We present a widefield quantum polarised light microscope, illuminating with a NOON state (N=2) and imaging using a SPAD array camera. Compared to classical imaging we show that sensitivity improves by a factor of 1.31.
A quantum polarized light microscope using entangled NOON states with N=2 and N=3 is shown to provide phase supersensitivity beyond the standard quantum limit. We constructed such a microscope and imaged birefringent objects at a very low light level of 50 photons per pixel, where shot noise seriously hampers classical imaging. The NOON light source is formed by combining a coherent state with parametric down-converted light. We were able to show improved phase images with sensitivity close to the Heisenberg limit.
Abstract As an emerging microscopic detection tool, quantum microscopes based on the principle of quantum precision measurement have attracted widespread attention in recent years. Compared with the imaging of classical light, quantum-enhanced imaging can achieve ultra-high resolution, ultra-sensitive detection, and anti-interference imaging. Here, we introduce a quantum-enhanced scanning microscope under illumination of an entangled NOON state in polarization. For the phase imager with NOON states, we propose a simple four-basis projection method to replace the four-step phase-shifting method. We have achieved the phase imaging of micrometer-sized birefringent samples and biological cell specimens, with sensitivity close to the Heisenberg limit. The visibility of transmittance-based imaging shows a great enhancement for NOON states. Besides, we also demonstrate that the scanning imaging with NOON states enables the spatial resolution enhancement of N compared with classical measurement. Our imaging method may provide some reference for the practical application of quantum imaging and is expected to promote the development of microscopic detection.
Polarized light microscopy using path-entangled N-photon states (i.e., the N00N states) has been demonstrated to surpass the shot-noise limit at very low light illumination. However, the microscopy images suffer from divergence of phase sensitivity, which inevitably reduces the image quality. Here we show that due to experimental imperfections, such a singularity also takes place in the microscopy that uses twin-Fock states of light for illumination. We propose two schemes to completely eliminate this singularity: (i) locking the phase shift sensed by the beams at the optimal working point using a spatially dependent offset phase; (ii) a combination of two binary-outcome photon counting measurements, one with a fixed offset phase and the other without any offset phase. Our observations remain valid for any kind of binary-outcome measurement and may open the way for quantum-enhanced microscopy with high N photon states.