Radio frequency (RF) reflectometry is a well understood measurement technique in common use by RF engineers today. This technique has been applied at low temperature to probe the impedance of nanoscale devices for over two decades. These measurements typically employ basic resonant impedance transformers to bring the device impedance close to the characteristic impedance of the measurement apparatus. In 2013 it was discovered by Colless et al. that reflectometry could be used to measure extremely small impedance changes in a gate coupled to a quantum dot to directly probe the charge state of the dot. This has simplified measurements of certain nanoscale devices including single electron boxes (SEBs) and semiconductor qubits. Despite the maturity of RF reflectometry measurements in general, researchers working at low temperature continue to make basic mistakes in their measurements. The root cause of most of these mistakes is the failure to properly calibrate the measurement apparatus. In some cases this leads researchers to unrealistic conclusions when trying to match measurements to theory. This dissertation demonstrates that a low temperature RF calibration can be very easy and straightforward using inexpensive, off the shelf SMA terminators as calibration standards. A proper calibration allows for direct quantitative comparisons between data measured on different reflectometers or between data and simulations. The consistency between measurements and simulations then allows for straightforward design and implementation of improved impedance transformers, increasing the SNR of extremely sensitive measurements, with simple data-based simulations. A new type of single electron device, the capacitively coupled RF single electron transistor (CSET) is proposed and demonstrated which can rival the traditional RF SET in sensitivity but integrates more effectively into arrays and may offer a level of resistance to electrostatic discharge damage.
Radio frequency (RF) reflectometry is a well understood measurement technique in common use by RF engineers today. This technique has been applied at low temperature to probe the impedance of nanoscale devices for over two decades. These measurements typically employ basic resonant impedance transformers to bring the device impedance close to the characteristic impedance of the measurement apparatus. In 2013 it was discovered by Colless et al. that reflectometry could be used to measure extremely small impedance changes in a gate coupled to a quantum dot to directly probe the charge state of the dot. This has simplified measurements of certain nanoscale devices including single electron boxes (SEBs) and semiconductor qubits. Despite the maturity of RF reflectometry measurements in general, researchers working at low temperature continue to make basic mistakes in their measurements. The root cause of most of these mistakes is the failure to properly calibrate the measurement apparatus. In some cases this leads researchers to unrealistic conclusions when trying to match measurements to theory. This dissertation demonstrates that a low temperature RF calibration can be very easy and straightforward using inexpensive, off the shelf SMA terminators as calibration standards. A proper calibration allows for direct quantitative comparisons between data measured on different reflectometers or between data and simulations. The consistency between measurements and simulations then allows for straightforward design and implementation of improved impedance transformers, increasing the SNR of extremely sensitive measurements, with simple data-based simulations. A new type of single electron device, the capacitively coupled RF single electron transistor (CSET) is proposed and demonstrated which can rival the traditional RF SET in sensitivity but integrates more effectively into arrays and may offer a level of resistance to electrostatic discharge damage.
Sensitive dispersive readouts of single-electron devices ("gate reflectometry") rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an impedance transformer to match the impedance of the load to the characteristic impedance of the transmission line and thus obtain the best sensitivity and signal-to-noise ratio. This is particularly important for measuring large impedances, typical for dispersive readouts of single-electron devices because even a small mismatch will cause a strong signal degradation. When performing RF measurements, a calibration and error correction of the measurement apparatus must be performed in order to remove errors caused by unavoidable non-idealities of the measurement system. Lack of calibration makes optimizing a matching network difficult and ambiguous, and it also prevents a direct quantitative comparison between measurements taken of different devices or on different systems. We propose and demonstrate a simple straightforward method to design and optimize a pi matching network for readouts of devices with large impedance, [Formula: see text]. It is based on a single low temperature calibrated measurement of an unadjusted network composed of a single L-section followed by a simple calculation to determine a value of the "balancing" capacitor needed to achieve matching conditions for a pi network. We demonstrate that the proposed calibration/error correction technique can be directly applied at low temperature using inexpensive calibration standards. Using proper modeling of the matching networks adjusted for low temperature operation the measurement system can be easily optimized to achieve the best conditions for energy transfer and targeted bandwidth, and can be used for quantitative measurements of the device impedance. In this work we use gate reflectometry to readout the signal generated by arrays of parallel-connected Al-AlOx single-electron boxes. Such arrays can be used as a fast nanoscale voltage sensor for scanning probe applications. We perform measurements of sensitivity and bandwidth for various settings of the matching network connected to arrays and obtain strong agreement with the simulations.
This thesis focuses on implementing radio frequency (rf) reflectometry techniques for dispersive detection of charge and spin dynamics in nanoscale devices. I have investigated three aspects of rf reflectometry using state-of-the-art silicon (Si) complementary metal-oxide-semiconductor (CMOS) nanowire field effect transistors (NWFETs). First, a high-sensitivity capacitive gate-based charge sensor is developed by optimising the external matching circuit to detect capacitive changes in the high frequency resonator. A new circuit topology is used where superconducting niobium nitride (NbN) inductor is connected in parallel with a single-gate Si NWFET resulting in resonators with loaded Q-factors in the 400-800 range. For a resonator operating at 330 MHz, I have achieved a charge sensitivity of 7.7 μe/Hz and, when operating at 616 MHz, I get 1.3 μe/Hz. This gate-based sensor can be used for fast, accurate and scalable techniques for quantum state readout in Si CMOS based quantum computing. Second, this new circuit topology for the resonator is used with a dual-gate Si NWFET. This dual-gate device geometry provides access to a double quantum dot (DQD) system in few electron regime. The spin-state of the two-electron DQD system is detected dispersively using Pauli spin blockade between joint singlet S(2,0) and triplet T−(1,1) states in a finite magnetic field B. The singlet-triplet relaxation time T1 at B=4.5~T is measured to be $\sim$1 ms using standard homodyne detection technique. Third, I expand the range of applications of gate-based sensing to accurate temperature measurements. I have experimentally demonstrated a primary thermometer by embedding a single-gate Si NWFET with the rf capacitive gate-based sensor. The thermometer, termed as gate-based electron thermometer (GET), relies on cyclic electron tunneling between discrete energy levels of a quantum dot and a single electron reservoir in the NWFET. I have found that the full-width-half-maximum (FWHM) of the resonator phase response depends linearly with temperature via well known physical law by using the ratio kB/e between the Boltzmann constant and the electron charge. The GET is also found to be magnetic field independent like other primary thermometers such as Coulomb blockade and shot noise thermometers.
This paper reports on the extraction of the equivalent circuit model parameters of a physically defined silicon quantum dot at a cryogenic temperature and design of the impedance matching circuits to improve the performance of a charge sensor for radio-frequency (RF) reflectometry. The I-V characteristics and the S-parameters of the quantum dot device are measured around a Coulomb peak at 4.2 K. The measured results are modeled by an RC parallel circuit, and the model parameters for the quantum dot device were obtained. We consider three impedance matching circuits for RF reflectometry of a quantum dot: shunt capacitor-series inductor type, shunt inductor-series capacitor type, and shunt inductor-series inductor-type. We formulate and compare the sensitivity and bandwidth of RF reflectometry for the three types of circuits. The analysis should be useful for selecting the optimal matching circuit and the circuit parameters for given equivalent circuit parameters and working frequency. This procedure is demonstrated for a quantum dot with the characterized model circuit along with simulated performance. This design technique of matching circuit for RF reflectometry can be applied to any device that can be represented by an RC parallel circuit. These results will facilitate to realize fast semiconductor qubit readout in various quantum dot platforms.
Fast measurement of small currents and even smaller fluctuations in devices with large impedance is not trivial. Standard low frequency lock-in measurements suffer from stray capacitance of the order of nF reducing the bandwidth to merely kHz and a time resolution of ms. One approach of increasing the bandwidth is to connect the high-impedance device next to a low input impedance amplifier, though, the signal is decreased by the ratio of the impedances of the device and the amplifier, easily a factor of a thousand. Therefore, long averaging times are required to detect the small signal. Moreover, 1/f noise still affects the measurements. The issues of small bandwidth, impedance mismatch and 1/f noise can be simultaneously addressed using resonant LC circuits. The success of this impedance transformer lies in replacing the slow operation of applying voltages and measuring currents by applying fast radio frequency signals and measuring the reflectance. LC circuits remain appealing because of a rather simple assembly. Nonetheless, the challenge to reproducibly achieve the resonance frequencies in gigahertz (GHz) range while matching to high impedance still remains due to the large parallel stray capacitance of the measurement setup. Resonance frequency in GHz range is desirable for two reasons. Firstly, measurements are faster and 1/f noise smaller. Yet more importantly, one can profit from the wide range of measurement techniques developed in the context of circuit quantum electrodynamics, such as FPGA based hardware and quantum limited Josephson parametric amplifiers. \n \nIn this thesis, a matching circuit namely stub tuner based on coplanar transmission lines is designed, fabricated and integrated with mesoscopic devices. Owing to the simple design, we could predict the frequency response of a stub tuner in terms of the standard circuit model (Chapter 3). We initiated certain necessary fabrication adaptations to achieve integration of niobium circuits with devices. In particular, a reliable stamping of carbon nanotubes from the growth substrate to the target substrate was accomplished, improving both the device quality and yield (Chapter 4). RF reflectometry is employed to perform admittance measurements on CNT quantum dots. We could reliably deduce all circuit and device properties using the resonance response. The measurement bandwidth is shown to be in MHz range which is three orders of magnitude larger than that for DC measurements. In particular, using the phase response of the circuit, double-dot qubit energy and dephasing rate are studied (Chapter 5). We could even get rid of conventional contacts that could degrade the device properties, and still extract quantum capacitance and dissipation in graphene p-n junctions. The residual doping is shown to affect not only the mean free path but also the Fermi velocity. We further see that at small doping, electron-electron interactions could modify the Fermi velocity and that the dispersion relation could deviate from linearity (Chapter 6). \n \nIn the second half of the scientific results, real strength of stub tuner is tested in transmission measurements. The large bandwidth and signal to noise ratio is utilized to measure extremely clean noise power densities at high speed and draw comparisons with the corresponding average current. Clear changes in the shot noise spectrum are seen when a transport channel is added or removed from the bias window of the quantum dot. We especially observe noise enhancement outside the Coulomb diamonds due to blocking states (Chapter 7). Finally, we investigate noise properties of quantum dots when leads are superconducting. Distinct charge transfers due to multiple Andreev reflections are visible in the shot noise. The main finding, however, was the thermal noise at zero bias. We observed its periodic suppression and emergence across the quantum dot resonance. In another device, shot noise due to the Kondo effect is found to be enhanced in the superconducting state when the Kondo temperature exceeds the value of the superconducting gap (Chapter 8). Simple design and reliable calibration of the GHz matching circuit in both reflectance and transmission pave a way for fast and non-invasive measurements of mesoscopic conductors. \n \n \n \n \n
Many important phenomena in quantum devices are dynamic, meaning that they cannot be studied using time-averaged measurements alone. Experiments that measure such transient effects are collectively known as fast readout. One of the most useful techniques in fast electrical readout is radio-frequency reflectometry, which can measure changes in impedance (both resistive and reactive) even when their duration is extremely short, down to a microsecond or less. Examples of reflectometry experiments, some of which have been realized and others so far only proposed, include projective measurements of qubits and Majorana devices for quantum computing, real-time measurements of mechanical motion, and detection of non-equilibrium temperature fluctuations. However, all of these experiments must overcome the central challenge of fast readout: the large mismatch between the typical impedance of quantum devices (set by the resistance quantum) and of transmission lines (set by the impedance of free space). Here, we review the physical principles of radio-frequency reflectometry and its close cousins, measurements of radio-frequency transmission and emission. We explain how to optimize the speed and sensitivity of a radio-frequency measurement and how to incorporate new tools, such as superconducting circuit elements and quantum-limited amplifiers into advanced radio-frequency experiments. Our aim is threefold: to introduce the readers to the technique, to review the advances to date, and to motivate new experiments in fast quantum device dynamics. Our intended audience includes experimentalists in the field of quantum electronics who want to implement radio-frequency experiments or improve them, together with physicists in related fields who want to understand how the most important radio-frequency measurements work.
Radio-frequency (RF) reflectometry is widely used for high-bandwidth readout of semiconductor quantum devices at cryogenic temperatures, but its application has mainly been limited to nanoscale structures with relatively small capacitances. Here, we investigate RF readout in a different regime by applying gate-based reflectometry to a large-area silicon carbide transistor with parasitic capacitances orders of magnitude larger than those of typical quantum devices, conditions normally expected to hinder RF readout. We observe a gate-dependent RF response which degrades and eventually vanishes as temperature is lowered, although MOSFET operation in DC transport is maintained down to deep cryogenic temperatures. We attribute this behaviour to impedance changes introduced by carrier freeze-out in the transistor drift region, and propose a modified circuit configuration designed to restore sensitivity under these conditions. These results establish how parasitic pathways and device geometry can limit RF readout, providing insight into the design of scalable cryogenic-CMOS quantum systems.