Optical and Quantum Sensing and Precision Metrology II
Nanomechanical squeezing through strong optical measurements for quantum metrology
Pascal Neveu, Jack Clarke, Michael Ross Vanner, Ewold Verhagen
Abstract
Nano- and micromechanical oscillators act as great sensors of a wide variety of signals, but their sensitivity and bandwidth can be limited by quantum backaction imposed by optomechanical displacement measurement. We experimentally demonstrate a new paradigm for optomechanical measurement and control based on strong interactions with short light pulses. Using unique nanophotonic optomechanical cavities, we show that single pulsed measurements can achieve sub-quantum-limit resolution. Moreover, we demonstrate a new protocol to deterministically produce squeezed mechanical states, which can reduce single-quadrature fluctuations to arbitrarily small magnitudes. We discuss the application of the resulting squeezing and entanglement for mechanical quantum sensing.