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Truncated nonlinear interferometer-based atomic force microscopes

Raphael C. Pooser

Published Jan 23, 2023• 0 citations
OpenAlex

Abstract

A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.

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A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.
A truncated non-linear interferometer-based sensor system includes an input that receives an optical beam and a non-linear amplifier that generates a probe beam and a conjugate beam from the optical beam. The system's local oscillators are related to the probe beam and the conjugate beam. The system includes a sensor that transduces an input with the probe beam and the conjugate beam. The transduction detects changes in the phase of each of the probe beam and the conjugate beam. The system's phase sensitive detectors detect phase modulations between the respective local oscillators, the probe beam, and the conjugate beam and outputs phase signals based on detected phase modulations. The system measures phase signals indicative of the sensor's input resulting from a sum or difference of the phase signals. The measurement exhibits a quantum noise reduction in an intensity difference, a phase sum, or an amplitude difference quadrature.
Nonlinear interferometers that replace beam splitters in Mach-Zehnder interferometers with nonlinear amplifiers for quantum-enhanced phase measurements have drawn increasing interest in recent years, but practical quantum sensors based on nonlinear interferometry remain an outstanding challenge. Here, we demonstrate the first practical application of nonlinear interferometry by measuring the displacement of an atomic force microscope microcantilever with quantum noise reduction of up to 3 dB below the standard quantum limit, corresponding to a quantum-enhanced measurement of beam displacement of 1.7 fm/sqrt[Hz]. Further, we minimize photon backaction noise while taking advantage of quantum noise reduction by transducing the cantilever displacement signal with a weak squeezed state while using dual homodyne detection with a higher power local oscillator. This approach may enable quantum-enhanced broadband, high-speed scanning probe microscopy.
We consider the quantum and classical noise limits to position measurement and force detection by an atomic force microscope (AFM) with an optical readout of cantilever position. We model this by treating the cantilever as a perfectly reflecting mirror for a highly damped optical cavity. There are three sources of noise: the shot noise in the output laser measurement, the thermal noise in the cantilever, and the measurement back-action noise. This last source of noise becomes large for good measurements, measurements for which there is a high correlation between the output phase of the light and the changing position of the cantilever. The back action simultaneously drives a diffusion process in momentum and diagonalizes the cantilever state in the position basis. This latter result is ``state reduction.'' Explicit expressions for the rate of the measurement back action in terms of the device parameters are given. We also calculate the signal-to-noise ratio in the limit of a bad cavity. A comparison to recent experiments suggests that current AFMs are not quantum limited.
Nonlinear interferometers include a nonlinear optical medium that is situated to produce a conjugate optical beam in response to a pump beam and a probe beam. The pump, probe, and conjugate beams propagate displaced from each other along a common optical path. One of the beams is selectively phase shifted, and the beams are then returned to the nonlinear medium, with the selectively phase shift beam phase shifted again. The nonlinear medium provides phase sensitive gain to at least one of the probe or conjugate beams, and the amplified beam is detected to provide an estimate of the phase shift.