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International Journal of Theoretical Physics

Interferometric Quantum Random Number Generation via Michelson Configuration

Ram Soorat, Aakash Chilakamarri, Priyanka, Barath Sai Kumar Jakkuva, Syed Areebuddin

Published Jun 2, 2026• 1 citation
Publisher
DOI
10.1007/s10773-026-06369-3

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The Michelson interferometric phase detection resolution can be enhanced by replacing conventional beam splitters with novel directionally unbiased four-port scatterers, such as Grover coins. We present a quantitative analysis of the noise-to-signal ratio of sideband frequencies generated by gravitational wave-induced phase perturbations in a Grover-Michelson interferometer (GMI). We discuss the principles of GMI signal enhancement and demonstrate how combining this configuration with additional light-recycling arrangements further enhances the performance.
Aiming at the problem that the current Quantum Random Number Generator (QRNG) cannot simultaneously meet the high-speed and real-time requirements of random number generation in quantum key distribution communication, this paper improves the QRNG scheme based on pulse laser as light source to extract phase information. The random phase information is converted into light intensity information by single-mode Michelson interferometer, and then converted into electrical signal by high-speed Photo Detector (PD). Finally, the real-time quantum random number generation rate of 1.1 Gbit/s is obtained by using 16 bit Analog-to-Digital Converter (ADC) with 250 MHz sampling rate and 50% extraction rate. A high-speed, real-time and integrated QRNG equipment is realized. At the same time, the advantages of this scheme and continuous laser as light source in principle and system design are compared. QRNG based on pulsed laser light source has passed various tests of China Academy of Information and Communications. The random number output by the product in the process of stable operation can pass 15 test standards specified in the State Cryptography Administration randomness test document GB/T 32915-2016 and National Institute of Standards and Technology (NIST) test standards.