Transient resonant light scattering in an exciton-phonon system (A)

Xiao-Lin Li, Z. D. Liu, D. L. Lin +1 more

Masaki Aihara

貴志子 丸山, Fumiaki Shibata, Masaki Aihara

W. Langbein, J. M. Hvam

The polarization decay in the exciton-biexciton system of a homogeneously broadened single quantum well is studied by transient four-wave mixing. All three decay rates in the exciton-biexciton three-level system are deduced. The relation between the rates unravels correlations between scattering processes of excitons and biexcitons. Density and temperature dependences show that the involved processes are mainly radiative decay and phonon scattering. The radiative decay rate of the biexcitons is found to be comparable to the one of the excitons, and the involved spontaneous photon emissions from excitons and biexcitons are mutually uncorrelated. In contrast, the biexciton phonon scattering is twice as fast and correlated to exciton-phonon scattering, indicating the interaction with similar phonon modes.

H. Stolz

J. M. Hvam, W. Langbein, Paola Borri

Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics of low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non- linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature- dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.