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Rb気体の選択反射信号の尖鋭化

Taro ITO

Published Feb 28, 1992• 0 citations
Publisher

Abstract

The selective reflection spectra of Rb D_1 line from a glass vapor interface has been studied as a function of incidence angles of light. It has been observed that the Doppler broadning of the spectra has been partially reduced for the nearly normal incidence of light to the interface, and that the 85Rb hyperfine structure of the excited state 2P_1/2, which is usually masked in the Doppler width, has been almost resolved as a result of the spectral narrowing. The observed line shapes are in good agreement with the theoretical ones including the effect of atom-wall collision.|Rb D_1線の境界面からの選択反射スペクトルが入射光角度の関数として調べられた。スペクトルのドップラー広がりが、境界面への垂直入射光に対して部分的に減少し、ドップラー幅に埋没している85Rbの励起状態2P_1/2の超微細構造が、このスペクトル尖鋭化の結果、ほとんど分解されるのが観測された。観測されたスペクトル線の形は原子と壁との衝突の効果を考慮した理論によるスペクトル線の形と良く一致している。

DOI
10.32287/td00005838

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[Measurement of the Rb[5P3/2(F'=4)] hyperfine level nonradiative decay rate near a metallic film with laser retrofluoresence spectroscopy].

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[Spectroscopic investigation of retrofluorescence in a pure optically thick Rb vapour near the surface].

Xiaoyan Shen, Jing Liu, Qi-cun Guo +2 more

A low-power tunable laser was used to populate the Rb(5P(3/2)) hyperfine-structure levels in a pure optically thick vapour in the presence of a dissipative surface. The retrofluorescence intensities and spectrum profile for the 780 nm (5P(3/2)--> 5S(1/2)) and 795 nm (5P(1/2)-->5S(1/2)) lines were measured and analyzed. The glass-vapor interface was considered as two distinct regions, a wavelength-thickness vapor layer adjacent to the surface and a more remote vapor region The first region was analyzed as a spectral filter that annihilated the absorbed photons and the second one as a rich spectral light source. The authors discussed two possible mechanisms for the 5P(1/2) population in the cell [i.e., mechanism(1): collisions Rb(5P(3/2))+Rb(5S(1/2))-->Rb(5P(1/2))+Rb(5S(1/2)); mechanism(2): collisions Rb(5D)+Rb(5S)-->Rb(5P)+Rb(5P)]. For each one of the possible mechanisms considered, the authors gave the theoretical formulation of the retrofluorescence integrated signal associated with 795 nm(5P(1/2)-->5S(1/2)), which was compared with experiment. Two important characteristic aspects of retrofluorescence spectra must be taken into account when dealing with retrofluorescence signals for atomic process investigation: the retrofluorescence intensity dependence on laser power and sensitized laser retrofluorescence line shapes. When the laser frequency is scanned through the hyperfine resonance line, the sensitized retrofluorescence spectra signal corresponding to the 795 nm line has a profile similar to the profile of the retrofluorescence signal at the 780 nm. The authors have pointed out that mechanism(1) gives the linear dependence of the trtrofluorescence as a function of laser power and the spectrum profile. The population of the 5P(1/2) atomic level in an optically thick vapour can be principally explained by the fine-structure excitation transfer process [mechanism(1)]. It appears from our experimental and theoretical investigations that, the spectral properties of the laser-induced Rb 795 nm sensitized retrofluorescence in a pure optically thick vapour near a dissipative surface cannot be explained by the mechanism(2).

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Optical Detection of Narrow Rb87 Hyperfine Absorption Lines

Peter Bender, Earl C. Beaty, A. R.

Optical detection of the ground state hyperfine transition has been reported for sodium vapor and for cesium vapor. The collisional narrowing technique suggested by Dicke was used to reduce the Doppler width, Results are reported for Rb/sup 87/ vapor using a different optical pumping method. Absorption lines narrower, by a factor 300, than the normal Doppler width were achieved. The experimental arrangement is described. (W.D.M.)

Physical Review Letters•Nov 1, 1958•147 citations
The selective reflection spectra of Rb D_1 line from a glass vapor interface has been studied as a function of incidence angles of light. It has been observed that the Doppler broadning of the spectra has been partially reduced for the nearly normal incidence of light to the interface, and that the 85Rb hyperfine structure of the excited state 2P_1/2, which is usually masked in the Doppler width, has been almost resolved as a result of the spectral narrowing. The observed line shapes are in good agreement with the theoretical ones including the effect of atom-wall collision.|Rb D_1線の境界面からの選択反射スペクトルが入射光角度の関数として調べられた。スペクトルのドップラー広がりが、境界面への垂直入射光に対して部分的に減少し、ドップラー幅に埋没している85Rbの励起状態2P_1/2の超微細構造が、このスペクトル尖鋭化の結果、ほとんど分解されるのが観測された。観測されたスペクトル線の形は原子と壁との衝突の効果を考慮した理論によるスペクトル線の形と良く一致している。
Attenuated total reflection(ATR)signals have been studied at an interface between Rb vapor and a glass using the Rb D_1 line.Resonance line shapes,amplitudes and linewidths have been observed to undergo remarkable changes for incidences of light near the critical angle.These experimental results have been found to agree well with the predictions of the conventional electromagnetic theory of light.|Rb気体とガラスの境界面における全反射減衰信号が,RbのD_1線を用いて調べられた。共鳴の線形や振幅および線幅が,臨界角近傍での入射光に対し,著しく変化するのが観測された。これらの実験結果は,光の電磁波理論から予測される事柄と良く一致することが見いだされた。
The signals of the hyperfine 85Rb[5P3/2(F' = 2,3,4) --> 5S1/2(F = 3)] transition lines in a diode laser induced retrofluorescence spectrum at the interface between glass and Rb vapor were experimentally identified and investigated. The glass-vapor interface was considered as two distinct regions, a wavelength-thickness vapor layer joined to the surface and a more remote vapor region. The first region was analyzed as a spectral filter that annihilates the absorbed photons and the second one as a rich spectral light source. The experimental setup is described. A Rb reference cell (T = 293 K) was used. A part of the laser beam scanned the 5S1/2(F = 3) --> 5P3/2(F' = 2,3,4) transition. The Doppler broadened absorption profile (FWHM = 510 MHz) was determined. The laser detuning of the profile-center relative to the F = 3 --> F' = 4 transition was about 70 MHz. Another laser beam was directed to the entrance cell window. The resonant retrofluorescence S(ob)(upsilon(L)) as a function of laser detuning for a cell temperature approximately 130 degrees C and laser power 0.4 mW was obtained. We can extract the experimental signal sexp(n) (upsilon(L)) originating from the near-field region by subtracting signal S(T) (upsilon(L)) originating from the far-field region from the total experiment signal S(ob)(upsilon(L)). A fit of the normalized profile of the data corresponding to the spectral band centered on the F' = 4 --> F = 3 hyperfine transition line was obtained by using a Lorentzian distribution function with GammaRF = 50 MHz full width at half-maximum. The role played by different relaxation processes contributing to the retrofluorescent atomic linewidth was characterized. The authors summed up the corresponding spectral broadening and obtained the relation GammaRF = Gamman + Gammacoll + Gammanr, where Gammacoll is the resonance collisional broadening of the hyperfine line, and Gammanr is an additional broadening induced by the nonradiative energy-transfer phenomena of the excited atoms near the cell window surface. To evaluate Gammacoll, we used the relation Gammacoll = gammaRb - RbN, where gammaRb - Rb is line broadening parameter, and N is Rb atom number density. The effective nonradiative relaxation rate of the 5P3/2(F' = 4) energy hyperfine level was estimated to be AF(nr) = 4 --> F = 3 = 2.4 x 10(8) s(-1). The value of A(nr) seems relatively large compared to the spontaneous emission rate A(5P3/2 --> 5P1/2) = 1.4 x 10(7) s(-1).
Abstract Various efforts have been made to overcome Doppler broadening in hyperfine measurement limitations in the atomic vapors spectroscopy and associated applications. The present study measured and calculated hyperfine resolved ellipsometric parameters through the near-normal reflectance spectra of the rubidium vapor cell in two experimental setups based on continuous and modulated pathway. The results indicated that valuable information could be extracted from the ellipsometric parameters about the atomic medium. Change in the ellipsometric parameters in each transition line confirms the existence of the elliptical polarization of the reflected light when it is exposed to the alkali metal vapor. Our results show that the ellipticity at 5S1/2 (Fg = 1, 2) → 5P1/2 (Fe = 1, 2) hyperfine transitions of 87Rb (D1 line) is small, and accordingly hyperfine transitions between the ground 5S1/2 (Fg = 2, 3) and excited 5P1/2 (Fe = 2, 3) states of the 85Rb isotope are considerable. These ellipsometric parameters, as phase difference, can trace the behavior of the relative orientation of the electric field and atom velocity in the interface based on van der Waals dipole–dipole interaction and is directly proportional to the strength of the light-matter interaction which extremely useful instead complicated atomic spectroscopic methods.
A low-power tunable laser was used to populate the Rb(5P(3/2)) hyperfine-structure levels in a pure optically thick vapour in the presence of a dissipative surface. The retrofluorescence intensities and spectrum profile for the 780 nm (5P(3/2)--> 5S(1/2)) and 795 nm (5P(1/2)-->5S(1/2)) lines were measured and analyzed. The glass-vapor interface was considered as two distinct regions, a wavelength-thickness vapor layer adjacent to the surface and a more remote vapor region The first region was analyzed as a spectral filter that annihilated the absorbed photons and the second one as a rich spectral light source. The authors discussed two possible mechanisms for the 5P(1/2) population in the cell [i.e., mechanism(1): collisions Rb(5P(3/2))+Rb(5S(1/2))-->Rb(5P(1/2))+Rb(5S(1/2)); mechanism(2): collisions Rb(5D)+Rb(5S)-->Rb(5P)+Rb(5P)]. For each one of the possible mechanisms considered, the authors gave the theoretical formulation of the retrofluorescence integrated signal associated with 795 nm(5P(1/2)-->5S(1/2)), which was compared with experiment. Two important characteristic aspects of retrofluorescence spectra must be taken into account when dealing with retrofluorescence signals for atomic process investigation: the retrofluorescence intensity dependence on laser power and sensitized laser retrofluorescence line shapes. When the laser frequency is scanned through the hyperfine resonance line, the sensitized retrofluorescence spectra signal corresponding to the 795 nm line has a profile similar to the profile of the retrofluorescence signal at the 780 nm. The authors have pointed out that mechanism(1) gives the linear dependence of the trtrofluorescence as a function of laser power and the spectrum profile. The population of the 5P(1/2) atomic level in an optically thick vapour can be principally explained by the fine-structure excitation transfer process [mechanism(1)]. It appears from our experimental and theoretical investigations that, the spectral properties of the laser-induced Rb 795 nm sensitized retrofluorescence in a pure optically thick vapour near a dissipative surface cannot be explained by the mechanism(2).