A Measurement Method of Critical Current of Un-Shunted Josephson Junction
Jian Zhou, Juan Wang, Yewen Yao +3 more
The measurement of critical currentIc, as an important parameter of un-shunted Josephson junctions (JJ), is critical for designing superconductor analog devices or digital circuits. However, precise measurement ofIcfrom current–voltage (I–V) characteristic curves often faces difficulties, such as the disturbance of environmental magnetic and electromagnetic waves (EM) noise, which significantly decreases theIcvalue from ideal critical currentIc0and increases the uncertainty ofIcmeasured value (>10 %). In this article, a test procedure is proposed for measuring theI–Vcurve of un-shunted JJ under a magnetic shielding environment, effectively avoiding deficiencies of conventional methods such as poor uncertainty and lowerIcmeasurement value. The uncertainty ofIcis investigated based on different superconducting JJs, and the results show that the combined uncertainty ofIcis less than 2% (the current stepμA). Also, a formula expressing the relationship ofIcwith the radius of JJ is proposed, which may provide a good way of predictingIcfor practical experimental measurements. The effectiveness of the procedure and the formula are both verified by experiments based on the Nb/Al-AlOx/Nb samples. The method is helpful for round-robin standard measurement onIcof un-shunted JJ and shortens the investigation process feedback time of the RSFQ integrated circuit.
IEEE Transactions on Applied Superconductivity•Sep 13, 2023•3 citations