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Microscopy and Microanalysis

Bayesian Optimization of Interaction Free Measurement with Electrons

Nicolas Puentes, Benjamin M McMorran

Published Jul 1, 2026• 0 citations
Publisher

Abstract

High energy electrons enable atomic resolution, but also engender radiolysis or ionization damage to beam-sensitive materials, hampering the atomic imaging of medically and technologically relevant materials/processes such as cellular dynamics and proteomics. The dose required to resolve beam-sensitive materials usually far exceeds its critical dose, requiring dose dispersion across identically prepared samples that incur extensive computational processing and precise sample preparation. Numerous techniques are proposed and employed to minimize ionization damage while maximizing information acquired. The Elitzur and Vaidman quantum bomb detector is one such method [1], involving interaction-free measurements (IFM) [2-3]. In the thought experiment of Elitzur and Vaidman, single particles that are spacelike separated pass through an aligned Mach–Zehnder interferometer such that the particles self-interfere resulting in detections only at the bright port (Fig. 1(a)). Inserting an opaque object into the interferometer, disrupts the self-interference of the particles such that detections occur at the dark port (Fig. 1(b)). These dark port detections (IFMs) inform on the presence of the opaque object without the particles directly interacting with it. This phenomena extends to phase objects enabling quantitative phase imaging using interaction free measurements. A two-grating Mach–Zehnder interferometer (2GMZI) was constructed in a Titan TEM to realize IFM with electrons [4]. Now we construct the 2GMZI in a Spectra TEM similarly as before and is schematically shown in Figure 1(c). There are numerous new features from the previous generation Titan TEM pertinent to 2GMZI—such as a cold FEG and a Dectris ELA (direct electron) detector—improving electron coherence and signal-to-noise of the dark port. In the interim between the 2GMZI setups, analyses and simulations were performed to optimize the two nanofabricated gratings in mill pattern and configuration. Here we discuss such grating optimizations with an objective to maximize the Fisher information per unit radiation damage in beam-sensitive materials. The Fisher information (FIM) of interest quantifies the expected information in the detected electrons about phase differences imparted by the specimen (see Figure 2). The FIM is tunable by varying the proportion of electrons propagating via each path determined by the gratings. For instance, the pump probe configuration—where the pump carries most electrons through vacuum and the probe passes through the sample—minimizes radiation damage to the sample, but reduces the Fisher information and increases background noise via longer imaging sessions to acquire the necessary signal. The output grating may also be tuned to create multiple dark ports, increasing the overall signal. The interplay between minimizing radiation damage while maximizing the Fisher information leads to many local solutions where the global solution status depends on the critical dose of samples and the background shot noise. Utilizing these global solution configurations of 2GMZI for IFM imaging will improve low-dose phase imaging of beam-sensitive materials, decreasing the dose for high resolution imaging [5]. Sub figures (a) and (b) illustrate an electron, Mach–Zehnder interferometer in which traditional optical components—such as beam splitters and mirrors—are interchanged for gratings and magnetic lenses. Inserting an opaque object (b), prevents deconstructive interference at the dark port (DP), enabling interaction free measurements. Sub figure (c) further details the implementation of a Mach–Zehnder interferometer in an electron microscope. These two sub figures were simulated using two incident probes in the sample plane like Figure 1(c), and the specimen-induced phase-difference is swept. Sub figure (a) shows the normalized intensity of the modes, in which mode -1 and 0 correspond to the dark and bright port, respectively. Sub figure (b) is the corresponding Fisher information for each respective mode. The outer modes should be ideally suppressed.

DOI
10.1093/mam/ozag053.904

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High energy electrons enable atomic resolution, but also engender radiolysis or ionization damage to beam-sensitive materials, hampering the atomic imaging of medically and technologically relevant materials/processes such as cellular dynamics and proteomics. The dose required to resolve beam-sensitive materials usually far exceeds its critical dose, requiring dose dispersion across identically prepared samples that incur extensive computational processing and precise sample preparation. Numerous techniques are proposed and employed to minimize ionization damage while maximizing information acquired. The Elitzur and Vaidman quantum bomb detector is one such method [1], involving interaction-free measurements (IFM) [2-3]. In the thought experiment of Elitzur and Vaidman, single particles that are spacelike separated pass through an aligned Mach–Zehnder interferometer such that the particles self-interfere resulting in detections only at the bright port (Fig. 1(a)). Inserting an opaque object into the interferometer, disrupts the self-interference of the particles such that detections occur at the dark port (Fig. 1(b)). These dark port detections (IFMs) inform on the presence of the opaque object without the particles directly interacting with it. This phenomena extends to phase objects enabling quantitative phase imaging using interaction free measurements. A two-grating Mach–Zehnder interferometer (2GMZI) was constructed in a Titan TEM to realize IFM with electrons [4]. Now we construct the 2GMZI in a Spectra TEM similarly as before and is schematically shown in Figure 1(c). There are numerous new features from the previous generation Titan TEM pertinent to 2GMZI—such as a cold FEG and a Dectris ELA (direct electron) detector—improving electron coherence and signal-to-noise of the dark port. In the interim between the 2GMZI setups, analyses and simulations were performed to optimize the two nanofabricated gratings in mill pattern and configuration. Here we discuss such grating optimizations with an objective to maximize the Fisher information per unit radiation damage in beam-sensitive materials. The Fisher information (FIM) of interest quantifies the expected information in the detected electrons about phase differences imparted by the specimen (see Figure 2). The FIM is tunable by varying the proportion of electrons propagating via each path determined by the gratings. For instance, the pump probe configuration—where the pump carries most electrons through vacuum and the probe passes through the sample—minimizes radiation damage to the sample, but reduces the Fisher information and increases background noise via longer imaging sessions to acquire the necessary signal. The output grating may also be tuned to create multiple dark ports, increasing the overall signal. The interplay between minimizing radiation damage while maximizing the Fisher information leads to many local solutions where the global solution status depends on the critical dose of samples and the background shot noise. Utilizing these global solution configurations of 2GMZI for IFM imaging will improve low-dose phase imaging of beam-sensitive materials, decreasing the dose for high resolution imaging [5]. Sub figures (a) and (b) illustrate an electron, Mach–Zehnder interferometer in which traditional optical components—such as beam splitters and mirrors—are interchanged for gratings and magnetic lenses. Inserting an opaque object (b), prevents deconstructive interference at the dark port (DP), enabling interaction free measurements. Sub figure (c) further details the implementation of a Mach–Zehnder interferometer in an electron microscope. These two sub figures were simulated using two incident probes in the sample plane like Figure 1(c), and the specimen-induced phase-difference is swept. Sub figure (a) shows the normalized intensity of the modes, in which mode -1 and 0 correspond to the dark and bright port, respectively. Sub figure (b) is the corresponding Fisher information for each respective mode. The outer modes should be ideally suppressed.
Interaction-free measurement (IFM) has been proposed as a means of high-resolution, low-damage imaging of radiation-sensitive samples, such as biomolecules and proteins. The basic setup for IFM is a Mach-Zehnder interferometer, and recent progress in nanofabricated electron-diffraction gratings has made it possible to incorporate a Mach-Zehnder interferometer in a transmission electron microscope (TEM). Therefore, the limits of performance of IFM with such an interferometer and a shot-noise limited electron source (such as that in a TEM) are of interest. In this paper, we compare the error probability and sample damage for ideal IFM and classical imaging schemes, through theoretical analysis and numerical simulation. We consider a sample that is either completely transparent or completely opaque at each pixel. In our analysis, we also evaluate the impact of an additional detector for scattered electrons. Inclusion of the scattering detector results in reduction of error by up to an order of magnitude, for both IFM and classical schemes. We also investigate a sample reillumination scheme based on updating priors after each round of illumination and find that this scheme further reduces error. Implementation of these methods is likely achievable with existing instrumentation and would result in improved resolution in low-dose electron microscopy.
Abstract Reducing radiation damage is becoming a crucial factor in the development of future electron microscopes. The concept of interaction-free imaging utilizing a Mach–Zehnder interferometer has been proposed originally in. 1993 by Elitzur and Vaidman. Using the quantum Zeno effect the quantum efficiency for interaction-free measurements can be increased to near 100 % with increasing number of interrogations provided the sample is a perfect (thick) absorber. However, for an electron beam the sample is in general semi-transparent depending on the thickness. In electron microscopy the interaction-free experiment is complicated by the presence of elastic and inelastic scattering processes in the electron-sample interaction. The ratio of inelastically versus elastically scattered electrons is determined by the nature of the sample and the thickness and cannot be reduced arbitrarily. Because inelastically scattered electrons transfer energy to the sample and cause radiation damage this puts a limit to the elastically scattered electrons and consequently to the resolution of electron imaging. In this paper, the inelastic scattering is modeled as an “absorption” function on the modulus of the electron wave. Image simulations and Argand plots are used to investigate the convergence rate of the Zeno iterations versus different type of samples, in particular a double strained DNA helical sample. It is found that the stronger objects reach maximum quantum efficiency faster than weaker objects for which more interrogations are needed to reach the maximum quantum efficiency. For a general hybrid amplitude/phase object the “phase” information tends to converge to zero as the number of interrogation increases.
Correlated light (either classical or quantum) can be employed in various ways to improve resolution and measurement sensitivity. In an “interaction-free” measurement, a single photon can be used to reveal the presence of an object placed within one arm of an interferometer without being absorbed by it. This method has previously been applied to imaging. With a technique known as “ghost imaging”, entangled photon pairs are used for detecting an opaque object with significantly improved signal-to-noise ratio while preventing over-illumination. Here, we integrate these two methods to obtain a new imaging technique which we term “interaction-free ghost-imaging” that possesses the benefits of both techniques. While improving the image quality of conventional ghost-imaging, this new technique is also sensitive to phase and polarization changes in the photons introduced by a structured object. Furthermore, thanks to the “interaction-free” nature of this new technique, it is possible to reduce the number of photons required to produce a clear image of the object (which could be otherwise damaged by the photons) making this technique superior for probing light-sensitive materials and eventually biological tissues. If time allows, I will discuss some follow-up works involving partial measurements and remote erasure/completion of images. The latter techniques can help to suppress various types of noise during the imaging process.
One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope.
Here, we experimentally demonstrate interaction-free measurements with electrons using a novel electron Mach-Zehnder interferometer. The flexible two-grating electron interferometer is constructed in a conventional transmission electron microscope and achieves high contrast in discrete output detectors, tunable alignment with independently movable beam splitters, and scanning capabilities for imaging. With this path-separated electron interferometer, which closely matches theoretical expectations, we demonstrate electron interaction-free measurements with an efficiency of 14±1%. Implementing this quantum protocol in electron imaging opens a path toward interaction-free electron microscopy.
Recently, it has been pointed out that it is possible to make a quantum-mechanical interaction-free measurement (IFM), in which the existence of an object in a given region of space may be determined seemingly without interacting with it.1,2 In the embodiment first proposed by Elitzur and Vaidman,3 a standard Michelson interferometer is aligned so that incident single photons (obtained in our experiment by using parametric downconversion; see Fig. 1) must exit by the same port in which they entered, in the absence of any object within the interferometer. The presence of an object (e.g., the mirror leading to detector DB) in one of the arms completely changes the possible outcomes because the constructive interference is interrupted. Now it is possible that the photon will exit from the other exit port, to detector DIfm. By detecting the photon in this case, one can claim with certainty that an object was within the interferometer, even though the photon could not have interacted with it. If the beam splitter has a very low reflectivity, then the fraction of IFMs approaches 1/2.