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Plenary Talk 7 - Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

Jay H. Hendricks, Zeeshan Ahmed, D. Barker, K. Douglass, Stephen Eckel, Jim Fedchak, Nikolai N. Klimov, Jacob E. Ricker, Julia K. Scherschligt

Published Jan 1, 2021• 0 citations
Publisher

Abstract

The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the creation of deployed and often miniaturized standards. These standards, when based on fundamental properties of nature, are directly tracible to the international system of units known as the SI. NIST is also developing quantum-based standards for SI traceability known as QSI, or Quantum based International System of units. Specifically, this paper will cover NIST efforts in the area of thermodynamic metrology to develop NOAC standards for pressure, vacuum and temperature measurements.

DOI
10.5162/smsi2021/pt7

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The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the creation of deployed and often miniaturized standards. These standards, when based on fundamental properties of nature, are directly tracible to the international system of units known as the SI. NIST is also developing quantum-based standards for SI traceability known as QSI, or Quantum based International System of units. Specifically, this paper will cover NIST efforts in the area of thermodynamic metrology to develop NOAC standards for pressure, vacuum and temperature measurements.
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Advances in quantum mechanics have long underpinned metrology by enabling practical realizations of units through quantum effects. With the 2019 SI revision, traceability is anchored in defined fundamental constants, reinforcing the quantum-mechanical basis of modern standards. In parallel, quantum technologies are transitioning from laboratory science to engineering and early industrial deployment, bringing familiar pressures for integration, reliability, cost reduction, supply-chain formation, and standardization. The direction of benefit is thus reversing: metrology and precision measurement are becoming enabling infrastructure for the industrialization of quantum technologies. Against this backdrop, this paper surveys the metrology and precision-measurement capabilities required across representative quantum-computing modalities and identifies where electrical and related metrology can contribute to the development, characterization, and reliable operation of quantum hardware. We then discuss cross-cutting measurement needs and standardization opportunities that recur across platforms, and note how similar frameworks can extend to emerging quantum-sensing applications.