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EPJ Quantum Technology

A study to develop a robust method for measuring the detection efficiency of free-running InGaAs/InP single-photon detectors

Marco López, Alice Meda, Geiland Porrovecchio, Robert A. Starkwood, Marco Genovese, G. Brida, Marek Šmíd, Christopher J. Chunnilall, Ivo Pietro Degiovanni, S. Kück

Published Nov 25, 2020• 13 citations
Publisher

Abstract

Abstract The challenges faced in a comparison of measuring the detection efficiency of free-running InGaAs/InP single-photon avalanche detectors (InGaAs/InP SPAD) were studied by four European National Metrology Institutes (NMIs) meeting at a single laboratory. The main purpose of this study is to develop a trustable measurement technique and to provide a snapshot of the methods used by the four NMIs for measuring such photon-counting detectors at telecom wavelengths in order to establish proper procedures for characterising such devices. The detection efficiency measurements were performed using different experimental setups and reference standards with independent traceability chains at the wavelength of 1550 nm. A dedicated model to correct the dead time and dark count effects on the SPAD’s free-running counting process was developed, allowing the correct value of the photon rate impinging on the detector to be recovered from simple ratemeter measurements. The detection efficiency was measured for mean photon number per pulse between 0.01 and 2.4, corresponding to photon rates between approximately 1100 photon/s and 193,000 photon/s, respectively. We found that the measured values reported by the participants are all consistent within the stated uncertainties, proving the consistency of the measurement approach developed.

DOI
10.1140/epjqt/s40507-020-00089-1

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Pilot comparison on the measurement of detection efficiency of InGaAs/InP single-photon detectors (Conference Presentation)

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InGaAs/InP single-photon detectors are today the most frequently used detectors for fibre-based Quantum Key Distribution (QKD) [1,2]. The performance of the QKD-systems greatly depends on the optical properties of its detector, such as quantum efficiency, dead time, dark counts, gating rate, etc., which need to be metrologically characterized to fully grantee the QKD network security. Therefore, several European National Metrological Institutes (NMIs) are putting today great efforts in developing novel measurement methods and calibration facilities, which allow to perform the traceable characterisation of single-photon detectors by using reference standards [3, 4]. From the metrological, and specifically radiometric, point of view, the detection efficiency of the single-photon detector is the main parameter that needs to be traceable to the primary standard for optical power (i.e. the cryogenic radiometer), which is maintained by most of the NMIs. Recently, four European NMIs have carried out a pilot comparison on the detection efficiency of a free-running InGaAs/InP single-photon detector, which main purpose has been to provide a snapshot of the measurement capabilities of the four European NMIs in the field of photon counting detection. The comparison was carried out in the framework of the EMPIR project 14IND05 “Optical metrology for quantum-enhanced secure telecommunication (MIQC2)” at the telecom wavelength of 1550 nm by using different reference standards with independently traceability chains. The results of this comparison, including the different experimental setups, the measurement methods, the traceability chain and the uncertainty evaluation of each participant, will be presented in this conference. References: [1] Akihisa Tomita, et al., “High speed quantum key distribution system”, Optical Fiber Technology, 16, Issue 1, 55-62 (2010). [2] Damien Stucki, et al., “Photon counting for quantum key distribution with peltier cooled InGaAs/InP APDs”, Journal of Modern Optics, 48, Issue 13, 1967-1981 (2001). [3] M. López, et al, “Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique, Journal of Modern Optics 62, S21 – S27, 2015. [4] G. Porrovecchio, et al., “Comparison at the sub-100 fW optical power level of calibrating a single-photon detector using a high-sensitive, low-noise silicon photodiode and the double attenuator technique”, Metrologia 53, 1115-1122 (2016).

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Detection efficiency in gated-mode single-photon avalanche detectors recovers gradually after each gate edge, limiting attainable count rates, yet quantitative recovery models exist only for free-running operation. We extract the gated recovery time constant of a free-running InGaAs/InP detector at 1550 nm by sweeping the gate frequency from 100 kHz to 1 MHz and globally fitting count rates across four dead times, requiring neither a pulsed laser nor a time-to-digital converter. The recovery time decreases linearly with detection efficiency, from 301 to 161 ns between 10 % and 25 %, at 9.3 ns per percentage point. We further resolve a periodic count-rate modulation consistent with bias-dependent capacitive gate feedthrough.

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The implementation and commercialization of quantum cryptography technologies have to face some challenges related to the development of single-photon detectors operating at 1550 nm. The main requirements are: i) high detection efficiency; ii) low noise; iii) high count rate; iv) low timing jitter. Different technologies are currently available for single-photon detection at 1550 nm, but semiconductor devices (like Single-Photon Avalanche Diode, SPAD) offer a photon detection efficiency that is inherently higher than any photocathode employed in vacuum tube detectors. Additionally InGaAs/InP SPADs can detect single photons at 1550 nm with low noise when moderately cooled by means of thermo-electric coolers. Consequently, InGaAs/InP SPAD can be the enabling technology of practical quantum key distribution (QKD) systems, provided that the maximum count rate is increased above 1 Mcps. The main limit is the afterpulsing effect that usually sets too long (< 10 μs) a hold-off time after each avalanche ignition. We present the developments achieved in InGaAs/InP SPAD device design, fabrication technology and front-end electronics, aimed at decreasing the afterpulsing effect, while not impairing photon detection efficiency and timing jitter. The new InGaAs/InP SPADs provide count rates higher than 1 Mcps and temporal response with 60 ps Full-Width at Half Maximum and very short (30 ps time constant) tail. The front-end electronics includes a wide-band pulse generator able to gate the SPAD up to 133 MHz repetition rate. Eventually, a fast avalanche-quenching scheme minimizes quenching time to less than 1 ns, thus effectively reducing afterpulsing by decreasing the total charge flowing through the junction.

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InGaAs/InP single-photon avalanche diodes (SPADs) are widely used in practical applications requiring near-infrared photon counting such as quantum key distribution (QKD). Photon detection efficiency and dark count rate are the intrinsic parameters of InGaAs/InP SPADs, due to the fact that their performances cannot be improved using different quenching electronics given the same operation conditions. After modeling these parameters and developing a simulation platform for InGaAs/InP SPADs, we investigate the semiconductor structure design and optimization. The parameters of photon detection efficiency and dark count rate highly depend on the variables of absorption layer thickness, multiplication layer thickness, excess bias voltage, and temperature. By evaluating the decoy-state QKD performance, the variables for SPAD design and operation can be globally optimized. Such optimization from the perspective of specific applications can provide an effective approach to design high-performance InGaAs/InP SPADs.

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Calibration of free-space and fiber-coupled single-photon detectors *

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Abstract We measure the detection efficiency of single-photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space-coupled single-photon avalanche diode and present a comparison between fusion-spliced and connectorized fiber-coupled single-photon detectors. We find that our expanded relative uncertainty for a single measurement of the detection efficiency is as low as 0.70% for fiber-coupled measurements at 1533.6 nm and as high as 1.78% for our free-space characterization at 851.7 nm. The detection-efficiency determination includes corrections for afterpulsing, dark count, and count-rate effects of the single-photon detector with the detection efficiency interpolated to operation at a specified detected count rate.

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An Ultra Low Noise Telecom Wavelength Free Running Single Photon Detector Using Negative Feedback Avalanche Diode

Mark A. Itzler, Thomas D. Jennewein

It is challenging to implement genuine free running single photon detectors for the 1550 nm wavelength range with simultaneously high detection efficiency (DE), low dark noise, and good time resolution. We report a novel read out system for the signals from a negative feedback avalanche diode (NFAD)1–3 which allows useful op-eration of these devices at a temperature of 193 K and results in very low dark counts ( ∼ 100 CPS), good time jitter ( ∼ 30 ps), and good DE (∼10 %). We char-acterized two NFADs with a time correlation method using photons generated from weak coherent pulses (WCP) and photon pairs produced by spontaneous parametric down conversion (SPDC). The inferred detector efficiencies for both types of pho-ton sources agree with each other. The best noise equivalent power of the device is estimated to be 8.1 × 10−18 W · Hz−1/2, more than 10 times better than typical InP/InGaAs SPADs show in free running mode. The afterpulsing probability was found to be less than 0.1 % per ns at the optimized operating point. In addition, we studied the performance of an entanglement-based quantum key distribution (QKD) using these detectors and develop a model for the quantum bit error rate (QBER) that incorporates the afterpulsing coefficients. We verified experimentally that using these NFADs it is feasible to implement QKD over 400 km of telecom fibre. Our NFAD photon detector system is very simple, and is well suited for single-photon applications where ultra-low noise and free-running operation is required, and some afterpulsing can be tolerated.

•Aug 17, 2016•45 citations
Abstract The challenges faced in a comparison of measuring the detection efficiency of free-running InGaAs/InP single-photon avalanche detectors (InGaAs/InP SPAD) were studied by four European National Metrology Institutes (NMIs) meeting at a single laboratory. The main purpose of this study is to develop a trustable measurement technique and to provide a snapshot of the methods used by the four NMIs for measuring such photon-counting detectors at telecom wavelengths in order to establish proper procedures for characterising such devices. The detection efficiency measurements were performed using different experimental setups and reference standards with independent traceability chains at the wavelength of 1550 nm. A dedicated model to correct the dead time and dark count effects on the SPAD’s free-running counting process was developed, allowing the correct value of the photon rate impinging on the detector to be recovered from simple ratemeter measurements. The detection efficiency was measured for mean photon number per pulse between 0.01 and 2.4, corresponding to photon rates between approximately 1100 photon/s and 193,000 photon/s, respectively. We found that the measured values reported by the participants are all consistent within the stated uncertainties, proving the consistency of the measurement approach developed.
InGaAs/InP single-photon detectors are today the most frequently used detectors for fibre-based Quantum Key Distribution (QKD) [1,2]. The performance of the QKD-systems greatly depends on the optical properties of its detector, such as quantum efficiency, dead time, dark counts, gating rate, etc., which need to be metrologically characterized to fully grantee the QKD network security. Therefore, several European National Metrological Institutes (NMIs) are putting today great efforts in developing novel measurement methods and calibration facilities, which allow to perform the traceable characterisation of single-photon detectors by using reference standards [3, 4]. From the metrological, and specifically radiometric, point of view, the detection efficiency of the single-photon detector is the main parameter that needs to be traceable to the primary standard for optical power (i.e. the cryogenic radiometer), which is maintained by most of the NMIs. Recently, four European NMIs have carried out a pilot comparison on the detection efficiency of a free-running InGaAs/InP single-photon detector, which main purpose has been to provide a snapshot of the measurement capabilities of the four European NMIs in the field of photon counting detection. The comparison was carried out in the framework of the EMPIR project 14IND05 “Optical metrology for quantum-enhanced secure telecommunication (MIQC2)” at the telecom wavelength of 1550 nm by using different reference standards with independently traceability chains. The results of this comparison, including the different experimental setups, the measurement methods, the traceability chain and the uncertainty evaluation of each participant, will be presented in this conference. References: [1] Akihisa Tomita, et al., “High speed quantum key distribution system”, Optical Fiber Technology, 16, Issue 1, 55-62 (2010). [2] Damien Stucki, et al., “Photon counting for quantum key distribution with peltier cooled InGaAs/InP APDs”, Journal of Modern Optics, 48, Issue 13, 1967-1981 (2001). [3] M. López, et al, “Detection efficiency calibration of single-photon silicon avalanche photodiodes traceable using double attenuator technique, Journal of Modern Optics 62, S21 – S27, 2015. [4] G. Porrovecchio, et al., “Comparison at the sub-100 fW optical power level of calibrating a single-photon detector using a high-sensitive, low-noise silicon photodiode and the double attenuator technique”, Metrologia 53, 1115-1122 (2016).
Detection efficiency in gated-mode single-photon avalanche detectors recovers gradually after each gate edge, limiting attainable count rates, yet quantitative recovery models exist only for free-running operation. We extract the gated recovery time constant of a free-running InGaAs/InP detector at 1550 nm by sweeping the gate frequency from 100 kHz to 1 MHz and globally fitting count rates across four dead times, requiring neither a pulsed laser nor a time-to-digital converter. The recovery time decreases linearly with detection efficiency, from 301 to 161 ns between 10 % and 25 %, at 9.3 ns per percentage point. We further resolve a periodic count-rate modulation consistent with bias-dependent capacitive gate feedthrough.
The implementation and commercialization of quantum cryptography technologies have to face some challenges related to the development of single-photon detectors operating at 1550 nm. The main requirements are: i) high detection efficiency; ii) low noise; iii) high count rate; iv) low timing jitter. Different technologies are currently available for single-photon detection at 1550 nm, but semiconductor devices (like Single-Photon Avalanche Diode, SPAD) offer a photon detection efficiency that is inherently higher than any photocathode employed in vacuum tube detectors. Additionally InGaAs/InP SPADs can detect single photons at 1550 nm with low noise when moderately cooled by means of thermo-electric coolers. Consequently, InGaAs/InP SPAD can be the enabling technology of practical quantum key distribution (QKD) systems, provided that the maximum count rate is increased above 1 Mcps. The main limit is the afterpulsing effect that usually sets too long (< 10 μs) a hold-off time after each avalanche ignition. We present the developments achieved in InGaAs/InP SPAD device design, fabrication technology and front-end electronics, aimed at decreasing the afterpulsing effect, while not impairing photon detection efficiency and timing jitter. The new InGaAs/InP SPADs provide count rates higher than 1 Mcps and temporal response with 60 ps Full-Width at Half Maximum and very short (30 ps time constant) tail. The front-end electronics includes a wide-band pulse generator able to gate the SPAD up to 133 MHz repetition rate. Eventually, a fast avalanche-quenching scheme minimizes quenching time to less than 1 ns, thus effectively reducing afterpulsing by decreasing the total charge flowing through the junction.
InGaAs/InP single-photon avalanche diodes (SPADs) are widely used in practical applications requiring near-infrared photon counting such as quantum key distribution (QKD). Photon detection efficiency and dark count rate are the intrinsic parameters of InGaAs/InP SPADs, due to the fact that their performances cannot be improved using different quenching electronics given the same operation conditions. After modeling these parameters and developing a simulation platform for InGaAs/InP SPADs, we investigate the semiconductor structure design and optimization. The parameters of photon detection efficiency and dark count rate highly depend on the variables of absorption layer thickness, multiplication layer thickness, excess bias voltage, and temperature. By evaluating the decoy-state QKD performance, the variables for SPAD design and operation can be globally optimized. Such optimization from the perspective of specific applications can provide an effective approach to design high-performance InGaAs/InP SPADs.
Abstract We measure the detection efficiency of single-photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space-coupled single-photon avalanche diode and present a comparison between fusion-spliced and connectorized fiber-coupled single-photon detectors. We find that our expanded relative uncertainty for a single measurement of the detection efficiency is as low as 0.70% for fiber-coupled measurements at 1533.6 nm and as high as 1.78% for our free-space characterization at 851.7 nm. The detection-efficiency determination includes corrections for afterpulsing, dark count, and count-rate effects of the single-photon detector with the detection efficiency interpolated to operation at a specified detected count rate.
It is challenging to implement genuine free running single photon detectors for the 1550 nm wavelength range with simultaneously high detection efficiency (DE), low dark noise, and good time resolution. We report a novel read out system for the signals from a negative feedback avalanche diode (NFAD)1–3 which allows useful op-eration of these devices at a temperature of 193 K and results in very low dark counts ( ∼ 100 CPS), good time jitter ( ∼ 30 ps), and good DE (∼10 %). We char-acterized two NFADs with a time correlation method using photons generated from weak coherent pulses (WCP) and photon pairs produced by spontaneous parametric down conversion (SPDC). The inferred detector efficiencies for both types of pho-ton sources agree with each other. The best noise equivalent power of the device is estimated to be 8.1 × 10−18 W · Hz−1/2, more than 10 times better than typical InP/InGaAs SPADs show in free running mode. The afterpulsing probability was found to be less than 0.1 % per ns at the optimized operating point. In addition, we studied the performance of an entanglement-based quantum key distribution (QKD) using these detectors and develop a model for the quantum bit error rate (QBER) that incorporates the afterpulsing coefficients. We verified experimentally that using these NFADs it is feasible to implement QKD over 400 km of telecom fibre. Our NFAD photon detector system is very simple, and is well suited for single-photon applications where ultra-low noise and free-running operation is required, and some afterpulsing can be tolerated.