Quantum computing offers revolutionary potential for data processing and the efficiency of information systems. This work investigates the impact of the Single Event Effect (SEE) duration on quantum circuit outputs using the Quantum Fault Injector (QuFI) and the Quantum Vulnerability Factor (QVF). We evaluate four distinct well-known quantum circuits, including the Bell circuit, to determine the probability of faults impacting the results and to understand the impact of these faults on the number of shots performed. After 270,336 injected faults in qubits, the results demonstrate significant variations in the robustness of the analyzed circuits, and it becomes evident that injections in θ (Theta) tend to have a more significant impact on the final output, highlighting the importance of metrics like QVF for the development of reliable quantum systems.
Quantum computing offers revolutionary potential for data processing and the efficiency of information systems. This work investigates the impact of the Single Event Effect (SEE) duration on quantum circuit outputs using the Quantum Fault Injector (QuFI) and the Quantum Vulnerability Factor (QVF). We evaluate four distinct well-known quantum circuits, including the Bell circuit, to determine the probability of faults impacting the results and to understand the impact of these faults on the number of shots performed. After 270,336 injected faults in qubits, the results demonstrate significant variations in the robustness of the analyzed circuits, and it becomes evident that injections in θ (Theta) tend to have a more significant impact on the final output, highlighting the importance of metrics like QVF for the development of reliable quantum systems.
Quantum computing is one of the most promising technology advances of the latest years. Qubits are highly sensitive to noise, which can make the output useless. Lately, it has been shown that superconducting qubits are extremely susceptible to external sources of faults, such as ionizing radiation. When adopted in large scale, radiation-induced errors are expected to become a serious challenge for qubits reliability. We propose an evaluation of the impact of transient faults in the execution of quantum circuits on superconducting chips. Inspired by the Architectural and Program Vulnerability Factors, widely used for classical computation, we propose the Quantum Vulnerability Factor (QVF) to measure the impact of qubit corruption on the circuit output. We model faults, and design a fault injector, based on the latest studies on real machines and radiation experiments. We report the finding of more than 388,000,000 fault injections, considering single and double faults, on three algorithms, identifying the faults and qubits that are more likely to impact the output. We give guidelines on how to map the qubits in real devices to reduce the output error and to reduce the probability of having a radiation-induced corruption modifying the output. Finally, we compare simulations with experiments on physical quantum computers.
Quantum computing is an emerging technology that is poised to revolutionize computational capabilities. However, errors from environmental noise and imperfect hardware can significantly affect the fidelity of the computational results of quantum circuits. In this paper, we put forth a hypothesis that similar to classical computers, not all errors have the same effect on the outputs. To study the error impact at different qubits and at different gates, we leverage the fault injection methodology from a recently proposed framework, QuFI [1], which was designed to produce a quantum vulnerability factor (QVF) heatmap based on all possible fault injections. In our work, we use a similar fault injection approach but focus on the impact of errors at different regions of a circuit. Then, we propose to apply error mitigation techniques selectively to protect the most vulnerable regions of a circuit so as to reduce the overhead of error mitigation schemes.
Quantum computing is an up-and-coming technology that is expected to revolutionize the computation paradigm in the next few years. Qubits, the primary computing elements of quantum circuits, exploit the quantum physics proprieties to increase the parallelism and speed of computation drastically. Unfortunately, besides being intrinsically noisy, qubits have also been shown to be highly susceptible to external sources of faults, such as ionizing radiation. The latest discoveries highlight a much higher radiation sensitivity of qubits than traditional transistors and identify a much more complex fault model than bit-flip.We propose a framework to identify the quantum circuits sensitivity to radiation-induced faults and the probability for a fault in a qubit to propagate to the output. Based on the latest studies and radiation experiments performed on real quantum machines, we model the transient faults in a qubit as a phase shift with a parametrized magnitude. Additionally, our framework can inject multiple qubit faults, tuning the phase shift magnitude based on the proximity of the qubit to the particle strike location. As we show in the paper, the proposed fault injector is highly flexible, and it can be used on both quantum circuit simulators and real quantum machines. We report the finding of more than 285, 249, 536 injections on the Qiskit simulator and 53, 248 injections on real IBM machines. We consider three quantum algorithms and identify the faults and qubits that are more likely to impact the output. We also consider the fault propagation dependence on the circuit scale, showing that the reliability profile for some quantum algorithms is scale-dependent, with increased impact from radiation-induced faults as we increase the number of qubits. Finally, we also consider multi qubits faults, showing that they are much more critical than single faults. The fault injector and the data presented in this paper are available in a public repository to allow further analysis.
Quantum Computing is a highly promising new computation paradigm. Unfortunately, quantum bits (qubits) are extremely fragile and their state can be gradually or suddenly modified by intrinsic noise or external perturbation. In this paper, we target the sensitivity of quantum circuits to radiation-induced transient faults. We consider quantum circuit cuts that split the circuit into smaller independent portions, and understand how faults propagate in each portion. As we show, the cuts have different vulnerabilities, and our methodology successfully identifies the circuit portion that is more likely to contribute to the overall circuit error rate. Our evaluation shows that a circuit cut can have a 4.6 x higher probability than the other cuts, when corrupted, to modify the circuit output. Our study, identifying the most critical cuts, moves towards the possibility of implementing a selective hardening for quantum circuits.
Quantum computing has been identified as a rapidly developing area that has the potential to outperform classical computing systems for many computational problems. However, the reliability of quantum circuits is still a major challenge due to imperfections in their hardware systems and control errors. This paper examines the effect caused by Single Missing Rotation Faults (SMRF) in the quantum circuits. The method used in this paper works by the elimination of selected rotation gates to generate faulty circuits using statevector simulation to analyze the effect by various metrics such as state fidelity, process fidelity, phase and probability deviation. The experimental results are demonstrated that observable phase and amplitude deviations can be realized by even a single missing rotation fault in the quantum circuit, which are not observed by probability distribution alone. The SMRF analysis carried out provides knowledge about error prone areas in the quantum circuit, thus establishing a foundation for a comprehensive reliability evaluation in NISQ-era hardware.
The growing scale and accessibility of quantum hardware exposed new reliability and security challenges in the quantum computing workflow, such as the run-time fault injection attacks in cloud-based quantum computing platforms. However, existing works fail to identify vulnerabilities with gate-level precision or adapt to run-time environments. In this work, we formulate gate-level fault analysis as a learning-guided prioritization problem under restricted fidelity budgets. The framework uses a circuit-DAG-based GNN backbone to predict the vulnerability score of each gate to each type of injected fault, defined as the impact of the gate-fault pair on circuit fidelity. The gate-fault pairs are then ranked by their vulnerability score. Experiments on QASMbench and HamLib MaxCut show that QUFIG recovers high-impact vulnerable gate-fault pairs with fewer inspections than random and depth-based heuristics. Our results show that QUFIG can reduce the number of gates requiring inspection by 2.9--19.8% while maintaining effective fault identification, allowing quantum circuit designers to identify vulnerabilities and apply targeted defenses more efficiently.