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Unusually long carrier lifetime in a mott insulator revealed by time-resolved photoemission electron microscopy

Danylо Babich, Keiki Fukumoto, B. Corraze, Julien Tranchant, Maciej Lorenc, H. Cailleau, Koshihara S.Y, Laurent Cario, Étienne Janod

Published Jan 1, 2020• 0 citations
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Time-resolved photoemission experiments can reveal fascinating quantum dynamics of correlated electrons. However, the thermalization of the electronic system is typically so fast that very short probe pulses are necessary to resolve the time evolution of the quantum state, and this leads to poor energy resolution due to the energy-time uncertainty relation. Although the photoemission intensity can be calculated from the nonequilibrium electronic Green's functions, the converse procedure is therefore difficult. We analyze a hypothetical time-resolved photoemission experiment on a correlated electronic system, described by the Falicov-Kimball model in dynamical mean-field theory, which relaxes between metallic and insulating phases. We find that the real-time Green's function which describes the transient behavior during the buildup of the metallic state cannot be determined directly from the photoemission signal. On the other hand, the characteristic collapse-and-revival oscillations of an excited Mott insulator can be observed as oscillating weight in the center of the Mott gap in the time-dependent photoemission spectrum.