charge, namely, fluctuation in the tunnel coupling constant and fluctuation in the asymmetric bias. For a strong-coupling condition, the dephasing rate was inversely proportional to the time constant of the telegraph noise. When there is fluctuation in the tunnel coupling constant, Gaussian decay occurs in the initial regime. We also examined the rate of dephasing due to many impurity sites. For a weak-coupling condition with fluctuation in the asymmetric bias, the obtained dephasing rate coincided with that obtained by the perturbation method using the spectral weight of a boson thermal bath, which is proportional to the inverse of the frequency.
A quantum computer that can be constructed based on a superconducting nanocircuits has previously been proposed. We examine the effect of background charge fluctuations on a coupled Josephson charge qubit system used in such a computer. In previous work, the background charge fluctuations were found to be an important dephasing channel for a single Josephson qubit. We investigate the effect of fluctuations in the bias at the charge degeneracy point of a Josephson charge qubit system. Evaluated quantities are gate fidelity and diagonal elements of the qubit's density matrix. The fluctuation leads to gate error, however quantum gate operation becomes more accurate with increasing interaction between qubit systems.
It has been proposed that a quantum computer can be constructed based on electron spins in quantum dots or based on a superconducting nanocircuit. During two-qubit operations, the fluctuation of the coupling parameters is a critical factor. One source of such fluctuation is the stirring of the background charges. We focused on the influence of this fluctuation on a coupled spin qubit system. The induced fluctuation in exchange coupling changes the amount of entanglement, fidelity, and purity. In our previous study, the background charge fluctuations were found to be an important channel of dephasing for a single Josephson qubit.
Josephson charge qubits are promising candidates for scalable quantum computing. However, their performances are strongly degraded by decoherence due to low-frequency background noise, typically with a 1∕f1∕f1∕f spectrum. In this paper, we investigate the decoherence process of two Cooper pair boxes (CPBs) coupled via a capacitor. Going beyond the common and uncorrelated noise models and the Bloch-Redfield formalism of previous works, we study the coupled system's quadratic dephasing under the condition of partially correlated noise sources. Based on reported experiments and generally accepted noise mechanisms, we introduce a reasonable assumption for the noise correlation, with which the calculation of multiqubit decoherence can be simplified to a problem on the single-qubit level. For the conventional Gaussian 1∕f1∕f1∕f noise case, our results demonstrate that the quadratic dephasing rates are not very sensitive to the spatial correlation of the noises. Furthermore, we discuss the feasibility and efficiency of dynamical decoupling in the coupled CPBs.
The major contribution to decoherence of a double quantum dot or a Josephson-junction charge qubit comes from the electrostatic coupling to fluctuating background charges hybridized with the conduction electrons in the reservoir. However, estimations according to previously developed theories show that finding a sufficient number of effective fluctuators in a realistic experimental layout is quite improbable. We show that this paradox is resolved by allowing for a short-range Coulomb interaction of the fluctuators with the electrons in the reservoir. This dramatically enhances both the number of effective fluctuators and their contribution to decoherence, resulting in the most dangerous decoherence mechanism for charge qubits.
We investigate the role of interatomic interactions when a Bose gas, in a double-well potential with a finite tunneling probability (a ‘Bose–Josephson junction’), is exposed to external noise. We examine the rate of decoherence of a system initially in its ground state with equal probability amplitudes in both sites. The noise may induce two kinds of effects: firstly, random shifts in the relative phase or number difference between the two wells and secondly, loss of atoms from the trap. The effects of induced phase fluctuations are mitigated by atom–atom interactions and tunneling, such that the dephasing rate may be suppressed by half its single-atom value. Random fluctuations may also be induced in the population difference between the wells, in which case atom–atom interactions considerably enhance the decoherence rate. A similar scenario is predicted for the case of atom loss, even if the loss rates from the two sites are equal. We find that if the initial state is number-squeezed due to interactions, then the loss process induces population fluctuations that reduce the coherence across the junction. We examine the parameters relevant for these effects in a typical atom chip device, using a simple model of the trapping potential, experimental data, and the theory of magnetic field fluctuations near metallic conductors. These results provide a framework for mapping the dynamical range of barriers engineered for specific applications and set the stage for more complex atom circuits (‘atomtronics’).