Intra-Doppler resonances of the cesium D2line in a selective specular reflection profile
Vladimir A. Sautenkov, Vladimir L Velichansky, Alexander S. Zibrov +3 more
An investigation was made of selective specular reflection from 133Cs vapor in the range of atomic concentrations between 4×1013 and 2×1015 cm−3 where collisional broadening of the D2 line is less than the Doppler broadening. The radiation source was an injection laser. Intra-Doppler resonances corresponding to the hyperfine structure of the excited state were recorded in the selective reflection profile. Shifts of the reflection resonances relative to the luminescence resonances of the atomic beam did not exceed 50 MHz. The possiblity of using selective reflection for linear spectroscopy of atomic lines without Doppler broadening is discussed.
Soviet Journal of Quantum Electronics•Sep 30, 1981•11 citations