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IEEE Transactions on Microwave Theory and Techniques

Cryogenic On-Chip In Situ S -Parameter Calibration Using Superconducting Coplanar Waveguides

Jeremy N. Thomas, Johannes Paul Hoffmann, Nathan E. Flowers-Jacobs, Anna E. Fox, Nicholas R. Jungwirth, Raegan L. Johnson‐Wilke, Paul D. Dresselhaus, Samuel P. Benz

Published Jul 16, 2025• 0 citations
Publisher

Abstract

This article presents a new multiimpedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. The different impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 245 mA of current into the line. Using these states, we solve for the unknowns in an eight-term error model through a least-squares analysis. We first validate the MISL calibration technique by comparing it with short-open-load-reciprocal (SOLR) calibrated measurements in a cryogenic probe station, finding transmission agreement within 0.2 dB and uncertainty overlap for nearly all frequencies up to 26.5 GHz. We then apply the method to calibrate Nb CPWs with and without embedded Josephson junctions (JJs), using a fixed wire bonded connection, and without the use of cryogenic switches or movable probes. Strong agreement with the CPW models is demonstrated, with uncertainty overlap and differences below 0.1 dB up to 4.6 GHz without JJs and up to 2.4 GHz with JJs; resonances cause interruptions beyond these frequencies.

DOI
10.1109/tmtt.2025.3585803

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Microwave kinetic inductance detectors (MKIDs) are playing an increasingly role in THz astronomy. Superconducting coplanar waveguide (CPW) lines are commonly adopted in MKIDs for the resonators as well as the readout through line. It is therefore of particular interest to characterize the transmission properities of superconducting CPW lines at low temperatures. A cryogenic through-line method based on two cryogenic RF switches is proposed to characterize Nb and TiN superconducting CPW lines. On-chip calibration has been successfully carried out. Detailed results and analysis will be presented.
Accurate knowledge of the microwave power delivered to a cryogenic device under test (DUT) is essential for the characterization and operation of superconducting quantum circuits. However, this information is difficult to obtain inside dilution refrigerators because of distributed attenuation, impedance mismatch, switch-path repeatability, and temperature-dependent microwave components. This paper presents an in situ measurement method for RF power at the cryogenic device plane. The method uses a custom variable temperature stage (VTS) as a cryogenic thermal-transfer element. The TVS is alternately heated by a four-wire DC heater and by microwave power dissipated in a 20 dB pass-through attenuator. By fitting the thermal transients and comparing the corresponding steady-state temperatures, the absorbed microwave power is inferred from a directly measured DC electrical power through an AC/DC substitution procedure. The finite reflection and transmission of the attenuator are then accounted for by cryogenic two-port scattering-parameter measurements based on a switch-assisted Short--Open--Load--Reciprocal calibration, so that the result is referred to the DUT reference plane. The system is demonstrated in a dilution refrigerator with powers between -43 and -58 dBm at the DUT input plane. The demonstrated relative standard uncertainty ranges from about 2% at -43.9 dBm to about 40% at -57.6 dBm. The proposed approach combines thermal RF power transfer, cryogenic S-parameter correction, and uncertainty evaluation in a measurement architecture compatible with quantum-device experiments, providing a practical route toward traceable microwave-power calibration at millikelvin stages.
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Accurate in situ calibration of microwave attenuation and amplification-chain noise is essential for superconducting quantum circuits. We demonstrate a compact, self-calibrating cryogenic noise source based on an on-chip chromium attenuator that can be resistively heated with nanowatt-level power and directly integrated into a coaxial microwave line at the mixing-chamber stage. By comparing Johnson-Nyquist noise generated by Joule and microwave heating, measured through the amplification chain, the attenuation of the input line, and hence the gain of the chain, is determined without requiring knowledge of the attenuator temperature. The device exhibits millisecond-scale response times and negligible heating of the cryostat base plate. Using this approach, we determine the gain and added noise of a cryogenic amplification chain over the 4-8 GHz band. Our results provide a simple and accurate method to characterize near-quantum-limited parametric amplifiers used in superconducting-qubit readout.
Superconducting systems operating in cryogenic environments represent a rapidly evolving domain with diverse applications spanning from quantum computing to medical diagnostics. To optimize and enhance the performance of such systems, a comprehensive understanding of material properties and their responses under cryogenic conditions is imperative. This work investigates the RF and DC electrical performance of passive structures, specifically transmission lines, at both room and cryogenic temperatures. S-parameter measurements were conducted on Coplanar Waveguides (CPWs) transmission lines, which are crucial for interaction with qubit chips and the resonators to read out the qubit states. Additionally, DC electrical testing is performed on the CPWs to analyse the resistance across the signal and ground metal lines. A series of test structures using different substrates and metal lines are fabricated for s-parameter testing at both room and cryogenic temperatures. This paper presents the impact of the superconducting environment on material RF loss and resistance.
A method is proposed and experimentally explored for in-situ calibration of complex transmission data for superconducting microwave resonators. This cryogenic calibration method accounts for the instrumental transmission response between the vector network analyzer reference plane and the device calibration plane. Once calibrated, the observed resonator response is analyzed in detail by two approaches. The first, a phenomenological model based on physically realizable rational functions, enables the extraction of multiple resonance frequencies and widths for coupled resonators without explicit specification of the circuit network. In the second, an ABCD-matrix representation for the distributed transmission line circuit is used to model the observed response from the characteristic impedance and propagation constant. When used in conjunction with electromagnetic simulations, the kinetic inductance fraction can be determined with this method with an accuracy of 2%. Datasets for superconducting microstrip and coplanar-waveguide resonator devices were investigated and a recovery within 1% of the observed complex transmission amplitude was achieved with both analysis approaches. The experimental configuration used in microwave characterization of the devices and self-consistent constraints for the electromagnetic constitutive relations for parameter extraction are also presented.