IEEE International Conference on Quantum Computing and Engineering (QCE)
Real-Time DCZ Gate Control by Bayesian Optimization with Forgetting
Yudai Sato, T. Kawahara
Abstract
Silicon spin qubits are a promising platform for large-scale quantum computing because of their compatibility with advanced semiconductor fabrication technology. However, charge noise remains a major challenge since it causes timedependent drifts in qubit frequency and exchange interactions through electric field fluctuations. These drifts in control parameters are one obstacle to achieving the high-fidelity quantum operations required for quantum error correction. In this work, we propose a Bayesian optimization (BO) framework for the adaptive calibration of quantum gate parameters in silicon qubits. In addition, to address the impact of charge noise, which exhibits a$1 / f$-like power spectral density, we incorporate a forgetting mechanism into the Gaussian process model used during optimization. Our simulations on a realistic silicon quantum dot system show that BO-based method improves gate fidelity by 0.266% and reduces calibration iterations by 36.9% compared to random search. Compared to standard BO, our modified method achieves a further fidelity gain of 0.008% and a 9.23% reduction in iterations. These results highlight the potential of BO-based calibration for robust quantum gate implementation under realistic noise conditions.