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arXiv:2210.04539 · Physical review. B./Physical review. B

Modeling semiconductor spin qubits and their charge noise environment for quantum gate fidelity estimation

M. Mohamed El Kordy Shehata, George Simion, Ruoyu Li, Fahd A. Mohiyaddin, Danny Wan, Massimo Mongillo, B. Govoreanu, Iuliana P. Radu, Kristiaan De Greve, Pol Van Dorpe

Published Jul 13, 2023• 40 citations
arXivHTMLPDF

Abstract

The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities $>97%$ in the simulated Si-MOS devices at a typical TLF density of ${10}^{11}\phantom{\rule{4pt}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$. We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to $91%$ in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.

DOI
10.1103/physrevb.108.045305

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The spin of an electron confined in semiconductor quantum dots is currently a promising candidate for quantum bit (qubit) implementations. Taking advantage of the existing CMOS integration technologies, such devices can offer a platform for large scale quantum computation. However, a quantum mechanical framework bridging a device's physical design and operational parameters to the qubit's energy space is lacking. Furthermore, the spin to charge coupling introduced by intrinsic or induced spin-orbit interaction (SOI) exposes the qubits to charge noise compromising their coherence properties and inducing quantum gate errors. We present here a comodeling framework for double quantum dot (DQD) devices and their charge noise environments. We use a combination of an electrostatic potential solver, full configuration interaction quantum mechanical methods, and two-level-fluctuator models to study the quantum gate performance in realistic device designs and operation conditions. We utilize the developed models together alongside the single electron solutions of the quantum dots to simulate one- and two-qubit gates in the presence of charge noise. We find an inverse correlation between quantum gate errors and quantum dot confinement frequencies. We calculate X-gate fidelities >97>97%>97 in the simulated Si-MOS devices at a typical TLF density of 1011cm\ensuremath−2{10}^{11}\phantom{\rule{4pt}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}1011cm\ensuremath−2. We also find that exchange driven two-qubit SWAP gates show higher sensitivity to charge noise with fidelities down to 9191%91 in the presence of the same density of TLFs. We further investigate the one- and two-qubit gate fidelities at different TLF densities. We find that given the small size of the quantum dots, sensitivity of a quantum gate to the distance between the noise sources and the quantum dot creates a strong variability in the quantum gate fidelities, which can compromise the device yields in scaled qubit technologies.
Silicon spin qubits are promising for large-scale quantum-computer integration because they can fully leverage the well-developed semiconductor infrastructure. However, the low fidelity of two-qubit entanglement gates remains a key barrier to large-scale integrations. Recent simulations of silicon spin-qubit two-qubit gates have been performed on silicon-on-insulator (SOI) platforms, while nanosheet-based charge-qubit work has been limited to single-qubit operation using a two-dimensional Schrödinger approximation. In this work, we study silicon spin-qubit double quantum dots built on nanosheet technology using the Quantum Technology Computer-Aided Design (QTCAD) simulation suite to run three-dimensional Poisson and Schroedinger solvers, followed by a many-body solver to extract exchange interactions. We evaluate the exchange energy sensitivity to process and bias variations and then use QuTiP to solve the master equation for a two-qubit gate. The results show that millivolt-level bias variations at the plunger and middle barrier gates can reduce the gate fidelity below 99%, a common threshold target for many fault-tolerant quantum-computing algorithms. Gate-referred 1/f charge-noise effects are also analyzed through the resulting coherence time.
Quantum computers offer a route to outperform classical methods in tasks such as molecular simulation, motivating hybrid algorithms like the Variational Quantum Eigensolver (VQE) for near-term devices. Silicon spin qubits are a promising platform for scalable quantum computation, but their performance is limited by hardware imperfections -- most notably charge-noise-induced potential fluctuations and static miscalibration of gate-electrode voltages -- which degrade quantum gate fidelities and, ultimately, algorithmic accuracy. Here we develop a hardware-algorithm co-simulation framework for silicon quantum-dot processors that links 3D electrostatics to effective ggg-factors and exchange couplings, and propagates voltage-level noise through realistic control pulses. Using VQE for H2\mathrm{H}_2H2​ ground-state energy estimation as a circuit-level testbed, we study both static scaling/offset errors on the gate-electrode voltages and stochastic fluctuations modeled as random-telegraph noise with tunable amplitudes and switching times. At the gate level, we show that exchange-based two-qubit gates are roughly an order of magnitude more sensitive to these types of noise than ESR-driven single-qubit rotations. Quantum process tomography and Kraus-operator analysis further distinguish coherent and incoherent contributions and quantify the fraction of error that is, in principle, correctable by a compensating unitary. Embedding these noise models into the VQE circuit, we identify regimes of miscalibration strength and noise switching time compatible with chemically accurate energy estimates, and discuss how statistical post-processing based on the full distribution of noisy energy estimates could further improve accuracy.
Abstract Quantum computers offer a route to outperform classical methods in tasks such as molecular simulation, motivating hybrid algorithms like the variational quantum eigensolver (VQE) for near-term devices. Silicon spin qubits are a promising platform for scalable quantum computation, but their performance is limited by hardware imperfections—most notably charge-noise–induced potential fluctuations and static miscalibration of gate-electrode voltages—which degrade quantum gate fidelities and, ultimately, algorithmic accuracy. Here we develop a hardware–algorithm co-simulation framework for silicon quantum-dot processors that links 3D electrostatics to effective g -factors and exchange couplings, and propagates voltage-level noise through realistic control pulses. Using VQE for H 2 ground-state energy estimation as a circuit-level testbed, we study both static scaling/offset errors on the gate-electrode voltages and stochastic fluctuations modeled as random-telegraph noise with tunable amplitudes and switching times. At the gate level, we show that exchange-based two-qubit gates are roughly an order of magnitude more sensitive to these types of noise than ESR-driven single-qubit rotations. Quantum process tomography and Kraus-operator analysis further distinguish coherent and incoherent contributions and quantify the fraction of error that is, in principle, correctable by a compensating unitary. Embedding these noise models into the VQE circuit, we identify regimes of miscalibration strength and noise switching time compatible with chemically accurate energy estimates, and discuss how statistical post-processing based on the full distribution of noisy energy estimates could further improve accuracy.
Electron spins in semiconductor devices are highly promising building blocks for quantum processors (QPs). Commercial semiconductor foundries can create QPs using the same processes used for conventional chips, once the QP design is suitably specified. There is a vast accessible design space; to identify the most promising options for fabrication, one requires predictive modeling of interacting electrons in real geometries and complex nonideal environments. In this work we explore a modeling method based on real-space grids, an approach without assumptions relating to device topology and therefore with wide applicability. Given an electrode geometry, we determine the exchange coupling between quantum dot qubits, and model the full evolution of a SWAP gate to predict qubit loss and infidelity rates for various voltage profiles. We determine full, three-dimensional solutions and introduce a method that can obtain near-identical predictions using far more efficient two-dimensional computations. Moreover we explore the impact of unwanted charge defects (static and dynamic) in the environment, and test robust pulse sequences. As an example we exhibit a sequence correcting both systematic errors and (unknown) charge defects, observing an order of magnitude boost in fidelity. The technique can thus identify the most promising device designs for fabrication, as well as bespoke control sequences for each such device.
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High-Fidelity Single-Qubit Gates Via Strongly Driving of a Double Quantum Dot Hybrid Qubit with 1/f1/f1/f Charge Noise
Semiconductor double quantum dot hybrid qubits are promising candidates for high-fidelity quantum computing. However, their performance is limited by charge noise, which is ubiquitous in solid-state devices, and phonon-induced dephasing. Here we explore methods for improving the quantum operations of a hybrid qubit, using strong microwave driving to enable gate operations that are much faster than decoherence processes. Using numerical simulations and a theoretical method based on a cumulant expansion, we analyze qubit dynamics in the presence of 1/f1/f1/f charge noise, which forms the dominant decoherence mechanism in many solid-state devices. We show that, while strong-driving effects and charge noise both reduce the quantum gate fidelity, simple pulse-shaping techniques effectively suppress the strong-driving effects. Moreover, a broad AC sweet spot emerges when the detuning parameter and the tunneling coupling are driven simultaneously. Taking into account phonon-mediated noise, we find that it should be possible to achieve XπX_{\pi}Xπ​ gates with fidelities higher than 99.9%99.9\%99.9%.