Reflection, Information, and Directed State Measurement A measurability framework for wave, multilayer, and scattering systems
Schüller Thomas
Abstract
Reflection, Information, and Directed State Measurement A measurability framework for wave, multilayer, and scattering systems Author Thomas Schüllerforschung@tschueller.comORCID 0009-0003-9799-6747tschueller.com Status Working paper · v0.106 May 2026CC BY 4.0Correspondence welcomed